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Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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Manikins for realistic simulation of the acoustic properties of a human
Head & Torso Simulators
If you need to carry out realistic in-situ measurements of headphones, telephones or hearing aids, you need a Head and Torso Simulator such as the B&K ‘HATS’ – Type 4128D or GRAS’ Kemar to complete your test setup. These manikins have built-in ear and mouth simulators that provide a realistic reproduction of the acoustic properties of an average adult human head and torso. They are commonly used for tests on telephone handsets, headsets, audio conference devices, microphones, headphones, hearing aids and hearing protectors. Please contact your sales engineer or email sales@listeninc.com for more information.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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Hydrostatic Head Tester
TF163
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics, and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area.
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Inspection Instrument for Indicators
i-Checker
The i-Checker is specially designed to calibrate measuring accuracy of dial indicators, dial test indicators, and other electronic comparison gage heads with a stroke of up to 100mm (4").±(0.2+L/100)µm indication accuracy. Directly inspects an indicator with a stroke of up to 100mm (4"). The dial test indicator, bore gage and lever-type inductive head can be inspected with optional accessories. Adjustment of the measurement position is very easily accomplished because of semi-automatic measurement and full automatic measurement functions. Creates and prints out the simple inspection certificate. Saves inspection result as CSV file for reusable inspection result by any kind of software.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Rockwell Hardness Tester
Versitron® Series
Newage Testing Instruments, Inc.
The Versitron Rockwell hardness testing system is the industry workhorse of hardness testing - designed to meet the toughest challenges: clamp large parts, operate in poor environments, and test high volumes - all with less service problems and less operator skill requirements. Available with 2 different test stands types (in a range of sizes) and 2 test heads and also a wide range of other options.
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Welding Resistance Tester
WRT
The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
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DDR4 Pro 288-Pin DIMM Adapter
INN-8686-18-PRO
Your best option if you need to test a large volume of memory! The RAMCHECK LX DDR4 Pro 288-pin DIMM Adapter (p/n INN-8686-18-PRO) gives RAMCHECK LX users the power to test 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LR-DIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. It includes the DDR4 Series adapter and DDR4 Pro DIMM test head.
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AMIDA 3KS Tester
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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Human Exposure Measurements to Luminaries
Through different ways of coupling between luminaries and humans, a level of exposure of a person to electromagnetic fields can be derived. One part of the exposure is based on capacitive coupling between lighting equipment and person. This creates induced internal electric field that must be evaluated using an EMI receiver and a Van Der Hoofden test head.
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Power device test system
This system is suitable for DC testing of IGBT, IGBT module (1in1~7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Bench Meters
A classic style multimeter with True RMS and phase rotation. This manual ranger covers the electrical parameters you need for HVACR and, with detachable test leads, works with our accessory heads to test non-electrical parameters too. The LT16A meter measures current, resistance, voltage, capacitance, frequency, continuity and more. Test leads store in the meter body along with the tilt stand and magnetic hanger. The body is constructed of durable ABS plastic and a blue backlight makes the large LCD even more visible.
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Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Custom Magnetic Recording Heads
International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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High Elongation Extensometers
Model 3800
Jinan Testing Equipment IE Corporation
The main body of this unique extensometer remains stationary during testing, held in position by the adjustable magnetic base included. Only the very light, small traveling heads move as the sample elongates during a test. These attach to the sample with small spring clips. Each head pulls a cord out from the extensometer as the head moves. These models use high precision, low friction potentiometers, and, as a result, have a wide range of factory selectable outputs. The extensometer is driven by an excitation voltage and has output proportional to the input. They can be provided with high level outputs (approximately 2-8 VDC) or ones that mimic strain gaged devices (2-4 mV/V). When set to mimic strain gaged extensometers, the Model 3800 can be used with virtually any signal conditioning electronics designed for strain gaged sensors. The potentiometers employ a hybrid wire wound around conductive plastic, which provides excellent long term stability. The output from the extensometer is readily interfaced with most existing test controllers, and may be directly input to data acquisition systems and chart recorders. Please let us know at the time of order what type of output and connector you require.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Air Permeability Tester
TF164B
TESTEX Testing Equipment Systems Ltd.
Our Air Permeability Tester determines the resistance of fabrics (woven, knitted and non-woven textile materials) to the passage of air (air flow) under constant pre-set air pressure while firmly clamped in the test rig of selected test head/area.The specimen is loaded to the test area of the instrument easily by means of a pneumatic holder. By pressing down the holder to start the test. The air permeability tester is equipped with a vacuum pump to draw air through an automatic interchangeable test head with a circular opening. The pre-selected test pressure is automatically maintained, and after a few seconds the air permeability of the test specimen is digitally displayed in the pre-selected unit of measure on the touch panel after test the holder is released and the vacuum pump is shut off.
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Colorimeter Measurement
DRK8620
Shandong Drick Instruments Co., Ltd.
WSC-S Colorimeter measurement is a superior performance, versatile and convenient operation colorimeter,suitable for the determination of various objects reflection color, whiteness test, chromaticity and color object with two objects. It is equipped with a geometry test head, that the provisions of CIE 0 / d. WSC-S Colorimeter measurement with two portable desktop, digital display, and available for print. The instrument can be widely used in textiles, dyes, printing and dyeing, paper, building materials, ceramics, food, printing, metrology and other departments.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Universal Spring Impact Hammer 0.14J To 1.0J
CX-T03
Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The CX-T03 meets the testing needs of industry standards such as IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances. This impact hammer is versatile -- it can be dialed to a whole range of energy values to perform tests to many different standards. A compressed spring accelerates a hammer head to hit the sample undergoing test. The spring is released from a lock mechanism by pressing the cone-shaped top of the impact hammer against the product under test. The CX-T03 is adjustable from 0.2 Nm to 1 Nm by turning a ring on the hammer.
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Hydrostatic Head Pressure Tester
Sataton Instruments Technology CO., Ltd
Hydrostatic head pressure tester is designed to determine the resistance to water penetration of materials by hydrostatic pressure method. By measuring the opposition to the passage of water through the tested specimen, the tester is to provide standard testing conditions for operator to note the test terminal point. The tester is primarily intended for ducks, tarpaulins, tentings, waterproof materials and other materials which are used for impermeable application, such as chemical protective clothing or medical protective clothing.
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Integrating Sphere
The simpler way to measure the total luminous flux of lamps and luminaires is to use an integrating sphere photometer system. It is a device to perform spatial integration of flux optically, thus the total luminous flux can be measured with one fixed photometer head and measurement can be instant. An integrating sphere photometer is calibrated with a total luminous flux standard lamp. A test light source is measured by comparison to a standard lamp calibrated for total luminous flux.
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Bench Type Panel Meter
ED-205
Standard Electric Works Co., Ltd
● Dimension:91(L) × 103(W) × 100(D)mm● Deflection Angle : 90°● Scale Length:Approx. 65mm ● Terminal: 4mm socket captive head, suitable for wire or pin-type test lead.● Material And Color: Acrylic resin meter cover, white scale plate, plastic stand in black.● Safety Standard: IEC/EN 61010-1 CAT Ⅱ 300V EN 61326-1 EN 61000-4-2 EN 61000-4-3
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Spring Loaded Contacts
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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Optical Power and Wavelength Meter
OMM-6810B
The OMM-6810B is a power and wavelength meter capable of simultaneously measuring the optical power and wavelength of a laser source. A wide variety of measurement heads cover wavelength ranges from 350 to 1650 nm for power ranges of up to +40dBm or 10W.This meter has standard features such as logarithmic or linear display modes, auto ranging, user calibratable offset, reference measurement capability, analog output and IEEE-standard GPIB interface to make this instrument a cost effective laser diode development or production test tool.