Showing results: 196 - 210 of 594 items found.
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Salicon Nano Technology
Basic Communication Trainer System to understand Digital & Analog Modulation & Demodulation Techniques. Various functional block diagrams are provided on-board for Teaching/Training. This Trainer provideswith various Test Points to visualize the signals on Oscilloscope.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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Sparrow MTS30 -
Digitaltest GmbH
The SPARROW MTS 30 is a portable rack System that, with a size of 19'''' fits into any universal rack. The compact and flexible test System offers the possibility to run both analog and digital tests. Additionally, the SPARROW can also accommodate 4 programmable power supplies. With the available In-Circuit and Functional Test Modules most of the required testing tasks can be resolved in a simple and cost-effective manner.
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LXinstruments GmbH
VXI-based functional test system for testing implantable medical electronic products. The system is equipped with a Virginia Panel Series 90 adapter interface and can be operated standalone as well as on handling systems. Based on the previously developed matrix-based standard architecture, a large number of systems were supplied. The system function can be verified at any time via an automated self-test.
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Bloomy Controls, Inc.
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Pickering Interfaces Ltd.
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
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50-297-130 -
Pickering Interfaces Ltd.
The 50-297 PCI precision resistor provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 range is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Bloomy Controls, Inc.
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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LXinstruments GmbH
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Teradyne, Inc.
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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ATEasy -
Marvin Test Solutions, Inc.
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Data Patterns Pvt. Ltd.
Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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Z-Axis Europe
FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.
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Artiza Networks Inc.
The DuoSIM and DuoSIM-Advanced are the most scalable eNodeB test systems in the industry. From basic functional testing to complex C-RAN environment simulation, the DuoSIM line of testers makes validation and development of network equipment faster, easier, and more cost effective.