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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Wireless Test Solutions
Adivic/Chroma Group has been in the development of RF & Wireless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Mitsubishi, Honda, Hyundai,.. ,most of the global IC design houses with DTV chips, and also military entities in NATO. With the same customer-proved Software Defined Radio architecture, we have introduced Wi-Fi, Bluetooth tester since 2014. It will soon cover other current/future wireless standards such as 4G/LTE, 802.11ax, 802.11ah, etc.
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Wireless Test System
WTS-80
CETECOM offers a wide range of services and solutions to help companies develop and execute product testing plans to determine a product’s compliance status and master the increasingly complex regulatory issues of the international market.
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Wireless Device Test Sets & Wireless Solutions
Keysight products provide mobile phone designers and manufacturers with increased measurement speeds, improved accuracy, and exceptional flexibility for testing mobile devices. Our one box test sets cover all the major technology formats: LTE-Advanced, LTE (FDD and TDD), GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+/DC-HSDPA, cdma2000®/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136, AMPS, Bluetooth®, Bluetooth Enhanced Data Rate (EDR), Bluetooth Low Energy, ZigBee™, Wireless LAN (WLAN), 802.11a/b/g, 802.11n, NFC/EMV, MIMO, and WiMAX™.
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Wireless Test Set Software
Extend Keysight wireless test set capabilities with software products designed to streamline wireless measurements and automate testing for time consuming and complex measurement and analysis tasks. Software products are available for all wireless communications test set platforms - automating test for cellular mobile devices, WiMAX™, LTE, and Bluetooth®/WLAN devices.
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Wireless Functional Test Fixtures
Circuit Check’s wireless fixture technologies reduce debug time, simplify ECO’s and reduce maintenance. This allows for the highest test performance, ability to probe denser smaller targets and achieve ultra-high node counts. Higher density more complex circuit boards complicate testing requirements. Smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board (T-Board).
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Wireless In-Circuit Test Fixtures
Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Wireless Router Test Platform
Promptlink Communications, Inc.
Promptlink's Wireless Router Test Platform (WRTP) is a complete functional router testing solution designed for the highest volume testing requirements. WRTP is the ultimate tool for accurate, high-demand testing of wireless routers. With added support for TR069 through Promptlink's own ACS, WRTP is the solution that gives you the ultimate power and productivity to keep your business moving forward.
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RF & Wireless Test Solutions
Adivic/Chroma Group has been in the development of RF & WIreless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Toyota, Mitsubishi, Honda, Hyundai, Daewoo...etc., most of the global IC design houses with DTV chips such as Broadcom, Marvell, MTK...etc., and also defense entities around the world.
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IoT Wireless Test Solution
IOT8720A
A solution that delivers fast, reliable and efficient measurement to support massive of IoT devices produce daily.
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Wireless System For Test And Measurement
TM400 Compact
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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Wireless Connectivity and IoT Test System
IQxel-M4W
Suitable for the lab or manufacturing environment, the IQxel-M4W 6G is ideal for RF testing of wireless connectivity and IoT products. The platform’s flexible software supports the most prevalent wireless connectivity standards: WLAN 802.11ax (Wi-Fi 6) and legacy (802.11a/b/g/n/ac), Bluetooth® Classic and Low Energy (Bluetooth® LE) as well as Zigbee/Thread, Z-Wave, LPWAN technologies (Sigfox, LoRa) and cellular IoT technologies (NB-IoT, LTE-M, 5G) as well as navigational technologies.
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Test Tool for Modern Wireless Communication Devices
ITN 1000 for WLAN and Bluetooth™
Functional Test Tool for Modern Wireless Communication DevicesDevelopment, prototyping, validation and production testing of wireless devices supporting the Internet of Things need low cost, easy-to-use test equipment with support for the latest standards:- Wi-Fi 6E: 802.11ax, 2×2 MIMO; 2/5/6 GHz - Bluetooth™: 5.2 BDR/EDR/BLE
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Wireless Test Solutions for Bluetooth®, Wi-Fi, Matter/Thread/Zigbee
Teledyne LeCroy's Frontline family of wireless protocol analyzers, sniffers, and testers deliver unparalleled performance for complex multi-technology test environments including market-leading support for the latest Bluetooth, Wi-Fi (802.11), and Matter/Thread/Zigbee (802.15.4) technologies. We've got you covered - from RF PHY testing to protocol analysis to Bluetooth LE conformance testing.
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Wireless TRMS Clamp Meter w/ 3-Phase & Imbalance Motor Tests
DL599
UEi Test & Measurement Instruments
TRMS Wireless Clamp Meter w/ 3-Phase & Unbalanced Load Tests
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
