Showing results: 196 - 210 of 577 items found.
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Renice
Renice 6U VPX Computer complies with OpenVPX Vita65 specification. It adapt GPGPU architecture, on board ARM processor and compatible with industrial and rugged design on the structure. It applied in the high-performance computing center, high-performance display, parallel computing, and computing cluster application, eg Ground Radar, Airborne Radar and Shipborne Radar.
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MPQ-AVR32 -
RPM Systems Corporation
Supports Atmel AVR32 devices Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Laurel Electronics, Inc
A high-sensitivity 5-digit meter for use with load cells, strain gauges and microvolt input signals where high accuracy and stability are required. Load cell operation allows 4- or 6-wire hookup and display in engineering units, such as lbs, kg or psi. Built-in excitation for up to four 350-ohm load cells in parallel.
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ADS-100 -
Trans-Cal Industries, Inc.
The Model ADS-100 is an all solid-state device that simulates the output of altitude encoders/digitizers in both parallel and serial (RS232) data formats. Designed to substitute for an altitude encoder when testing and troubleshooting an aircraft's altitude reporting system, the ADS-100 provides two RS-232 compliant outputs in addition to the ICAO pressure altitude code.
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TESEC, INC
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Direct Dock -
SV Probe, Inc.
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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N6700 -
Keysight Technologies
Keysight high performance DC power supplies offer speed and accuracy for test optimization. The single output, 200 W, GPIB 6641A-6645A provide fast, low-noise outputs; analog control of output voltage and current; fan-speed control to minimize acoustic noise; as well as parallel and series connections of multiple units.
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36XX -
FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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DCP-BTA -
Vernier Software & Technology, LLC
The Current Probe measures DC and low-frequency AC currents up to 600 mA. Use Current Probes in combination with Differential Voltage Probes to investigate Ohm's Law and explore series and parallel circuits. The 0.1 shunt resistor minimizes changes to your circuit. If currents will exceed 1 A, use the High Current Sensor.
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Delta Eclipse -
Cohu, Inc.
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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PEC N.V.
PEC offers a wide range of cell testers, starting from the 5A desktop test system (ACT0505), to our range of 50A cell testers for more standardized cycling (CT0550) and our advanced cell testers with capabilities up to 4000A (ACT0550). All systems support parallel switching for achieving higher currents.
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Base Station Emulator sUTP 5018 -
NOFFZ Computer Technik GmbH
Bring a whole mobile network to your lab or production: NOFFZ Base Station Emulator (BSE) creates a customized cellular wireless environment. This makes testing wireless devices easier than ever before.Compact, cost-effective testing of multiple DUTs in parallel from 2G to 5G, including endurance testing for several days.
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U2723A -
Keysight Technologies
The 3-channel 20V/120mA module can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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MPQ-ARM -
RPM Systems Corporation
Supports Nuvoton M05x and NUC1xx device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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SmartLab® -
Rigaku Corp.
SmartLab includes as standard Rigaku's patented Cross Beam Optical™ (CBO) technology. CBO technology uses simultaneously mounted, simultaneously aligned optical components for both focusing (Bragg-Brentano) and parallel beam diffractometer geometries. Users can switch between the two geometries without the need to remove, replace, or realign optical components.