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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Test Products & Platforms
Save yourself months of work on test specifications, component ordering, assembly and trial-and-error operation.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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PXI Test Instrumentation
The Yelo Pixi general purpose tester is a PXI based functional test system with in-circuit and continuity capability. Built into a free standing 19” rack is a PXI chassis, mass interconnect fixture interface, PC, flat screen and space for additional user selectable instrumentation.
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Digital Test Instruments
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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Digital Functional Test
TS-323
The TS-323 GENASYS platform is a PXI based test system which is designed to address a broad range of mil-aero and mission-critical products that require performance functional testing. The GENASYS offers best in class digital test capabilities which can effectively address the test needs associated with legacy ATE systems including the Teradyne L200/L300, GenRad 2750 and VXI-based digital systems.
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Terotest
iTest
iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices.In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Bi-Directional Differential-TTL I/O PXI Card
GX5641 Series
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5641
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) and can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Digital I/O PCI Card
GC5050
The GC5050 is a high speed Dynamic Digital I/O card that provides capabilities comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GX5050, a 6U PXI card. Both have the ability to operate independently of the host computer when in the RUN mode.
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Noise & Vibration Testers
System PC Based particularly suitable for vibration and noise measurements for the characterization of mechanical, electromechanical and electroacoustic and for the control and monitoring of installations of production. Complete configurability for the use of platforms PC (Notebook, desktop, PXI) suitable to applications of both static labotatorio, both dynamic (eg road-test) and also in the production line (functional tests and monitoring).
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PXI Precision Resistor Module 3-Channel, 3 to 5.82M
40-297-152
This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 3-Channel, 3 to 11.4M
40-297-153
This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 4-Channel, 2 to 13.6k
40-297-131
These PXI precision resistor modules provide a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 3-Channel, 3 to 1.51M
40-297-150
This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.