Showing results: 121 - 135 of 5652 items found.
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MOS Doping Profile Analysis -
Materials Development Corporation
MDC uses the comprehensive Ziegler algorithm toconvert pulsed MOS C-V data to a doping profile. The doping profile is accurate from the oxide semiconductor interface to the maximum depletion depth and is therefore useful for low dose ion implant monitoring. Peak doping, range, and total active dose are computed. The technique is sensitive enough to resolve changes in the substrate doping profile due to redistribution during oxidation.
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MOS Capacitance-Time Measurement and Analysis -
Materials Development Corporation
The Capacitance-Time transient resulting from an MOS device pulsed into deep depletion reveals important information about bulk properties of the semiconductor and about damage or contaminants introduced during processing.
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TestScript -
Genuen
Would you like to read your LabVIEW panel from Python? Or, automate your LabVIEW manual control screen without the overhead of a complex test executive? TestScript is a free Python/LabVIEW connector from Genuen that is simple to add to your existing LabVIEW application and abstracts complex Python coding, allowing you to easily use Python to control LabVIEW or vice versa.
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GPS Tracker -
Seismic Source Co.
*Real Time display and History of all Vehicles and Personnel on Crew*Safety Reports and Legal documentation*Built around Google Earth – Data Reports free to everyone
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Zebra Technologies Corporation
Design, manage, integrate and develop your way to higher productivity. We also have a full Development Services team to support your business environment.
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SourceLink -
Seismic Source Co.
Specifically designed to maximize production with Continuous Recording Systems like iSeis Sigma, OYO GSR, Fairfield Node, Sercel Unite and all other systems.
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Srive-Level Capacitance Profiling (DLCP) Measurement -
Materials Development Corporation
Drive-levelcapacitance profiling is an extremely useful technique to characterize amorphoussilicon or other semiconductor material with large concentrations of deep band gap states.
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Overlay Plots -
Materials Development Corporation
The overlay option gives the user the ability to overlay several plots on one graph for comparison. Simply click and drag the mouse from the MDC logo at the bottom right corner of a plot to an open area on the screen to produce the overlay plot. By dragging other plots to this overlay, each plot will be added.
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Gate Oxide Integrity Option -
Materials Development Corporation
Oxide integrity of MOS devices can be evaluated by various techniques such as Time Dependent DielectricBreakdown, Charge to Breakdown, or ramped voltage. When used with a prober, map distribution of breakdown fields. Output the data using histograms, cumulativefailure, or Weibull plots.
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Junction Measurement and Analysis -
Materials Development Corporation
A comprehensive set of analyses for junction diode or Schottky barriers begins with C-V data gathering that adjusts the voltage step to the slope of the C-V characteristics. This assures an optimum set of C-Vdata whether the voltage range is small or large. Doping profile and resistivity profile are both available at the touch of a key. Plots of 1/C2 - V or Log(C) - Log (V+ phi) show doping uniformity and doping slope factor. Exclusive recalculation options allow adjustment of stray capacitance and area to facilitate calibration using a standard reference wafer of known doping or resistivity.
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Inspector -
Flyability SA
Organize, review and document each flight into a single project combining RGB, thermal, and flight data.
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Ion Implant Analysis Option -
Materials Development Corporation
Computes active dose, range, and straggle. Can model implants with various doses, energies and cap materials. Overlays theoretical and actual plots.
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Electrochemistry Tests -
Materials Development Corporation
CyclicVoltammetry and Galvanostatic Charging are tests used throughout the industrial and scientific communities to study chemical reactions and behavior of electronic structures. They are extremely helpful in the monitoring of nano based dielectrics, used in super /ultra capacitors or self-assembled monolayers (SAMs). The Cyclic Voltammetry test applies a ramping voltage to a device and measures the resulting current. In acapacitor-like structure the current reveals loss in the dielectric as well as degradation over time. CyclicVoltammetry is used to characterize the performance of supercapacitors and ultracapacitors formed using various nano-technologies. It is also useful in the studies of self-assembled monolayers used for sensors.
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CoolitDC -
Daat Research Corp.
Designed to predict and optimize the thermal performance of data centers, CoolitDC analyzes an entire facility, individual racks, and servers, or zeroes-in on the smallest board or component. It is the analytical tool data center managers depend on for informed decision-making.