Showing results: 121 - 135 of 1435 items found.
-
Zero Defects International LLC
2D and 3D X-Ray Inspection services are available through the ZDI/Viscom applications center in San Jose. These services are especially valuable for failure analysis of failed or returned printed circuit assemblies.
-
DeFelsko Corp.
PosiTector Inspection Kits contain a PosiTector gage body (Standard or Advanced) and 3 probes – coating thickness, environmental and surface profile, as well as, accessories in a convenient hard shell carrying case.
-
Van Leeuwen Test Systems BV
The VLT tyre inspection system can check several tyre and wheel related items, such as tread depth and sideslip. All measurements are done very fast when the vehicle is on the roller brake tester.
-
KLA-Tencor Corp
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
-
141 -
Elcometer Limited
The Paint Inspection Gauge is ideal for use on metallic & non-metallic substrates such as wood, glass and plastics.Large easy grip handle - makes cutting thick or hard coatings easyInternal cutter storage compartmentx50 magnification microscope
-
ELIOS 2 -
Flyability SA
Get the job done! Elios 2 intuitive flight experience makes anyone feel like a seasoned pilot from the first flight. Perform flawless inspections with an effective and user-friendly tool, deployed within minutes.
-
StructureScan Pro -
Geophysical Survey Systems, Inc.
StructureScan Pro is a versatile concrete inspection system offering a wide variety of antenna options for concrete and other applications. Based on the SIR 4000 controller, the StructureScan Pro provides the GPR professional with solutions to any scanning situation.
-
KLA-Tencor Corp
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
-
IV-L200 -
In.D Solution
The IV-L200 is a leadframe inspection machine ideal for measuring leadframe dimension and pitch. Aside from identifying leadframe warpage, it is also used to detect bent or skewed leads as well as surface defects such as scratch, ink, and contamination, among others.
-
TruView Prime -
Creative Electron
The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
-
NovusEdge -
Onto Innovation
The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
-
X37 Series -
Mettler-Toledo, LLC
The X37 Series is part of our latest generation of x-ray food inspection systems, providing reliable and consistent detection of physical contaminants, as well as multiple product integrity checks in products packaged in cartons, doypacks, composite cans, plastic containers and metal cans.
-
Sonix Inc.
Image quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.
-
MXI Quadra 7 -
Nordson Corporation
Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
-
Elcometer Limited
Produced specifically for the automotive aftermarket and Insurance Assessors, 3rd party consultants, body shops and used car sales, these kits provide an instant measure of the coating thickness of panels.An illuminated magnifier is supplied to enable close inspection of bodywork.Measurement parameters include:Surface temperatureSurface inspectionCoating thickness