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Thin Film

layer of material ranging < a nanometer to > a micrometer in thickness.

See Also: Film, Ellipsometers


Showing results: 136 - 150 of 189 items found.

  • Metrology System

    IMPULSE V - Onto Innovation

    With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.

  • Infiniium Oscilloscopes

    Z‑Series - Keysight Technologies

    The Infiniium Z-Series delivers this and more with its RealEdge technology enabling 63 GHz of oscilloscope bandwidth and superior signal integrity. The Z-Series takes advantage of indium phosphide chip technology and custom thin film packaging to give you extremely low noise, low jitter, and high effective number of bits. These technologies allow you to see the true representation of your signal.

  • Surface Quality Monitors

    Photo Emission Tech., Inc.

    PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.

  • Low Noise Amplifiers

    Radiometer Physics GmbH

    RPG Low Noise Amplifiers are developed and manufactured using the most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 350 GHz. With improved DC-supply and modern semiconductors these amplifiers not only deliver low noise performance but also broad operating bandwidth and gain flatness. These low-noise amplifiers are available as a standard product and on request as customized manufactured product.

  • Ozonated Water Delivery System

    LIQUOZON® DI-O3 - MKS Instruments

    MKS' LIQUOZON® DI-O3 is a dissolved ozone gas delivery system providing high purity ozone in ultrapure water for Semiconductor and Electronic Thin Film applications like contaminant removal and surface conditioning via wet clean or rinsing methods. The high redox potential of ozone causes rapid conversion back to oxygen making it an environmentally friendly alternative to other chemical processes.

  • Filters / Splitters / Detectors

    DiCon Fiberoptics, Inc.

    DiCon’s 100 GHz WDM is designed to multiplex and demultiplex signals in multi-wavelength systems based on the ITU 100 GHz grid. The component uses a thin film filter mounted between a pair of GRIN lens collimators. The 100 GHz WDM is housed in a compact, environmentally stable package that offers superior resistance to humidity and temperature and is suitable for mounting on a printed circuit board or within a module.

  • Proton Induced X-ray Emission (PIXE)

    Elemental Analysis, Inc.

    Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.

  • Scanning Auger Nanoprobe

    PHI 710 - Physical Electronics

    The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.

  • Benchtop Amplifiers

    ERAVANT

    Benchtop, broadband driver amplifiers are designed and manufactured by utilizing the most advanced PHEMT or MMIC devices, thin film technologies, and an improved DC power supply to deliver a high output power and a superior gain flatness and low noise performance. The standard offering focuses on general purpose applications and covers the frequency range of 1 to 110 GHz. However, custom designs are also offered to meet any user’s specific needs.

  • Dew Point Analyzer

    CI-IN36 - Shanghai ChangAi Electronic Science & Technology Co.,Ltd

    CI-IN36 adopts the sensor that is made of thin polymer film, which can test the dew point with good stability. It will not influenced by condensed water and most compounds. This analyzer has received automatic zero point calibration and gain return patents with wide measure range, high accuracy, good stability and high performance cost ratio. - See more at: http://en.ci-ele.com/470baa2f-f4d7-af3b-c88b-b26356a1660d/8e93bc9f-4658-e0c4-2205-0be00b504269.shtml#sthash.KzPqj2sw.dpuf

  • Power Amplifiers

    Radiometer Physics GmbH

    RPG Medium Power Amplifiers are developed and manufactured by using most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 130 GHz. With improved DC-supply and modern semiconductors these medium power amplifiers not only deliver high power output but also superior power added efficiency (PAE) and higher linearity. These medium power amplifiers are available as a standard product and on request as a customized manufactured product..

  • 100GHz Dense Wavelength Division Multiplexer

    DWDM-1000 - Hangzhou Huatai Optic Tech. Co., Ltd.

    DWDM series is based on mature thin film filtering technology and adopt metal sealing technology to encapsulate. It has the feature of flat channel bandwidth, flexible channel configuration, low insert loss and high isolation. The flexibility of channel configuration and modularized design make it convenient for system upgrading and expanding. All the Huatai products have no epoxy glue in optical line and can be used in high power optical communication system.

  • 50GHz Dense Wavelength Division Multiplexer

    DWDM-0500 - Hangzhou Huatai Optic Tech. Co., Ltd.

    DWDM series is based on mature thin film filtering technology and adopt metal sealing technology to encapsulate. It has the feature of flat channel bandwidth, flexible channel configuration, low insert loss and high isolation. The flexibility of channel configuration and modularized design make it convenient for system upgrading and expanding. All the Huatai products have no epoxy glue in optical line and can be used in high power optical communication system.

  • Software

    TFT Test Systems - Materials Development Corporation

    Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.

  • 10-GHz Split Cylinder Resonator

    85072A - Keysight Technologies

    The Keysight 85072A 10-GHz split cylinder resonator measures permittivity and loss tangent of thin film, un-clad substrates and low loss sheet materials according to the IPC TM-650 2.5.5.13 test method. Designed for robustness and ease of use, it features precision cylinders to ensure high Q factor and loss tangent resolution. Compatible with the Keysight 85071E-300 materials measurement software, the 85072A and can be purchased separately or as part of a complete turn-key solution.

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