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Laser Distance Meter for 40m With 10 Memories and Min. Measurement
MS-LDM340
*Measuring distance: 0.05 to 40m*Accuracy: ±1.5mm (±0.06in)*Unit conversion: mm/in/ft*Laser classification: Class 2*Laser type: 635nm <1mW*Dynamic measurement*Area, volume measurement*Pythagorean proposition measurement
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Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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Compact & Reliable Radar Sensor for Distance Measurement & Object Detection
OndoSense reach (E)
Our radar sensor for distance measurement and object detection offers reliable, precise measurements with a long range. OndoSense reach is not only the most compact radar-based distance sensor: its narrow opening angle of just ±3° ensures focused, interference-free measurements and enables a small measuring spot.
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Phase Noise Measurement Solution, 50 kHz to 110 GHz
E5505A
The Keysight Technologies E5500 Series of phase noise measurement solutions offers the most flexible set of measurements on one-port VCOs, DROs, crystal oscillators and synthesizers. Two-port devices, including amplifiers and converters, plus CW, pulsed and spurious signals can also be measured. The E5500 measurements include absolute and residual phase noises, AM noise, and low-level spurious signals. The stand-alone instrument architecture easily configures for various measurement techniques, including the PLL/reference source technique, residual and FM discriminator methods.
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Gas Tester for Measurement of Petrol, CNG, and LPG Powered Vehicles
M4GT / MAHA 4 GASTESTER | VP 135120
Maschinenbau Haldenwang GmbH & Co. KG.
The MAHA 4-Gas Tester serves for the measurement of petrol, CNG and LPG powered vehicles as well as the precise analysis of the gas components HC, CO, CO2, O2 with lambda value calculation. The M4GT impresses with its low weight, compact design and short warm-up time for easy handling, precise measurement results and rapid measurement readiness.
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Current Measurements Of PWM Or Inverter, AC/DC 5～100A, Φ16mm
CTF-100DC-U48V
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 5～100A*For current measurements for PWM or inverter
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Current Measurements Of PWM Or Inverter, AC/DC 10～200A, Φ24mm
CTF-200DC-U24V
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 10～200A*Current measurements for PWM or inverter
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Current Measurements Of PWM Or Inverter, AC/DC 10～200A, Φ24mm
CTF-200DC-U48V
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 10～200A*Current measurements for PWM or inverter
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Current Measurements of PWM or Inverter, AC/DC 10～200A, φ24mm
CTF-200DC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 10～200A*Current measurements for PWM or inverter
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Current Measurements of PWM or Inverter, AC/DC 0.5～5A, φ16mm
CTF-5DC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 0.5～5A*Current measurements for PWM or inverter
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Current Measurements Of PWM Or Inverter, AC/DC 1～50A, Φ16mm
CTF-50DC-U24V
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 1～50A*Current measurements for PWM or inverter
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Current Measurements Of PWM Or Inverter, AC/DC 1～50A, Φ16mm
CTF-50DC-U48V
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 1～50A*Current measurements for PWM or inverter
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Current Measurements of PWM or Inverter, AC/DC 1～50A, φ16mm
CTF-50DC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 1～50A*Current measurements for PWM or inverter
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Current Measurements of PWM or Inverter, AC/DC 5～100A, φ16mm
CTF-100DC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 5～100A*For current measurements for PWM or inverter
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Current Measurements of PWM or Inverter, AC/DC 25～500A, φ35mm
CTF-500DC
MULTI MEASURING INSTRUMENTS Co., Ltd.
*AC/DC 25～500A*Current measurements for PWM or inverter
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Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Magnetic Property Characteristics Measurement System (from 100kHz to 14GHz)
KEYCOM’s magnetic property characteristics measurement system delivers ideal measurement solutions for complex permeability μr''- jμr'''', ferromagnetic resonance relaxation coefficient α, resonant line width ΔH in wideband from 100kHz up to 14GHz.
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Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform
i7000 Series
Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform by ADSYS
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Easy Connection Of IEPE Sensors To Voltage Input Measurement Devices
K- IEPE
Our K-IEPE module is designed to connect IEPE sensors to a voltage measurement device that normally cannot support IEPE sensors. The powered K-IEPE module simply enables IEPE sensors to be connected via the BNC terminals and will output the signal voltages to an analog measurement device.
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Basic Pulsed-RF Measurements Lite For E5081A — Up To 20 GHz
S960240B
Add pulsed-RF measurement capabilities to your E5081A ENA-X vector network analyzer.
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Basic Pulsed-RF Measurements Lite For E5081A — Up To 44 GHz
S960241B
Add pulsed-RF measurement capabilities to your E5081A ENA-X vector network analyzer.
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Basic Pulsed-RF Measurements Lite For P50xxB Up To 53 GHz
S970241B
Add pulsed-RF measurement capabilities to your P50xxB Streamline series vector network analyzer
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Basic Pulsed-RF Measurements Lite For P50xxB Up To 20 GHz
S970240B
Add pulsed-RF measurement capabilities to your P50xxB Streamline series vector network analyzer
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100 Watt Dynamic Measurement DC Source, 20V, 5A
66332A
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections. The Keysight 66332A Dynamic Measurement dc Source provides dynamic measurement and analysis of voltage and current waveforms. It is ideal for testing digital wireless communications products/components because it not only provides the power for testing, but also performs the peak current measurements required to characterize the pulsed current demands of these products.
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SolarIV Series Solar Cell Current Voltage Measurement System
SlarIV
SolarIV IntroductionOne of the key measurements needed for photovoltaic devices in the measurement of their I-V characteristics. Through measuring the I-V curves the user can determine physical performances of devices such as photo-electric conversion efficiency, fill factors and so on. Such data is important for reliable work in research and quality inspection. ZOLIX supply the SolarIV system and the most perfect, professional technical support.
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complete 1/2 inch Type 1 Measurement Microphone System
PS9200KIT
A complete 1/2 inch Type 1 measurement microphone system. Available in 1 Inch and 1/4 Inch versions. The heart of the KIT is the 1/2 inch Type 1 measurement microphone. A selection of 4 different 1/2 inch capsules is offered. These include models with frequency responses to 40 kHz, noise floors of 12 dBA in both free field and pressure versions. Microphone sensitivities range from 12 to 50 mV/Pa.
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Advanced Measurement Package For M8000 Series Of BERT Test Solutions
M8070ADVB
The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
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Field thermal needle system for thermal resistivity / conductivity measurement
FTN01
Hukseflux Thermal Sensors B.V.
The FTN01 Field Thermal Needle System allows performing fast, on-site measurements of the thermal resistivity or conductivity of soils, in particular around the typical depth of burial of high voltage cables. FTN01 is designed with a focus on robustness and saving time, while still offering sufficient accuracy for typical field measurements. The sensor is a Non-Steady-State Probe (NSSP), TP09, which is mounted at the tip of the Lance LN01. The system is operated using a hand-held Control and Readout Unit CRU01.
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Non-contact Sheet Resistance Multi-points Measurement System With Wide Range
NC-80MAP
*Possible to measure wide range of sheet resistance by installing Max. 4 probes*Min. 7 mm position from edge can be measured*User programable measurement pattern & programmable measuring pattern
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
