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Fluorescence

Absorbed light emission.

See Also: Fluorometers


Showing results: 226 - 229 of 229 items found.

  • Near Field Scanning Optical Microscope

    MCL-NSOM - Mad City Labs Inc.

    The MCL-NSOM is a fully operational near field scanning optical microscope. It has been built on Mad City Labs versatile RM21™ inverted optical microscope which allows users to convert between NSOM, SPM, and fluorescence optical microscopy techniques. The MCL-NSOM builds on our successful resonant probe SPM and incorporates common elements such as the MadPLL® phase lock loop controller. The NSOM also exploits our expertise in precision motion control by including six axes of motorized positioning, for the sample and NSOM probe, and three axes of closed loop nanopositioning to provide exceptional position resolution and accuracy. The MCL-NSOM also includes a 635nm laser excitation source, fiber launch, oil immersion objective lens (100x, 1.25 N.A.), CMOS alignment camera and avalanche photodiode detector. The microscope configurable design allows researchers to tailor the instrument for many different optical microscopy techniques including near field spectroscopy. The MCL-NSOM is operated in aperture mode with shear force feedback. The standard 5 modes are supported: illumination, collection, illumination and collection, reflection and reflection collection. We supply a LabVIEW™ based software package which automates the motion control features.

  • EDXIR-Analysis Contaminant Finder/Material Inspector

    Shimadzu Corp.

    EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format.  It is also effective for the linked storage of various types of data as electronic files.

  • EDX-FTIR Contaminant Finder/Material Inspector

    EDXIR-Analysis Contaminant Finder/Material Inspector - Shimadzu Corp.

    EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format.  It is also effective for the linked storage of various types of data as electronic files.

  • Widely Tunable Ultrafast Laser System For Multiphoton Imaging

    InSight X3 - Spectra-Physics

    Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.

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