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Ultra Fast Line Sensors
µsprint
With an unparalleled scanning rate, the µsprint sensors are the ideal tool for quality and process control with high throughput rates and precise measurements. As a standalone solution for laboratories, with machine safety enclosure for industrial production environments, or as an OEM solution – the μsprint technology can be inegrated flexibly everywhere.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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SHSLab Wavefront Sensors
The SHSLab wavefront sensor system is a powerful and comprehensive measurement solution for a multitude of optical applications, such as:*alignment of optical systems *measurement of imaging quality*surface shape measurement*laser beam characterization
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Vista Spectrophotometer
Hunter Associates Laboratory, Inc.
Determining the purity of raw materials ensures both safety and quality. Hunterlab’s Vista is the right instrumentation for quantifying the color range and meeting standards and regulations. Vista captures both visible-range transmission color, as well as haze with a single measurement, and exports data with ease in minutes.
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LDV System
PS-TM-1D-532
The PowerSight-based LDV System uses the latest solid-state laser technology to give you the powerful and compact laser module for LDV measurements. In addition to its power, the selected laser provides the excellent beam quality pertinent to the accuracy of LDV measurements.
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Rebound Hammer
DigiSchmidt - LD
The Schmidt Hammer Digi-Schmidt Type LD was developed for the non destructive measurement of the concrete compressive strength and controlling the uniform concrete quality. Besides showing the basic settings on the included display unit, the Schmidt Hammer offers the transmission of the measured data to a standard printer or to a PC. This supersedes the time consuming business of note taking allowing the user to focus on the essential. The window based software ProVista allows downloading, presenting and editing of the measured values in a fast and easy way.
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HV Spark Gaps
B-1015
*Spark gaps are enclosed in dust tight transparent enclosures with replaceable non-melting carbon spheres, up to 88kV PK.*Above 88kV, open style with hollow aluminum spheres is standard.*Applications for these units include over-voltage limiting, voltage measurement, capacitor discharge, and pulse forming.*Horizontal unit housings are removable.*Vertical unit housings are not removable.*Micrometer Vernier adjustment is standard for maximum accuracy on most models. Economy units without micrometer Vernier adjustment are available as an option.*Insulation to ground is available at standard and optional levels.*Spark gaps to 370kV, with motor operation available.
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Stalker Sport
Pro 3s
For over 20 years, Stalker Sport Radar guns have been used by baseball professionals around the world because consistent ball speed measurement is the only acceptable result. No other brand delivers the range, accuracy, or consistency of Stalker Sport Radar guns. From the Stalker Sport Series to the Stalker Pro II Series, users at every level of the game rely on Stalker. You can too.
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OEM Speed Sensors
Stalker Radar has distilled its speed measurement and detection expertise into its Intelligent Technologies suite of Speed Measurement, Transportation and Traffic, Sports, and Surface Velocity sensors. Stalker Radar precision is now available to engineers worldwide to address virtually any speed measurement application..
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Sun Meters
Easy to operate, digital readout meters are used for Vitamin D3 conversion measurements from sunlight and for UVA + UVB ranges. Meters can ship today.
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Calibration And Measurement
Ectron has a long tradition dating back to 1964 in being the industry leader in supplying super high precision, highly reliable and accurate Metrology, Simulators/Calibrators products.
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Photometric Detectors
The flame photometric detector (FPD) allows sensitive and selective measurements of volatile sulphur and phosphorus compounds. The detection principle is the formation of excited sulphur (S2*) and excited hydrogen phosphorous oxide species (HPO*) in a reducing flame.
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Radiometric Detectors
Radiometric detectors are built by using selected, stability tested high-grade Si-photovoltaic cells. They are all equipped with individually produced and matched color glass filters. They are available in different sizes for irradiance and radiant flux measurement, both in temperature stabilized laboratory and general purpose form.
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IO-Link Sensors for Motion Control
Encoder for precise position determination and linear measurement, Defined pulse sequence for the reliable detection of rotational speeds, Inclination sensors for precise measurement of angles of inclination on X and Y axes, High measurement accuracy across the total angular range in two axes, High protection rating for the requirements of harsh industrial environments
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Test And Measurement
Standardized instruments used to evaluate individuals, populations, or processes.
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Systems For Dynamic Parameters Measurement
● Sampling rate: up to 216 kHz/channel ● Dynamic range: up to 120 dB ● Built-in charge amplifier ● Self-diagnostics ● Modular architecture ● Simple scalability ● Specialized software for registration, real-time analysis and post-processing
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Optical Tweezers
PicoTweezers
Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Detectors
Solar blind detector for operation in the 1 to 180 nanometer region. It is encased in a vacuum tight housing for vacuum operation. The Model 425 is ideal for measurements in the Extreme and Vacuum UV (EUV and VUV) where the solar blind feature eliminates potential interference from long wavelength ultraviolet and visible light. It may be operated in pulse-counting mode or DC. The CEM is also available with coatings like Cesium Iodide or Magnesium Fluoride to enhance response in different energy regions.
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Voice Quality Test System
MultiDSLA
MultiDSLA solution is a state of the art measurement system for Voice Quality Testing and Performance Assessment used by many organisations as the reference measurement in applications ranging from core technology development to network operations.
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Stabilized Light Source
SLS
Provides continuous wave and stable source of energy for loss measurements of fiber optic cable.
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Cable TV
Tempo Communications provides technicians with an array of test and measurement solutions to optimiz... e the installation and performance of broadband cable networks. The tried-and-true TDR from Tempo delivers all of the enhanced features required to pinpoint faults and verify performance. Like all of its test and measurement devices, the focus is on reliability, ease-of-use, and quality—empowering technicians to do their jobs and exceed customer expectations.Show less
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Experiment Maker
Experiment Maker turns SIGNAL into a programmable, automated, real-time experiment control system by adding capabilities for simultaneous acquisition and playback, microsecond timing and triggering, digital I/O and keyboard control. With SIGNAL and Experiment Maker, the researcher can construct presentation, measurement and control systems that would otherwise require months of programming.
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Substation Real-time Monitoring & Event Recording
BiTRONICS 70 Series
The BiTRONICS 70 Series Measurement System is an efficient, cost-effective substation automation solution for real-time monitoring and event recording. The BiTRONICS 70 Series Measurement System is a substation automation solution designed to satisfy AC network operators’ needs for real-time monitoring and event tracking. It is also an ideal system to help them protect their investments.
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Power Quality Analyser
iSTAT M355
The iSTAT M355 is a Power Quality Analyser that provides measurements to IEC 61000-4-30. 2008 Class A and reports Power Quality compliance to EN50160: 2011. Sampling at a rate of 31 kHz (620 samples per cycle at 50Hz) and true RMS measurement gives accurate readings under all harmonic conditions, with Measurement accuracy better than 0.1% and Class 0.2S Energy.
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Phasor Measurement Unit
Agile P847
The P847 Phasor Measurement Unit forms part of Alstom Grid's system monitoring and control. The devices is used to measure power system data in real time and report to the PDC (Phasor Data Concentrator) for visualisation, data storage and most importantly for running a variety of ‘on line’ and ‘off line’ applications in systems analysis and control. The ultimate goal is to run the system economically and preserve system stability following major disturbances.
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DC Measurements
Standard Windows sound cards do not respond to DC or frequencies lower than a few Hz. (See Why Sound Cards Block DC Signals below for explanation.)There are two general approaches to get true DC response from a standard sound card: Modify the card, or add an external circuit to convert the DC into an AC signal which can be easily measured by an unmodified card.
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I-V Tracers
EKO I-V tracers (MP-160 / MP-11 / MP-180) can be used in three different Power ranges. The research type MP-160 is an all round instrument to be used with single cells and modules or multiple unitswhen connected to the multi channels selectors. The portable MP-11 with remote sensor unit can be used on site to accurately check the performance of Modules and Strings. The high end MP-180 is capable to make high precision I-V measurements of small and large size solar cells and is most suitable for Research and Development applications or production inspection purposes indoors.
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Hardware Products
We supply you with products from various manufacturers in the areas of measurement technology, industrial computers and industrial communication .
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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Advanced Metrology System
AMS Series
Precision systems for accurate measurement and quality control in semiconductor manufacturing.
