Showing results: 136 - 150 of 564 items found.
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HBM, Inc
Whatever your application, mobile or stationary, on a test cell or under extreme environmental conditions, HBM has the right measurement data acquisition system for your needs.
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SoMat
Whatever your application, mobile or stationary, on a test cell or under extreme environmental conditions, HBM has the right measurement data acquisition system for your needs.
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P5573A -
Keysight Technologies
Keysight P5573A PCIe 6.0 Protocol Exerciser gives the flexibility in providing realistic traffic to devices under test and also able to emulate as a complex host system
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UTS -
Bloomy Controls, Inc.
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Terotest Systems Ltd.
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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DC-HTOL -
Accel-RF Corporation
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Conformiq -
Verifysoft Technology GmbH
Instead of using test cases, Conformiq users have a model, which describes the System Under Test, or the product they want to test. From the model, Conformiq products use highly intelligent algorithms to automatically determine the necessary tests and test data, and automatically generate scripts for automated execution.
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Elektra -
Rohde & Schwarz GmbH & Co. KG
The R&S®ELEKTRA test software controls complete EMC systems and automates measurements of equipment under test (EUT) being certified for emissions (EMI) and immunity (EMS). R&S®ELEKTRA simplifies configuration of test systems and test descriptions in accordance with common standards. It speeds up test execution and paves the way to quickly generating a comprehensive test report.
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FLIR -
CI Systems Inc.
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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M-2000 -
Jinan Testing Equipment IE Corporation
Model M-2000 Wear Testing Machine is to be used test the anti-wear performance for metal and non-metal specimen under the sliding, rolling, and sliding-rolling condition. The Wear Testing Machine can also test various materials under dry-friction and wet-friction. The wear testing system can calculate friction work & friction coefficient by the data acquired. The Wear Testing Machine is widely used in universities, research & scientific institutes.
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Verified Systems International GMBH
The test system cluster architecture is based on dual CPU or 4-CPU PCs acting as cluster nodes. The nodes communicate and synchronise over a high-speed network (Myrinet or InfiniBand). A modification of the Linux operating system allows to run the test execution and evaluation algorithms in hard real-time on reserved CPUs, where scheduling is non-preemptive and controlled by the test system itself. The interrupts caused by interfaces to the system under test may be relayed to CPUs designated explicitly for their handling. This approach offers the opportunity to utilise high-performance standard hardware and the services provided by the widely accepted Linux operating system in combination with all mechanisms required for hard real-time computing. The cluster architecture presents an opportunity to distribute interfaces with high data throughput on different nodes, so that PCI bus overload can be avoided. In addition, the CPU load can be balanced by allocating test data generators, environment simulations and checkers for the behaviour of the system under test ("test oracles") on dedicated CPUs.
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50-293-132 -
Pickering Interfaces Ltd.
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-293-133 -
Pickering Interfaces Ltd.
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-293-032 -
Pickering Interfaces Ltd.
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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50-293-033 -
Pickering Interfaces Ltd.
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.