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Showing results: 4786 - 4800 of 5310 items found.

  • Torque Control System

    SD-Series - Mountz Inc.

    The unit is a versatile torque and automation control system engineered for precision accuracy and repeatable torque control. The unit delivers cost savings and quality benefit through useful features such as digital adjustable torque setting, variable torque and speed control, multiple I/O options for integration with PLC and other line control techniques. A Windows based software package that can customize each fastening applications is included with the product. The tool features built-in error proofing data and screw counter. Multiple fastening strategies can be implemented for sensitive or of difficult assembly joints. The tool increases productivity as one tool can be programmed to do the job of multiple conventional tools, saving time, maintenance cost, space and training.

  • Wireless In-Circuit Test Fixtures

    Circuit Check, Inc.

    Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.

  • Probe Card

    VC43™/VC43EAF™ - Celadon

    VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.

  • Residual Quality Control

    Hill Engineering, LLC

    Hill Engineering's expertise in residual stress and material performance provides us with a unique opportunity to effectively design and manage production quality programs. For example, a quality system for residual stress in aluminum forgings would provide the means to control, monitor, and certify the residual stress. In general, the quality system seeks to identify key metrics in the manufacturing process, establish a testing protocol for these metrics to qualify the manufacturing process, and then perform either lot-release and/or surveillance testing to demonstrate process stability over time. Process simulation may be used to identify locations for quality control measurements and portable measurement technology like hole drilling may be used to perform quality control measurements inside of a manufacturing facility.

  • Fiber Optic Navigation Systems

    SATURN - Teledyne Marine TSS

    SATURN, from Teldyne TSS, is a world leading marine navigation system for surface applications. Built on TSS core fibre optic gyro technology giving unparalleled attitude and heading reference system (AHRS) performance. SATURN offers a fast alignment time of only 10 minutes, from switch-on.It has been designed to address a market need for cost-effective products with competitive specifications for surface use including survey vessels, workboats and commercial shipping vessels. Based on proven FOG technology, and with no moving parts, SATURN is maintenance-free with high MTBF. It is available in three standard heading accuracy variants; 0.1° sec lat (SATURN10), 0.3° sec lat (SATURN30) and 0.5° sec lat (SATURN50).

  • ZIPLEVEL EZDepth

    Technidea Corporation

    The revolutionary ZIPLEVEL EZDepth is an inexpensive alternative to costly cab based digital depth instruments. EZDepth is built from the core of the quarter century proven ZIPLEVEL PRO-2000…the world’s only pressurized, bubble free High Precision Altimeter. Unlike conventional technologies, EZDepth installs in minutes to directly display depths over unlimited ranges without line-of-sight, satellite horizons or complex arrays of inclinometer sensors. Its optional ZIPLEVEL SmartLink sends data to smart devices on your panel or up to 100’ away for real time profiles and tables or elevations plotted on site photos (Pat. Pend. ZIPLOT) for instant sharing of documentation before, during and at the end of your project.

  • Automatic Transformer Observation System

    ATOS - Raytech AG

    Raytech – The World leader in design and manufacturing of high-quality precision measuring instruments and systems, offering flexibility and versatility. Our modular Automatic Transformer Observation System (ATOS) allow you to create a unique and custom solution for any application. ATOS is designed to drastically reduce measuring time and increase test performance, without losing accuracy compared to individual test instruments. With the choice of up to three Multiplexers (primary, secondary, and tertiary), three Winding Resistance Meters, each with three maximum current range options (up to 15A, 50A, or 100A), Turns Ratio, and Integrated power security and safety panel (ISU R), Raytech can create a system with your needs and budget in mind.

  • Auto Macro Wafer Defect Inspection

    EagleView - Microtronic, Inc.

    EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.

  • EasyView™ Light Meter with Memory

    Extech EA33 - Extech Instruments Corporation

    This compact and ruggedly designed meter has a wide measurement range to 99,990 Foot Candles in 5 ranges and 999,990 Lux in 5 ranges with 0.001Fc/0.01Lux resolution. Features include: Store and Recall up to 50 measurements with relative or real time clock stamp, Luminous intensity (candela) calculation, a ripple function that excludes stray light from the primary light source measurement, Multi-point average function, Timed Hold, Relative measurement in absolute value or % deviation, Comparator function with high/low alarms, and Auto Power Off with disable. Complete with built-in stand, light sensor and protective cover with 36” (0.9m) coiled cable, protective holster, 6 AAA batteries, and carrying case.

  • USB DAQ

    ADLINK Technology Inc.

    ADLINK USB DAQ modules leverage the expertise of ADLINK's analog design capability, enhancing convenience of data acquisition. Simply plug the ADLINK USB DAQ into a USB port on your computer or notebook for performance equaling or even exceeding that of ADLINK PCI/PCIe DAQ cards, with no need to power down or open the chassis. As well as providing basic voltage measurement, ADLINK USB DAQ modules feature built-in signal conditioning to directly receive measurement from most commonly used sensors, with no need for extra signal processing. From basic testing to high-accuracy measurement, from portable application to industrial automation, the ADLINK USB DAQ series delivers easy, efficient, and accurate measurement every time.

  • Trace Moisture Analyzer

    Model ​8800A - Teledyne Analytical Instruments

    The 8800 series uses field proven aluminum oxide (Al2O3) sensing technology to accurately detect trace moisture on either a continuous or spot checking basis. All Al2O3 sensors share the same basic operating principle: the capacitance measured between the sensor’s aluminum core and gold film deposited on the oxide layer varies with the water content. The 8800 series moisture sensor employs unique Hyper Thin Film (HTF) technology, which offers three major structural improvements in Al2O3 sensor design. These structural changes, noted below, provide the user with increased sensitivity, greater stability and a quicker response time when compared to other conventional aluminum oxide sensors on the market today.

  • Trace Moisture Analyzer

    Model ​8800B - Teledyne Analytical Instruments

    The 8800 series uses field proven aluminum oxide (Al2O3) sensing technology to accurately detect trace moisture on either a continuous or spot checking basis. All Al2O3 sensors share the same basic operating principle: the capacitance measured between the sensor’s aluminum core and gold film deposited on the oxide layer varies with the water content. The 8800 series moisture sensor employs unique Hyper Thin Film (HTF) technology, which offers three major structural improvements in Al2O3 sensor design. These structural changes, noted below, provide the user with increased sensitivity, greater stability and a quicker response time when compared to other conventional aluminum oxide sensors on the market today.

  • High End Portable Laser Power/Energy Meter

    Centauri Single Channel P/N7Z01700 - mks Ophir

    *Compatible with all standard Ophir Thermal, BeamTrack, Pyroelectric and Photodiode sensors*Large 7" Full Color Touch Display*Multilingual interface – English, French, Spanish, Italian, German, Russian, Japanese, Chinese and Korean*Single and Dual Channel models available*Various Displays: Bargraph, Analog Needle, Line Plot, Pulse Chart, Pass/Fail, Position, Stability, and Real Time Statistics*Dual Channel Instrument supports Split and Merged Graphical Displays*Sophisticated power and energy logging, including logging every pulse at up to 25000Hz with Pyro sensors*Math functions: Density, Scale Factor, Normalize against base line, etc. Functions can be mixed together, displayed graphically, and can also be logged

  • Current Protection Relay

    Mors Smitt Group

    The main earth fault protection relays in distributions systems, power stations & large manufacturing / processing plants can fail to detect a high impedance break down to earth causing hazard to human life & potential damage to plant & equipment. In these & other situations demanding extra sensitive earth fault protection, using solid state techniques, can be applied to detect earth currents down to 0.5% of the CT nominal current.The relay is tuned to reject 3rd & higher harmonic frequencies to avoid problems under quiescent conditions. An adjustable time delay is built in to provide stability during switching & other transient disturbances & to allow adequate grading with other protection systems at high fault current levels.

  • C Series Strain/Bridge Input Module

    NI

    The C Series Strain/Bridge Input Module works with higher-channel-count, dynamic strain measurement systems. Modules can acquire measurements from up to eight channels, with compatibility options for quarter-, half-, and full-bridge sensors. The C Series Strain/Bridge Input Module is ideal for application channels requiring measurements at particular times, such as impact tests. It includes built-in voltage excitation, as well as transient isolation for high-common-mode noise rejection and improved safety.The C Series Strain/Bridge Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.

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