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Analysis

examine and interpret that sensed.

See Also: Analyze, Analyzers, Analytics, Data


Showing results: 2881 - 2895 of 3765 items found.

  • Embedded Engineering Solutions

    Rapita Systems Ltd.

    Our engineering solutions support the development of safety-critical embedded systems. We support systems, hardware and software engineering, software V&V including multicore timing analysis, the development of efficient automated test environments, and develop custom tools to meet verification needs.

  • X-ray Inspection Performance

    MXI Quadra 7 - Nordson Corporation

    Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.

  • Component & PCB Assembly Testing

    National Technical Systems

    The ever advancing electronics industry requires an increasing need for electronic component testing (IC testing) and component verification. The component test capabilities and component verification lab at NTS performs test and inspection to determine proper component functionality, verification or failure analysis (F/A).

  • Analog and Digital Front Ends

    ACQUA Front Ends - HEAD acoustics GmbH

    Measurement Front Ends (MFEs) convert the digital test signals of the communication analysis system ACQUA to the analog or digital formats required by terminal equipment, acoustic transducers, networks, network components, or system simulators, thus allowing complete tests in both transmission directions.

  • Cable/Harness Test System with Rack-Mounted Switching

    CKT1175-20 - CK Technologies, Inc.

    The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.

  • Wafer Probing Machine

    UF3000EX-e - CSE Co.,Ltd

    Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.

  • Particle Analyzers

    TEILCH

    Teilch Particle Analyzers have proven significant advantages when compared to competitors’ solutions. Innovations in light source, flow control, analog and digital signal processing, components integration and software allow Teilch to provide a state of the art system for precision particle analysis.

  • Enterprise Solution

    Proworks

    ProWorks is a multi-user process management tool. It will enable you to deploy and manage the execution of established best practices throughout your organization. All users work in an environment that allows them to share expertise and centrally access all process related documentation. Real time status is available at a glance and bottlenecks are immediately identified.  Automatic event notification and escalation reduces process execution time, minimizing lead times. Complete process history is recorded for post process analysis or data mining. ProWorks’ ability to manage and track standard processes makes it an excellent tool for supporting quality initiatives such as ISO 9000.

  • Gas Chromatography

    Shimadzu Corp.

    A gas chromatograph (GC) is an analytical instrument that measures the content of various components in a sample. The analysis performed by a gas chromatograph is called gas chromatography.Principle of gas chromatography: The sample solution injected into the instrument enters a gas stream which transports the sample into a separation tube known as the "column." (Helium or nitrogen is used as the so-called carrier gas.) The various components are separated inside the column. The detector measures the quantity of the components that exit the column. To measure a sample with an unknown concentration, a standard sample with known concentration is injected into the instrument. The standard sample peak retention time (appearance time) and area are compared to the test sample to calculate the concentration.

  • Highest Precision Pure Gas Analyzer

    iso DUAL INLET - Elementar Analysensysteme GmbH

    Dual inlet technology is the most precise, accurate and sensitive technique for carbonate and water analysis. Because of this, the iso DUAL INLET has a unique role in the paleoclimate applications where instrumental precision contributes directly to the precision of paleoclimate models. Whilst the world's climate continues to behave erratically, we must know what has happened in Earth's history before we can attempt to predict what will happen in the future. To elucidate this complicated story, the iso DUAL INLET is a valuable tool for paleoclimatologists to build a detailed picture of the past to better inform policy makers who might just be able to influence the future of our planet.

  • High-Speed LWIR Science-Grade Camera

    FLIR X6980 SLS™ - Teledyne FLIR

    The FLIR X6980 SLS is an extraordinarily fast longwave IR camera designed for scientists and engineers who need to capture high-speed imagery for accurate thermal analysis and custom radiometric measurements. This thermal imaging camera combines 640 × 512 resolution from the SLS detector with the fastest high-speed frame rates to offer the shorter snapshot speeds and wider temperature bands needed to record crisp stop motion images of high-speed events. With a four-position motorized filter wheel and support for FLIR motorized focus lenses, the X6980 SLS will provide high quality recordings, save time, and mitigate frustration in dynamic acquisition environments.

  • IR Detectors

    Opto Diode

    Opto Diode manufactures high performance infrared detectors with a wide variety of active area sizes, cooling alternatives, packaging, windows, lenses, and filters options. These detectors are ideal for gas analysis, emissions monitoring, spectroscopy, process control, flame and fire monitoring. Our A Series lead sulfide (PbS) detectors provide the highest sensitivity in the 1µm to 3µm wavelength region. Our B Series lead selenide (PbSe) detectors deliver the best overall performance in a wider spectral range from 1µm to 5µm. Our multichannel (MCDs) devices are ideal for simultaneous detection of multiple gases including CO2, CO, and other hydrocarbons.

  • Microscope Photoluminescence Spectrometer

    Flex One - ZOLIX

    Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.

  • Mineral Spectrometer

    TerraSpec 4 Hi-Res - Analytical Spectral Devices, Inc.

    Recognized as the de facto technology for mineralogical analysis, the rugged portable TerraSpec mineral spectrometers are trusted by top geologists for performing fast, precise geologic exploration. Now the upgraded TerraSpec 4 Hi-Res mineral analyzer brings new levels of efficacy to mineral exploration technology. This state-of-the-art mineral spectrometer offers enhanced performance in the SWIR 1 and 2 regions and a 6 nm resolution to help you determine the viability of mineral exploration targets faster and more precisely than ever before. These enhancements provide you with the ability to capture accurate spectral data more quickly, especially for samples with darker mineral features.

  • Protocol Analyzers

    International Test Instruments Corp.

    The Bus Analyzer, is capable of capturing and decoding real-time LS, FS and HS USB Transactions as well as OTG SRP, OTG HNP and OTG VBus events. It has unlimited capture length (only limited by the RAM in the analysis PC as the captured data is viewed), immediate display of very large recorded capture data (data is streamed in real-time into the tree view as it is captured from the link under test or from file so you will not have to wait before you can start analyzing the data) as well as a very small physical format which makes it a powerful companion in your laptop bag or in the lab.

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