Showing results: 76 - 90 of 122 items found.
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Amida Technology, Inc.
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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AFJ Instruments
Through different ways of coupling between luminaries and humans, a level of exposure of a person to electromagnetic fields can be derived. One part of the exposure is based on capacitive coupling between lighting equipment and person. This creates induced internal electric field that must be evaluated using an EMI receiver and a Van Der Hoofden test head.
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ShibaSoku Co., Ltd.
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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esmo AG
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Fieldpiece Instruments, Inc
A classic style multimeter with True RMS and phase rotation. This manual ranger covers the electrical parameters you need for HVACR and, with detachable test leads, works with our accessory heads to test non-electrical parameters too. The LT16A meter measures current, resistance, voltage, capacitance, frequency, continuity and more. Test leads store in the meter body along with the tilt stand and magnetic hanger. The body is constructed of durable ABS plastic and a blue backlight makes the large LCD even more visible.
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LPCE-2(LMS-8000) -
Lisun Electronics Inc.
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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SIFT -
FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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Model 3800 -
Jinan Testing Equipment IE Corporation
The main body of this unique extensometer remains stationary during testing, held in position by the adjustable magnetic base included. Only the very light, small traveling heads move as the sample elongates during a test. These attach to the sample with small spring clips. Each head pulls a cord out from the extensometer as the head moves. These models use high precision, low friction potentiometers, and, as a result, have a wide range of factory selectable outputs. The extensometer is driven by an excitation voltage and has output proportional to the input. They can be provided with high level outputs (approximately 2-8 VDC) or ones that mimic strain gaged devices (2-4 mV/V). When set to mimic strain gaged extensometers, the Model 3800 can be used with virtually any signal conditioning electronics designed for strain gaged sensors. The potentiometers employ a hybrid wire wound around conductive plastic, which provides excellent long term stability. The output from the extensometer is readily interfaced with most existing test controllers, and may be directly input to data acquisition systems and chart recorders. Please let us know at the time of order what type of output and connector you require.
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T5230 -
Advantest Corp.
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Vertical Space -
SV Probe, Inc.
With our TrioTM vertical and LogicTouchTM fine pitch vertical technologies an interconnect, otherwise known as a space transformer (ST), is used between the printed circuit board and the probe head, transferring the test signal. SV TCL provides a variety of space transformers, each with its own specific benefits and applications. SV TCL offers a number of space transformer options including:
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TF164B -
TESTEX Testing Equipment Systems Ltd.
Our Air Permeability Tester determines the resistance of fabrics (woven, knitted and non-woven textile materials) to the passage of air (air flow) under constant pre-set air pressure while firmly clamped in the test rig of selected test head/area.The specimen is loaded to the test area of the instrument easily by means of a pneumatic holder. By pressing down the holder to start the test. The air permeability tester is equipped with a vacuum pump to draw air through an automatic interchangeable test head with a circular opening. The pre-selected test pressure is automatically maintained, and after a few seconds the air permeability of the test specimen is digitally displayed in the pre-selected unit of measure on the touch panel after test the holder is released and the vacuum pump is shut off.
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DRK8620 -
Shandong Drick Instruments Co., Ltd.
WSC-S Colorimeter measurement is a superior performance, versatile and convenient operation colorimeter,suitable for the determination of various objects reflection color, whiteness test, chromaticity and color object with two objects. It is equipped with a geometry test head, that the provisions of CIE 0 / d. WSC-S Colorimeter measurement with two portable desktop, digital display, and available for print. The instrument can be widely used in textiles, dyes, printing and dyeing, paper, building materials, ceramics, food, printing, metrology and other departments.
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GATS-3200 -
W.M. Hague Company
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
