Showing results: 31 - 45 of 85 items found.
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ZEUTEC Opto-Elektronik GmbH
Is a chemometric software package that is designed for calibration development in the field of NIR spectroscopy. AWX is used to predict chemical characteristics of the Near Infra Red spectrum of a sample.
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MoScan-F -
CDP Systems Corp.
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Schwarzbeck Mess Elektronik
A passive loop antenna which is matched to a resonance frequency of 13.56 MHz with 370 kHz bandwidth (-3dB)The purpose of the antenna is to produce defined magnetic fields at 13.56 MHz efficiently, i.e. to test near field communication devices (NFC) or RFID equipment.
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EFS-105 -
enprobe GmbH
The EFS-105 is the first in a family of fiber-optic active antennas & E-field probes. The field distortion caused by the probe head is nearly zero due to the exceptionally small probe head and the all-optical signal transmission and power supply. This gives an invaluable advantage for near field measurements and measurements close to metallic parts.
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VTC 2400 -
Instrument Systems Optische Messtechnik GmbH
The VTC 2400 is a high-resolution infrared-camera that was developed specially for 2D-far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. The measurement system consists of a light-permeable screen and a monochrome camera specialized for measurements in the near infrared range.
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MD76500M -
Matco Tools
*Non-intrusive, quick check tool instantly verifies active or inactive coil operation*Detects the magnetic field created by a coil energizing*Tool can be used to test coil on plug, coil near plug and coil pack systems
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RFS set -
Langer EMV-Technik GmbH
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Innovations In Optics Inc.
Delivering the highest brightness and optical power available, our light engines provide optimized output solutions for a range of applications such as light guide and fiber optic coupling, fluorescence excitation, and unrivaled uniform near and far field illumination.
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Circuit ScanTM 1000 -
Micro Magnetics
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Amida Technology, Inc.
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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S14 -
Photon Kinetics
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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MiNi-HAC -
APREL, Inc.
Hearing Aid Compatibility (HAC) evaluation of wireless handsets ensures accessibility of these technologies to the hearing impaired. The MiNi-HAC system can be used for the design and development of wireless handsets as well as for evaluation of hearing aids used by the hearing impaired to gain access to mobile wireless technologies. RF Emissions Test - near field measurements of the electric and magnetic fields emitted by a wireless device.
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EM-2108 | 1.5 GHz – 10 GHz -
Electro-Metrics Corp.
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials. The fixture is a section of coaxial transmission line broken to allow the insertion of planar test materials. Although ASTM D4935-10 is currently limited to an upper frequency of 1.5 GHz, the EM-2108 meets and complies fully with both the impedance and SE requirements called out in ASTM test method D4935-10 up to 10 GHz. These results are shown in Figures 1 & 2. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred.
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ZGC -
Alpha Lab, Inc.
The model ZGC zero gauss chamber reduces the environmental magnetic field (Earth field) to near zero inside the chamber. Any gaussmeter probe which is less than 9.4 mm or 0.370" diameter can be placed inside. The meter is then "zeroed", which means that it will read zero whenever the probe is subsequently placed in zero field. By using a zero gauss chamber, any offset error is therefore eliminated. The model ZGC is unique in that it contains a degausser (demagnetizer). This is situated between the inner and outer mu-metal shields. When the degauss button is pressed, any accidental magnetization of the chamber, no matter how strong, is erased. Accidental magnetization is a major problem with most zero gauss chambers and it has limited their use. If a magnet comes too close, the chamber will become "permanently" magnetized and will have an internal field that is typically 0.2 to 0.5 gauss. The chamber must then be degaussed because the Earth field is also around 0.5 gauss, so a magnetized zero gauss chamber will not significantly reduce the field.
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Reflection -
Neaspec GmbH
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution