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NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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Fiber Geometry System
2400
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
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Preform Analyzer
P104
The P104 Preform Analyzer provides fast and repeatable measurement of the critical characteristics of optical fiber preform index profiles. Like the 2600 Preform Analyzer, measurements are automatic, reliable, and require a minimum of operator skill. However, the P104 also possesses unique capabilities that are highly beneficial for some specific preform types and processes. The P104's dynamic aperture option greatly improves the characterization of many finely structured preforms, and its patented silica measurement cell minimizes the thermal effects that plague some preform characterizations.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Characterization of Solar Cells
Paios
Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
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Magcam MiniCube3D
The fully digital and compact measurement system connects to a computer via a single USB cable, making the measurement data directly digitally available. The Magcam maps are analyzed in real time by the MagScope measurement & analysis software and its optional add-on software modules, which provide powerful measurement and analysis capabilities for a complete quality control and characterization of permanent magnets and magnet assemblies.
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Process & Material Characterization System
TriboLab CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Pulsed and CW lasers, 375 – 1700 nm, 1 kHz measurement rate
871 Series
The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
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Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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LED Tester add-on to MicRed Products' T3STer
TERALED®
TERALED provides combined thermal and radiometric/photometric characterization of high-power LEDs. The system can be used as a stand-alone optical measurement system for LEDs, or as an add-on to Mentor Graphics - MicReD Products' T3Ster equipment.
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Mechanical Tester
TriboLab CMP
Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process.
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TIM Characterization Tools
Thermal Engineering Associates, Inc.
Combining Thermal Test Vehicles (TTVs) with Thermal Test Boards (TTBs) results in a set of tools that perform the basis for TIM thermal characterization under application-oriented measurement conditions. Availability of these tools creates a de facto standard that enable both TIM manufacturers and TIM users to compare measurement results under the same conditions.
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Display Measurement Systems
DTS Series
Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
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TF Analyzer
The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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Semiconductor Thermal Transient Tester
T3Ster®
T3Ster (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Time Domain Reflectometers
HL1100 Series
HYPERLABS HL1100 Series TDR instruments provide high-performance test and measurement capabilities for use in the field or in the lab. These instruments are used for applications such as fault detection in cables and interconnects, impedance characterization, time of flight analysis, water level measurement, and more.
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ENA Vector Network Analyzer
E5080B
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Variable Angle Spectroscopic Ellipsometer
VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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Test & Measurement Services
We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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Electrical Engineering Services
Reston Software provides state-of-the-art, U.S.-based electronic design services. We provide these services part of our systems-related offer, as well as on a stand-alone basis.We specialize in maintaining and upgrading 70's and 80's electronic equipment. We provide on-call support services for test, measurement, and laboratory equipment.
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Dual Channel Driver Card
42460
Two channels of 32 MHz clock drivers with up to 20 volt amplitude. The output voltage range is ±20 V, with independent high and low voltage settings. The inputs to the Card can be optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel one nanosecond increments.
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Dual Channel Driver Card
40461
Two channels of 8 to 10 MHz drivers (25 V amplitude). The output voltage range is ±25V, with independent high and low voltage settings. The inputs to the Card are optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel as low as one nanosecond increments.
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Vacuum Measurement
Agilent's full range of active and passive vacuum gauges and gauge controllers from atmosphere to UHV/XHV allow you to precisely and reliably control and measure vacuum. We offer Thermocouple (TC), Bayard Alpert (BA), Pirani, Inverted Magnetron (IMG), and Hot Filament (HFIG) gauges. Our gauge controllers are compatible with both Agilent and competitors' gauges and can handle up to 12 channels. Agilent controllers come with several communication interfaces including Profibus, ethernet, and RS-232/485 (other interfaces may be available upon request). There is also the option of a portable gauge controller (HGC-536).
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Durometers
Standard Test Method for Rubber Property, Durometer Hardness. This test method covers twelve types of rubber hardness measurement devices known as durometers.
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Geometrical Measurement Software
PRÜFTECHNIK Condition Monitoring GmbH
Activate your machinery more quickly, and help it run longer. PRÜFTECHNIK geometric laser alignment tools and software enable you to easily check and adjust your machine geometries for: straightness, flatness, level, inclination, plumbness, parallelism, and right angle check. Our tools are powerful, precise, and easy to use on a vast range of machinery—they can measure for the most demanding alignment jobs, including a bore of almost any diameter, and/or any surface type or inclination. Find the right geometric measurement tool for your machines.
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Stainless Steel Shims and Sensor Brackets
PRÜFTECHNIK Condition Monitoring GmbH
Sensor mounting brackets and stainless steel shims for vertical alignment and soft foot correction are an integral part of a precision alignment solution. They contribute to the quality of the measurement and the resulting asset reliability. PRUFTECHNIK offers universal or chain-type brackets as well as stainless steel shims for trouble-free machine corrections. Brackets and stainless shim sets are alignment accessories that improve the results and experience for unusual or challenging situations, including soft foot. Quality stainless steel shim sets improve alignment adjustment results and make challenging alignment situations, including soft foot faster and easier.
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Global Standard Model For 4 Point Probe Sheet Resistance Automatic Measurement System
RT-3000/RG-1000F
*Fully automatic system for large sizes of flat panel with glass loading robot*Tester self-test function, Measurement position correction function, wide measurement range*Min. 0.1 mm meas. resolution and user programmable test pattern*Host (CIM) communication and 2-D/3-D Mapping software
