Showing results: 2416 - 2430 of 2773 items found.
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OPS-2000 -
Hangzhou Huatai Optic Tech. Co., Ltd.
OPS-2000 Optics Protection System product series, mainly applies to optical communication field of double fiber two-way for main, light path switching equipment. It makes up from light path switching unit, optical power monitoring unit and network management terminal. In optical communication networks, OPS-2000 real-time monitor the optical power of operating fibers and spare fibers, when monitor the optical light path's optical power is lower than setting switching threshold, it will alarming prompt and switch to the spare fiber to realize the line protection of optical transmission system.
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ChipCHECK -
Gastops
Gastops specializes in advanced fluid sensing and analysis systems specifically designed and developed for critical equipment condition monitoring applications.ChipCHECK offers the fastest way of making on-site equipment maintenance decisions. It is a field deployable analyzer designed for rapid on-site identification of equipment lube oil. This automated maintenance decision-support tool employs innovative laser spectroscopic technology, which enables on-site analysis of microscopic chip debris. ChipCHECK provides the maintainers with quick, reliable, and conclusive information, including the total number of particles, and the size, shape, and specific alloy classification for each individual particle on the sample.
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AutoSIR2™ -
Gen3 Systems Limited
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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Signals & Systems India Private Limited
IRIG B TO NTP/SNTP CONVERTER – SPC-INS-1010 is a compact DIN rail mountable protocol converter unit which synchronizes and maintains the timing and frequency requirement of power and process industry equipment using IRIG-B signal obtained from GPS receiver. It provides nanosecond accuracy when external time references are not available. It has the storage facility to store the system log file. It delivers NTP, SNTP, PFC-Pulse, RS232 & RS485 outputs. The system enables configuration and monitoring through Web-based application. It supports a wide range of power supply input either 90V-260V AC/DC or 18-36VDC or 36V-72VDC.
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WIKA Alexander Wiegand SE & Co. KG
In-line ultrasonic flow meters provide accurate gas flow measurement by calculating the transit time difference ratios between ultrasonic paths into a pipe. WIKA ultrasonic flow meters are intrinsically safe (ATEX/IECEx) and approved for custody transfer (MID 2014/32/EU, OIML R137). These solutions ensure low power consumption and easy and quick installation and commissioning, and are suitable even in the most demanding applications. Sound velocity, signal-to-noise ratio and other additional measured variables are available for condition monitoring, as well as connectable pressure and temperature sensors for achieving integrated volume conversion.
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783124-02 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783124-03 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-03 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-01 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-02 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783124-01 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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785855-01 -
NI
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Optoplex Corporation
Optoplex Optical performance monitor (OPM) uses proprietary thin-film interference filter technology combined with a micro-actuator and high-speed electronics. Optical performance monitor is used to measure critical information data on optical transmission signals in DWDM networks for monitoring signal dynamics, determining system functionality, identifying performance change, and providing feedback for controlling network elements so as to optimize operational performance. In particular, Optoplex Optical performance monitor can automatically scan the C-, L- or C+L-band wavelength range and precisely measure channel wavelength and power. See the following schematic diagram for OPM working principle.
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781366-01 -
NI
2-Port PXI LIN Interface Module—The PXI‑8516 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver.The PXI‑8516 excels in applications requiring real-time, high-speed manipulation of hundreds of LIN frames and signals, such as hardware-in-the-loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move LIN frames and signals between the interface and the user program without CPU interrupts, minimize message latency, and free host processor time for processing complex models and applications.
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778572-76 -
NI
64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module —The PXI‑2576 is a multibank PXI multiplexer switch module with 16 banks of 4x1 2‑wire multiplexers. With the flexible architecture of the PXI‐2576, you can configure it in a variety of topologies that make it suitable for parallel measurement operations requiring low‐channel counts, or you can combine all multiplexer banks to form a single high‐channel‐count multiplexer featuring 64 2‑wire channels. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
