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Thermal Test

Designed to produce a temperature change in a device. The magnitude and rate of this change should induce a sufficient thermal stress fatigue to identify sources of potential failure without causing catastrophic failure of all components. (sigmasystems.com)

See Also: Thermal, Thermal Shock


Showing results: 181 - 195 of 296 items found.

  • Automatic Test Equipment

    Wewon Environmental Chambers Co, Ltd.

    Automated Test Equipment (ATE) adopts PID+PWM principle VRF (Refrigerant flow control) technology to realize low temperature and energy saving operation (servo control technology of refrigerant flow based on thermal condition of electronic expansion valve). Realize the automatic constant temperature of the studio.https://www.wewontech.com/automatic-test-equipment/

  • Liquid-To-Liquid Thermal Shock Chambers

    TSB Series - ESPEC North America, INC.

    Purchasing a liquid thermal shock chamber needs close consideration of the long term operating costs. The specialized liquids used can easily evaporate, causing the loss of thousands of dollars of fluid per year, if not properly contained. ESPEC has led the industry in developing a sophisticated test chamber with multiple mechanisms to significantly reduce fluid usage. The new TSB-51 loses just 1.4 grams per test cycle, or less than a liter per 1,000 cycle test.

  • PXI 32 Channel I/O, High and Low Side Driver

    40-413-003 - Pickering Interfaces Ltd.

    The 40-413 range is available in three configurations, a high side only, a low side only and a combined high and low side (shown here) –each capable of driving 2A loads. Each output is fully protected against over-voltage, over-current and thermal overload, ensuring robust and reliable operation in the toughest test environments.

  • Combined Environmental Reliability Test System

    VTC SERIES - EMIC Corporation

    HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.

  • Benchtop Thermal Forcing System

    Wewon Environmental Chambers Co, Ltd.

    Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/

  • Walk-In Climatic Test Chamber

    ACMAS Technologies Pvt. Ltd.

    WEIBER climatic test chamber is ideally suited for specimen test requiring quick changes of temperature. It covers various applications from JEDEC and IEC test standards. The climatic chamber is equipped with advanced technology such as specimen temperature control which allows linear specimen temperature rates of change during rapid thermal cycling or accurate temperaThe walk in option provides facility to test large sized, heavy weight specimen as well as the facility to test the specimen in bulk. Capacities ranging from 2000 to 10,000 Lt are available. Standard as well as customizable sizes and facilities are provided.

  • Discrete Detectors

    Inframet

    TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.

  • Microanalyzer

    DRK8021S - Shandong Drick Instruments Co., Ltd.

    Using a microscope with digital eyepiece, not only with the general eyepiece. And can be applied to advanced color CCD through the display (by the customer optional) study, the thermal characteristics of the test substance. It can be used as a melting point determination of trace samples, but also for the study of biological engineering thermodynamics in chemical synthetic biology mineralogy, medicine, criminology are widely used.

  • Pick and Place Test Handler

    Delta MATRiX - Cohu, Inc.

    Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.

  • Differential Thermal Analyzer

    SKZ1055A - SKZ Industrial Co., Ltd

    Differential thermal analysis: temperature under program control, the relationship and difference oftemperature between the measured material and the material and the reference.The DTA curves is to describe the changing relationship depending on temperature and time between themeasured material and the reference compound. During the test, the sample temperature changes due tothe phase change or an endothermic or exothermic reaction effects.

  • Diode & Rectifier Test Systems

    D&V Electronics LTD

    D&V’s diode and rectifier test systems provide a quick, accurate and easy to use interface to check and measure all main parameters of regular and avalanche rectifiers. Real life conditions are simulated to maximize diagnostic capabilities. Additionally, analysis of the rectifier’s thermal resistance can be performed to detect poor internal diode connections and related defects.

  • TVAC CalPod, 20 GHz

    85532B - Keysight Technologies

    CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button, and without removing the DUT or re-connecting standards. Very useful in thermal-vacuum chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the testing to perform a normal re-calibration.

  • Reliability Testing Services

    Innovative Circuits Engineering, inc

    Our Reliability Testing Services make it possible for us to work with many different customers who manufacture devices that need tests such as pressure pot, temp cycle and more.The focus of our reliability testing lab is to provide our customers with an array of services and tests that fulfill all of their reliability testing needs. Whether you need preconditioning, thermal shock, pressure pot, or many other reliability testing needs, we are happy to be of service.

  • Explosion Proof UV Inspection Light

    Labino AB

    he Labino MB Hercules Ex is an extremely durable product specifically developed for use in areas where the risk of an explosion is high. Offshore Oil Rigs, Refineries, Aerospace, and Defense often require explosion proof products to ensure safety for their inspection teams. The Midbeam Hercules Ex has successfully completed extremely tough tests, including tests for thermal conditioning, Impact Tests, Drop Tests and IP tests that led to the ATEX certification (Certificate: ITS17ATEX402144X). This unique product is suitable for use in extreme weather conditions varying from 104° Fahrenheit (+ 40° Celsius) to minus 4° Fahrenheit (- 20° Celsius).

  • In-chip Monitoring Solutions

    Moortec

    Range of in-chip monitoring and embedded sensing fabrics allows for meaningful data to be captured at each stage of a chip’s lifecycle. Manufacture | Wafer Sort | Package Test | In-field | End-of-lifeDeep in-chip sensing, telemetry & analytics enablement. Highly distributed, real-time thermal analysis. Supply voltage sensing for power optimisation. Chip assessment for chip to product appropriation.

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