Showing results: 76 - 90 of 112 items found.
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YIS 200 -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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5000 Series In-line Handler -
Circuit Check, Inc.
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
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HopeTech
High-stability internal resistance of the battery Meter.The main battery internal resistance and battery voltage. This product can simultaneously measure the resistance and voltage and to compare battery internal resistance and open-circuit voltage.The CHT3560 standard RS232C and HANDLER interface automated measurement fast and accurate judgment the battery deterioration of the situation, sorting products suitable for battery assembly line and factory inspection. Low resistance characteristics can be used to characterize the mechanical and electrical components down low current test conditions.
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esmo AG
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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X-eye NF120 -
SEC Co., Ltd.
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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YIS and SF Series -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
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Microtest S.p.A.
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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TH2689A -
Changzhou Tonghui Electronic Co., Ltd.
TH 2689/TH2689A provides max. test voltage: 800v/500v, charge current: 0.5mA─500.0mA( if >100V, the max. power 50W can limit). It is mainly applied in capacitance leakage current, insulation resistance and aluminum electrolysis capacitance anode foil pressure test. Also it can be applied in the confirmation of annihilator, zener diode, neonbulb .etc and leakage current test. Standard Handler interface, stable and rapid test, to reach the sorting effect
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11021/11021-L -
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters available, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. The standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities enable the Chroma 11021/11021-L for use in both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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Chroma 11021/11021-L -
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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34XX -
FETservice, Inc
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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National Technical Systems
During installation, transport or repair, many products have a risk of being dropped. While handlers receive training to treat these items with care, mishaps happen to even the most experienced professionals. Drop testing ensures the product stays in its original condition from manufacturing to implementation.In addition to ensuring that products survive their journey from point A to point B, many products are at risk for being dropped or jarred throughout their lifetime. These products include handheld devices and tools, lab equipment, personal computers, field measuring equipment, construction tools, etc. In such cases, drop testing may be required to ensure that expensive tools or equipment are capable of surviving the perils of expected use and abuse.
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36XX -
FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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DU2316/2317 -
Delta United Instrument Co., Ltd.
Leackage Current range display: 0.0001uA ~ 20.00mAAutomatic or Manual trigger with CHARGE/TEST/DISCHARGE100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceHi / Lo current limit setting & PASS/FAIL judgment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Agilent Technologies
Clinical microplate instrumentation provides high efficiency and performance for your clinical diagnostic workflows. From ELISA microplate readers and washers, to multifunctional liquid handling, multimode detection and automated microscopy, Agilent BioTek microplate instruments and software are designed for ease of use in setup and operation, while providing powerful analysis for quick, high-quality results. For even greater automation and higher throughput, microplate stackers, handlers and automated incubators transform a benchtop instrument into a walk away automated system.
