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Showing results: 91 - 105 of 233 items found.

  • Protocol Analyzer

    PGY-SSMlite SD - Prodigy Technovations Pvt. Ltd.

    PGY-SSMlite SD Protocol Analyzer is the most feature rich comprehensive Protocol Analyzer available to capture and debug SD protocol data. PGY-SSMlite Protocol Analyzer supports SD, Protocol analysis for wide data rate up to 200MHz SDR mode (UHS-I). The innovative active probe has minimum electrical loading on device under test (DUT) and allows the protocol data capture without affecting the performance DUT. PGY-SSMlite protocol analyzer allows industry first continuous streaming of protocol data from PGY-SSMlite Protocol Analyzer to host system (using USB3.0 or GbE interface). Comprehensive decoding of data, protocol tests, and error analysis enables verification of communication of SD host and device.

  • PC Based Comprehensive Test Setup for Luminaires

    SCR ELEKTRONIKS

    Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.

  • Phase Noise Analyzers

    Holzworth Instrumentation, Inc.

    Holzworth's Real Time Phase Noise Analyzers are each designed to provide data faster than any other system, while maintaining data accuracy and repeatibilty. There is no guess work as to whether results are valid to the DUT or if there are unwanted variations or contributions coming from the measurement system itself.

  • Vibration Testing

    Martin Testing Laboratories

    Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.

  • Mass Interconnect

    MAC Panel

    Mass interconnect is a way of connecting test instrumentation to a device under test (DUT).  To put it simply, mass interconnect is a very large plug and socket which connects your device under test to your test instrumentation without the mess and hassle of having to connect each signal separately.

  • Hand-In Type Electromagnetic Anechoic Box (Shield Box)

    MY3710HS - MICRONIX

    Higher shielding performance than MY371080dB. Suitable for weak electric field resistance test, out-of-service test or digital forensics for mobile phone, smart phone or tablet terminal! DUT can be operated directly with bare hands while placing it in the box and looking at the inside from the shield window.

  • Semiconductor Testing

    VX Instruments GmbH

    The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).

  • Flex Test Fixtures

    Z-Axis Europe

    FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.

  • Ground Continuity Tester - 25, 30, 35 AMP

    M25, 30, 35 - Rod-L Electronics

    Production / Quality Assurance Testing - Performs ground continuity tests in full compliance with BSI, VDE and IEC. Measures ground continuity from ground to the power cord ground pin of the DUT. Interface enables interconnection to any ROD-L Hipot & Leakage testers to form a complete automatic test system.

  • Automatic Calibration Module

    ACM4509 - Copper Mountain Technologies

    ACM4509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full four-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.

  • Automatic Calibration Module

    ACM2509 - Copper Mountain Technologies

    ACM2509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full two-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to seven connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.

  • Automatic Calibration Module

    ACM2520 - Copper Mountain Technologies

    ACM2520 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 20 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full 2-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.

  • Sound Harmonics and Current Analyzer

    H74050100 - 6TL Engineering

    This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.

  • Functional Test Fixtures

    Bloomy Controls, Inc.

    Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.

  • Characterization Platform

    Accel-RF Corporation

    This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.

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