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S-Parameters
Scattering Parameters quantifies high frequency RF power waves propagation through a network.
See Also: Vector Network Analyzers
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ENA Vector Network Analyzer
E5061B
Select the best configuration for your test needs from a wide variety of test set options: 100 kHz to 1.5 GHz/ 3 GHz, 2-port, 50 or 75 ohm, transmission/reflection or S-parameter test set Address a broad range of applications with the LF-RF option (Option 3L5/3L4/3L3): 5 Hz to 3 GHz, 2-port, 50 ohm, S-parameter test set, gain-phase test port, built-in DC bias source Combine network analysis and impedance analysis to customize your application in a single instrument (Option3L5/3L4/3L3 plus 005) Every spec verified, adjustments included Lock in support & peak performance from the start
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Frequency Extension Heads for Vector Network Analyzers
FEV
These frequency extension modules connect to your existing test ports and leverage the inherent microwave network analyzer’s performance and features to display full port S-parameters: Two measurement architecture available: 1-path/2-port and fully reversing 2 port. Waveguide calibration kits are available as separate accessories.
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Handheld Vector Network
ZNH
R&S®ZNH is a full two-port handheld vector network analyzer that offers one-port cable and antenna measurement and full two-port S-parameter measurements. The touch based interface is simple to operate and a configuration overview menu makes measurement preparation more efficient. The R&S®ZNH may have a small form factor but it is complete in every detail and delivers high performance and all the key functionalities.
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Network Analyzers
A network analyzer is an instrument used to analyze the properties of electrical networks, especially those properties associated with the reflection and transmission of electrical signals known as scattering parameters (S-parameters). Network analyzers are used mostly at high frequencies; operating frequencies can range from 9 kHz to 110 GHz
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Signal Integrity TDR and VNA Software
80SICON IConnect
IConnect software is the efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter and eye diagram tests, and fault isolation.
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Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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USB VNAs in Higher Education
Universities with RF engineering labs have limited budgets, yet future RF engineers need to learn and practice valuable S-parameter measurement skills on modern equipment that fits today’s workplace. The unparraleled combination of price and performance from CMT’s VNAs have changed the way Universities teach RF.
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Vector Network Analyser
LA19-13-02
The LA19-13-02 is a PC-driven Vector Network Analyser suitable for measuring a wide range of devices from 3 MHz to 3 GHz with 100 Hz resolution. Its full s-parameter test set includes bias-Ts for biasing active devices. It is housed in a small lightweight package making it very portable.
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Vector Network Analyzer
R42XXE
The R42XXE Vector Network Analyzers are designed for measuring of S-parameters, VSWR and impedance of waveguide networks in the full frequency ranges of standard waveguides between 33 and 170 GHz. Frequency accuracy is ±0.2%. The measurement range of reflection factor modulus is from 0 to 1. The measurement range of reflection factor phase is from 0 to ±180° for 0.1< |Гx|<1 with accuracy ±7.5 o in 18-75 GHz frequency range and ±9.6° in 75-170 GHz frequency range. The measurement range of transmission factor phase is from 0 to ±180 o with accuracy ±(5+0.1 |Ax|) o for Ax >-50 dB in frequency range to 75 GHz, for Ax >-30 dB - to 170 GHz. Data can be displayed in the rectangular, Smith or polar diagrams. VNA requires Personal Computer with USB interface.
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Vector Network Analyzers
ZND
The R&S®ZND network analyzer performs unidirectional measurements up to 4.5 GHz in the base model. It can be expanded to perform bidirectional measurements and the frequency range can be extended to 8.5 GHz. The large R&S®ZND touchscreen is easy to operate making it ideal for S-parameter measurements, even when many diagrams are needed. Time domain measurements can also be added for even more functions.
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High Dynamic Receivers
ZRX
converter series with high dynamic range receivers. Typical applications are antenna measurements (OTA) and signal analysis. The ZRX Receivers are used wherever full S-parameters are not required.
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S-Parameter Measurement System
DPS08
KEYCOM provides S-parameter method measurement systems in two modes, the reflection mode and the transmission mode, to address the individual purposes. Both modes measure the complex permittivity (εr) and complex permeability (μr) at the same time, and the proper usage is as follows.
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S-parameter Measurement System
DPS21
Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap as specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on.It enables compactness and measuring specimens by plane wave because of direct installment of lens with an antenna.It enables measurement by monitoring S21 and S11 parameter with connections of a test fixture to a vector network analyzer and PC.
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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Fast Electromagnetic Analysis Suite
FEMAS
FEMAS was created to provide tools for engineers to assist in PCB and system design. Our tools are based on full wave solutions to Maxwell's equations but operate much faster than traditional CEM tools. Multi-Functional! End-to-End Link Path Analysis. S-parameter file concatenation. Time Domain analysis. Frequency Domain analysis. Transmit/Receive Equalization. Causality/Passivity Checking/enforcement. 2D Cross Section Analysis for multi-conductors. S-parameter and waveform plotting. Network parameter conversion. De-Embedding. Signal Analysis.
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Real-time S-Parameter And Power Measurement Uncertainty
S97015B
See real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. Estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates
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Active Hot Parameters For P50xxA/B Streamline Series VNA
S97111B
S97111B active hot parameters are available on P50xxA/B Streamline Series vector and provide a more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Active Hot Parameters For E5081A ENA-X And E5080B ENA
S96111B
The S96111B active hot parameters are available on ENA-X or ENA network analyzers and provide a more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Real-time S-Parameter And Power Measurement Uncertainty
S95015B
The S95015B provides real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. It lets you estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates.
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RF/Microwave Test Capability
Teledyne Labtech have extensive microwave alignment and microwave testing facilities. This includes the ability to test noise figure, S-parameters and harmonics. This ensures that Teledyne Labtech can supply a fully compliant product and provide a complete turnkey microwave assembly and test solution.
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PNA Microwave Network Analyzer
N5221B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PNA Microwave Network Analyzer
N5224B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PNA Microwave Network Analyzer
N5224A
Reach for unrivaled excellence in your measurements and designs Transform deeper understanding into better designs with the PNA's outstanding measurement integrity Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Get the best accuracy with Keysight's S-parameter measurements Meet your specific budget and measurement needs by customizing to just the right level of performance. Every spec verified, adjustments included Lock in support & peak performance from the start
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PNA Microwave Network Analyzer
N5225B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Active Hot Parameters
S93110B
S93110B active hot parameters is available on PNA-X Series network analyzers (N524xB) and provides more accurate method to test hot S-parameters, gain and output power, etc. than traditional methods by utilizing X-parameter technologies.
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Active Hot Parameters, Restricted To 50 GHz
S93111B
S93111B active hot parameters available on PNA-X Series network analyzers (N524xB) and provides more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing X-parameter technologies. Restricted to 50 GHz.
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Real-time S-Parameter And Power Measurement Uncertainty
S96015B
See real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on one screen. Estimate uncertainty reliably and apply more realistic limit lines for pass/fail tests for better production yield rates
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Automated Measurement Expert (AMX), Test Plan Builder
S94701A
The Keysight S94701A automated measurement expert (AMX) Test Plan Builder will help you edit and create your test plans for automated multiport S-parameter measurements with the PXI Vector Network Analyzer (VNA).
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Nonlinear X-Parameters
S94514B
The S94514B Nonlinear X-parameters application provides the mathematically correct extension of S-parameters to large-signal conditions.