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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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RF Shield Box
CMW-Z10
The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
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AMO (BOST Solution)
About AMO (Application Module On-board) AMO is mounted on the Performance Board and is a module for improving the function of the tester and measuring accuracy. By modularizing the DUT peripheral circuit and measurement function, it can correspond to various applications.
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DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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DUT Resistance Tester
AllWin Instrument Science and Technology Co., Ltd.
1. This test verfies the integrity of DUT2. The resistance is measured by measuring voltage3. Current is made by distribution
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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Multichannel Source Measurement Unit
AXS844x
Run tests simultaneously on 4 channels with up to 400 V. Carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for direct testing of high-voltage RGBW LEDs
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Nonlinear Pulse-Envelope Domain
S94518B
The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
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Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
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Network Analyzer Test Setup Assistant (NTSA)
S94605B
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Device Measurement EXpert (DMX)
S94601B
Device Measurement eXpert (DMX) is a measurement configuration assistant that aides users in setting up and optimizing complex measurements for various types of devices. The customizable wizard guides users through DUT connection, measurement setup, and display. DMX provides repeatability across the workflow by automatically setting up measurements in a consistent and optimal manner.
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Regenerative Power System 1000 V, ±90 A, 30 KW, 400/480 VAC
RP7982A
The RP7982A regenerative power system is a single output, bi-directional, regenerative DC power supply with safety features to protect your people and your DUT.
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Flexible Cable Set, 2.4 Mm To 7 Mm
85135F
Achieve phase stability with these 62.9-cm cables when a DUT is connected between cable ends
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Regenerative Power System 1000 V, ±90 A, 30 KW, 400/480 VAC
RP7982A
The RP7982A regenerative power system is a single output, bi-directional, regenerative DC power supply with safety features to protect your people and your DUT.
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Test Fixturing
There are no good measurements without good test fixtures. Ideally the test fixture needs to make the electrical connection between the test instrument and the device-under-test (DUT) and be electrically transparent. ATE has developed fixtures for SMT components, leadless packages, and miniature coaxial interfaces, in such a way that the fixture effects can be removed, and the measurement reference plane can be brought right down to the DUT.
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InCal VNA Calibration
ATE has developed a revolutionary calibration and error correction methodology that can completely eliminate the need for operator intervention. This technology: Eliminates the need to attached calibration artifacts to the instruments. Allows the system to be automatically calibrated at any time without operator intervention. Permits calibration with or without the DUT connected.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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DUT Matrix 32 DUT Matrix Channels
40-530-021
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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Detector And FPA Testing
The FPA Test Set (FPATS) interface to the detectors under test (DUT’s) is via a custom pedestal plate which provides both a conductive heat path to both the individual DUT’s as well as the field of view limiting aperture plate. This custom pedestal plate protrudes through the customer provided DUT interface printed circuit board (PCB) and makes physical contact with the rear of the DUT packages and the aperture plate when the FPATS is in the closed position. The pedestal plate is mounted to the ambient source plate and its temperature is actively driven by this subsystem.
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Tunable Non-Reflective Band-Reject Filter (700MHz-1GHz)
SPCL-00597
This device is placed after the DUT to protect the Spectrum Analyzer from high-power fundamentals and provide harmonic measurements. The non-reflective functionality prevents energy from bouncing back to the DUT and raising the noise floor level.Broadband matching improves dynamic range and reducesmeasurement uncertainty.
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Hardware Platform
SmartScan 3D
SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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200 Vdc External Voltage Bias Fixture
16065A
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Ambient Temperature CalPod Module, 20 GHz
85530B
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards.
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Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Arbitrary Load Control For Modulation Distortion
S94570B
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
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Single connector for a HG cable, and two HM connectors
MVNA-8-350-2
The lower part of the Central Unit model MP-8-350-2 has a single connector for a HG cable, and two HM connectors (Fig. 9). Two Harmonic Mixers can work simultaneously, for instance HM2 detecting transmission through the DUT, and HM1, at port 3 of a directional coupler, detecting reflection from the DUT.
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Security Testing
Security/negative testing is typically conducted during development to highlight how a DUT handles abnormal conditions like very high traffic load, different frame sizes (incl. undersized and oversized frames), framed with different IFG settings, various types of errors and deviation of the signal frequency, as well as various DDoS attacks.
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Test Probe
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
