Showing results: 436 - 450 of 3731 items found.
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832 Series -
Leco Corp.
LECO’s 832 series will redefine the way you determine sulfur and carbon in a wide variety of organic materials. Using extensive customer feedback and innovative engineering, our latest instrumentation takes advantage of an on-board software platform powered by a touch-screen interface, increasing usability and operational control without using valuable bench space. A high-efficiency combustion furnace, improved IR cell design, and a robust, rugged design make the 832 a valuable resource for any laboratory needing fast and accurate analysis of sulfur and/or carbon in organic materials.
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Tropel® FlatMaster® -
Corning Inc.
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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S240 -
ThinkRF
The ThinkRF S240 Real-Time Spectrum Analysis Software features a completely redesigned graphical user interface (GUI) from previous versions. Designed with the end-user in mind, the S240 keeps common setting such as Frequency, Bandwidth and Amplitude visible at all times, making it easy for the user to get the right view. All other settings and functions are available through an intuitive menu system that minimizes the number of clicks and the time it takes to find the right functions, while still keeping the view of the spectrum front and center. Customized settings can be saved and reloaded to simplify the setup of common applications and uses.
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S95011B -
Keysight Technologies
This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications. All functionality of the S95010B are included (TDR/TDT mode). In addition, the S95011B enables more detailed measurements and evaluations, such as eye-diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S95011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical calibration kits or ECal with DC option (i.e., N469xD or N4433D with Option 0DC) are recommended.
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Applied Image, Inc.
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Daqarta -
Interstellar Research
DAQARTA turns your Windows sound card into a precision laboratory instrument, loaded with advanced features. Put your sound card to work!Daqarta now allows remote control by an external program, custom reports, and custom data logging. Sample rates up to 256 kHz are supported, as well as slow input sampling (down to one sample per day or slower) while maintaining full output sample rates for simultaneous high-frequency stimulus generation. Allows slow scroll rates for chart recorder display of DC signals like temperature and pressure, and provides circuits to allow ordinary sound cards to handle DC measurements.
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NextView 4 -
BMC Messsysteme GmbH
One software for everything. NextView®4 covers the entire world of PC measurement data acquisition: displaying live data, recording measured values, analyzing your measurement applications - and much more.
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MTQ Testsolutions AG
Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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LDE Electrical Analyzer -
Cadence Design Systems
The Cadence LDE Electrical Analyzer helps designers identify, analyze, and minimize the effect of parametric issues associated with manufacturing variability to improve design performance.
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ETAP Enterprise
60364-4-41 StandardBS 7671 StandardEN 50122 StandardTN-C, TN-S, TN-C-S, TT & IT Earthing TypesElectric shock requirementsLoop impedance and current calculationTouch voltage calculation and evaluationCalculation considers resistance to ground / earthGround Fault Current Interrupter (GFCI) or Residual Current Circuit Breaker (RCCB) or Residual Current Detector (RCD) protectionReports in Crystal Reports and MS Excel
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EZ-FDTD -
EMS-PLUS
Based on the Finite-Difference Time-Domain method, EZ-FDTD brings the full power of electromagnetics to solve complex EMI/EMC real-world problems for any frequency ranges that your application demands. Eliminate guessing for critical problems. Eliminates rule of thumb uncertainty. Provides insight, confidence and solutions.
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IA44 -
Leco Corp.
The IA44 Image Analysis/Management System easily transforms raw data into valuable information that can be communicated with professional results. The combination of powerful image management capabilities and point-and-click simplicity provides a comprehensive solution for users with various levels of expertise.
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Shimadzu Corp.
High-purity gas is necessary in industries such as chemical, medical, and foods. Precisely controlled GC enables identification and quantitation of a trace amount of impurities in bulk gas. If the gas resources in a factory consist of multiple lines, a sample line selector SLS-2020 can be utilized to switch sample lines automatically, allowing a single GC to analyze all samples.
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Ametek Land
PC data acquisition software for direct logging of stack emissions measurements from Lancom 4 portable gas analysers.Overvie
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T-Scan -
Tekscan, Inc.
The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
