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Reflectometry
The science and techniques involved in using reflectometers. (www.geog.nottingham.ac.uk)
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Spectroscopic Reflectometry
Measure reflectance of flat or curved samples with smooth or rough surface.
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Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Multiple Angle Reflectometry
FilmTek 4000
Scientific Computing International
Fully-automated wafer metrology optimized for photonic integrated circuit manufacturing. Delivers unmatched measurement accuracy, with a 100x performance advantage over the best non-contact method and 10x that of the best prism coupler contact systems. Designed to enable optical component manufacturers to increase functional yield of their products, reliably and at lower cost.
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DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Optical Time Domain Reflectometry
OTDR600
The OTDR600 is an optical time domain reflectometry (OTDR) system for the measurement of attenuation and length of optical fibers. The OTDR600 is specifically designed for use in factories and laboratories where high linearity and productivity on factory spool lengths are crucial.
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Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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Electro Optical Terahertz Pulse Reflectometry
EOTPR 3000
The EOTPR 3000 system is configured with a manual probe station to meet today’s tough FA environment which requires to isolate fault location in minutes rather than hours or days, while maintaining the EOTPR’s world leading sub-5 μm fault isolation accuracy.
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Cable Length Meters
Reflect a pulse.through the cable measuring length (time domain reflectometry).
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Electrical Testers
The Fault Trapper is a new class of tester using Spread Spectrum Time Domain Reflectometry (SSTDR) to monitor energized circuits.
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Cable Testers
The CableTool uses TDR (Time Domain Reflectometry) technology to quickly identify an open or a short from 0 to 2,500 feet within a foot of the fault.
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Cable Analyzer
MM-HTDR MediaManifold
The Crestron MM-HTDR MediaManifold Cable Analyzer is a portable handheld device used to determine the length and integrity of RG6 cable runs. Using "time domain reflectometry," the MM-HTDR can measure cable lengths up to 1099 feet.
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Differential Picosecond Pulse Generators
PicoSource PG900 Series
The fast-transition pulse can stimulate a transmission path, device or network with a broad spectrum signal in a single instant. Such a pulse is very useful for many of the high-speed broadband measurements that we need to make; for instance in time-domain reflectometry, semiconductor test, gigabit interconnect and port test and in radar.
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Interactive Software
TE SERIES
The TE SERIES Interactive Software provides a powerful set of formats and charts for fast analysis, and interfaces with a simple USB. Features include smith charts, multi series plotting, difference plotting, curve smoothing, annotations, cursors, time domain reflectometry and interference spectrum scanning.
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Sludge Level Detector
SL-200B
Sludge Level Detector SL-200B measures the sludge level accurately using ultrasonic reflectometry, and supports more efficient operations, such as remote control and automation.The display section displays the sedimentation state visually and easily understandable using a color graph display. It contributes to sludge removal work.
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Laser Ellipsometers
CER – SE 500adv
* The SE 500adv combines ellipsometry and reflectometry, * Eliminates the ambiguity in layer thickness determination for transparent films, * Extends thickness measurement to 25000 nm. # Laser wavelength 632.8 nm# Spectral range of reflectivity from 450 nm to 920 nm wavelength# Spot size 80 ?m
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Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
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Benchtop Metrology Solution
FilmTek 2000 PAR-SE
Scientific Computing International
Our most advanced benchtop metrology solution, engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Fibolocator
Fibolocator is an innovative device for measuring and characterizing breaks and other backscattering-causing faults in optical fibers. Time-resolved correlation reflectometry is the principle on which the device is based. It analyzes the backscattered light like a pulse OTDR, but unlike such OTDRs, cw laser diodes are used. The requirements for the test signal and the complexity of the system are low, which leads to very low costs for OEM subsystems.
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Optical Thin-Film Metrology for Advanced Thin Films
FilmTek 6000 PAR-SE
Scientific Computing International
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x nm design node and beyond. Accommodates 200 or 300 mm wafer metrology. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques.
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TDR Concrete Cure Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Concrete Cure Monitoring provides a new approach to cure monitoring in concrete and cementitious materials [1-7]. Using an ultrafast pulse and inexpensive capacitance sensor, our TDR system follows rotation of individual chemical states of water participating in the hydration reaction. The system monitors formation of bound-water hydration products, as well as unreacted free-water to form the hydrated state.
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Guided Wave Radar Level Transmitter
2291
The 2291 Guided Wave Radar level transmitter is designed for continuous level measuring of conductive or non-conductive liquids, pulps and solids. The 2291 level gauge operates based on the well-known TDR (Time Domain Reflectometry) principle. Micropulses are sent along a probe guide at the speed of light. As soon as the impulse reaches the surface of the medium, it is reflected back to the electronic module. Level distance is directly proportional to the flight time of the impulse.
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Portable OTDR Tester
CARY-OT4000
The CA OPTRONICS CARY-OT4000 series portable optical time domain reflectometry (OTDR) is the latest FTTx optical fiber cable-based test instrument. It has light weight, elegant appearance, small size, easiness of installation and maintenance, high-capacity built-in battery. It provides multiple built-in test wavelengths and optical testing functions like visual fault locator (VFL). As a new product specially designed for FFTx network testing, it provides site technicians with the highest performance and upgrade services.
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TDR Composite Cure Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Composite Cure Monitoring [1-4] provides a new approach to cure monitoring of advanced polymer composites. Using a high-speed pulse and inexpensive microwave sensor, our TDR system follows rotation of a polar resin molecule, providing real-time information on viscosity and percent cure. Operating in the microwave frequency range, TDR Cure Monitoring provides an alternative between high-frequency fiber-optic methods and low-frequency dielectric methods, combining optical-style precision and miniaturization with electrode-based simplicity and robustness.
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High-efficiency Fiber Stretcher
PZ2
The PZ2 provides the most extensive stretch of our stretcher product family. It is a fiber wound piezoelectric element for use in a wide range of optical interferometric measurement and sensing system applications. Typical uses include open loop demodulation, sensor simulation, white-light scanning interferometry and large angle modulation of interferometric phase. The PZ2 is ideal for use in OCT [Optical Coherence Tomography] and OCDR [Optical Coherence Domain Reflectometry] applications requiring scattering or boundary definition measurements.
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TDR Structural Health Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
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OES Spectrometers
OES Spectrometers (Optical Emission Spectrometers for OEMs) optimized for SEMICON applications including plasma monitoring/end-point detection and reflectometry (with the addition of a flash lamp). The OES-Star features unmatched throughput and SNR, spectral coverage and < 1 nm resolution). Our new OES Family, OES-Star, VS70-MC and InVizU all include our latest “Multi-Communications interface” electronics (MC= EtherCAT, Ethernet, USB-2). The Invizu integrates both a linear CMOS sensor for UV-VIS and a TE-Cooled INGAAS sensor, which extends the spectral coverage to 1700 nm.
