Showing recent results 1 - 15 of 131 products found.
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UniTest Inc.
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Aplab Limited
A new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V ~ 10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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B&K Precision Corporation
Component testing is a method where testing of each component in an application is done separately. Suppose, in an application there are 5 components. Testing of each 5 components separately and efficiently is called as component testing.
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Imapact 7BT - Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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XP-8500 - Lorlin Test Systems
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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TOS2000CT Series - Twintex Electronics Co., Ltd
Dual channel 20MHz/40MHz/50MHz10 times sweep magnificationTV synchronization; X-Y modeHigh illumination internal graticule CRTJapanese encoded switch, reliable and durableFully sealed durable attenuation switchALT triggering function, enabling simultaneous observation of two independent signals.
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34XX - FETservice, Inc
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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HF Test System - S.E.A. Datentechnik GmbH
With the component tester a complete system is available which allows testing of components for wireless communication
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CTJ329 - Matco Tools
Heavy-duty circuit tester for checking low voltage up to 12V. Tester becomes a jumper for powering electrical components or as a ground.
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SWB-2 - Malcom
Wetting Balance Tester for through-hole component leads. The Malcom SWB-2 Wetting Balance Tester is an automated solution for measuring the wetting force of your through-hole components using wave solder. Quickly evaluate the wettability of your component, flux, and solder.
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TCX 01 - Chauvin Arnoux Metrix
The component tester surface mounted TCX 01 automatically recognizes the tested component and displays its value on its large LCD display 6000 points.
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TOS7200 - Kikusui Electronics Corp.
The TOS7200 is an insulation resistance tester available for a wide range of various electric and electronic components, as well as electric and electronic equipment.
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JGB Consulting, Inc.
*This is our base tester.*From this base design we will add or remove components depending on the needs of the project.
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Lorlin Test Systems
The Double-Impact Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The system uses a Windows 10® 64-BIT OS and a USB 2.0.
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Testing Kits - Detectortesters
Solo testers are available either as separate components or as complete kits – configured both by height and application. The price of complete kits is usually less than the sum of the component parts.
