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product
PCI Precision Resistor Card 9-Channel
50-297-030
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI 9 Channel Precision Resistor Card
50-297-002
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI 6 Channel Precision Resistor Card
50-297-003
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI 18 Channel Precision Resistor Card
50-297-001
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI 9-Channel Precision Resistor Card
50-297-101
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI 3-Channel Precision Resistor Card
50-297-103
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI 4-Channel Precision Resistor Card
50-297-102
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test system for Electronic Device
PCB
The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Tecap Automated Test Suite
Control of Automated Test Equipment (ATE) for functional test and in-circuit testOperation of test facilities with adapters and PLCssemi- and fully automatic testing of electronic components and assembliesFinal Test in ProductionTest of pre-series and sample seriesStandardized test program developmentAdaptable to your own system environment (customizing) – 100% usable after installation with standard elements
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Universal Counter/Timer
2461A VXI
The Astronics Test Systems 2461A is a high performance, 2-channel, universal 200 MHz counter, a functional replacement for the obsolete Racal Instruments™ 2461 and also recommended to replace the Keysight™ E1420A/B.
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Deep And Sloped Pan Fixtures
Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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Universal Test System
LS6601A
LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Functional Test
For a functional test the WEETECH test systems simulate reality and enforce switching operations that can only be tested in an embedded condition. In doing so voltages, currents, time intervals and other measurement categories are adjusted and switching sequences are processed in a way, it would happen in reality.
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Protection Relay Testing
ARTES
Compact, powerful relay test systems for carrying out highly complex tests with ease and precision. The test systems of the ARTES product line are used to carry out functional tests on all types of protection devices, including DT/IDMT relays, distance protection relays and differential protection relays, to ensure that they function correctly. More than 20 years of experience in developing and manufacturing automatic relay test systems have gone into creating the fourth generation of ARTES test instruments.
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End to End Testing
TestOrigen Software Testing Services Pvt Ltd.
End to End Testing basically refers to the method that verifies the application is performing according to users demand. While executing the E2E test, the complete software system from beginning to end is certified. This is done after functional and system testing and is also carried out as a regression test to validate and verify any patches or changes.
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Automated Testing for SAP
Autonomous Testing℠ for SAP
Designed for your SAP environment, Panaya Test Center is an integrated end-to-end testing platform, covering the entire functional testing spectrum including Unit Testing, System Integration Testing, Regression and UAT.
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Basic Communication Trainer
Basic Communication Trainer System to understand Digital & Analog Modulation & Demodulation Techniques. Various functional block diagrams are provided on-board for Teaching/Training. This Trainer provideswith various Test Points to visualize the signals on Oscilloscope.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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Test System Software
Sparrow MTS30
The SPARROW MTS 30 is a portable rack System that, with a size of 19'''' fits into any universal rack. The compact and flexible test System offers the possibility to run both analog and digital tests. Additionally, the SPARROW can also accommodate 4 programmable power supplies. With the available In-Circuit and Functional Test Modules most of the required testing tasks can be resolved in a simple and cost-effective manner.
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Test for Pacemakers
VXI-based functional test system for testing implantable medical electronic products. The system is equipped with a Virginia Panel Series 90 adapter interface and can be operated standalone as well as on handling systems. Based on the previously developed matrix-based standard architecture, a large number of systems were supplied. The system function can be verified at any time via an automated self-test.
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GPIB (IEEE-488) Switching
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
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PCI Precision Resistor Card 4-Channel
50-297-130
The 50-297 PCI precision resistor provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 range is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Microcomputer Three-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Drive Controller Function Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Digital Test Instruments
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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Test Executive & Development Studio
ATEasy
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Redundant Strap down INS ATE Test Station
Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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Flex Test Fixtures
FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.