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- Applied Rigaku Technologies, Inc
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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Analysis
*Time & Frequency domain visualisation & analysis*Worldwide connectivity – Thin Client/Server Architecture*Interactive viewing & cursor interrogation*Mode definition & alignment*Order & mode tracking*Phase analysis with Cartesian and Polar plots*Third-octave analysis (also 1/6, 1/12, 1/24)*Rainflow and cycle-counting analysis
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Chemical Analysis + Surface Analysis
Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Destructive Physical Analysis & Failure Analysis
DPACI's component analysis laboratory performs major analytical functions, such as destructive physical analysis, failure analysis, counterfeit analysis, and material analysis on components & devices. Our destructive physical analysis techniques are performed in accordance with standards and methods used in most military and space program requirements. Solutions for difficult production problems are resolved through our failure analysis procedures.
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Signal Analysis
Wavelet Analysis
Wavelet analysis is perfect for presenting non-stationary signals, the properties of which change in time or space, and it is also a powerful tool for system dynamics analysis.
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Signal Analysis
Modal Analysis
Modal Analysis is used for analyzing pulse and transition characteristics of signals coming from the input channels of FFT spectrum analyzers and seismic stations in real time or recorded time realization view mode.
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Signal Analysis
FFT Analysis
The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Signal Analysis
Cross-Correlation Analysis
The software is used for correlation analysis of signals coming from the input channels of FFT spectrum analyzers in real time or recorded time realization view mode, as well as for viewing various correlation characteristics of signals. Correlation analysis is a set of methods based on the mathematical correlation theory and is used for detecting the correlation dependence between two random attributes or factors. For solving a number of diagnostic tasks, cross-correlation analysis of signals in two or more control points distributed across space is often used.
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Failure Analysis
Failure Analysis
Capabilities of Tandex Test Labs are extremely important to support our in-house manufacturing efforts and are also available to analyze customer component and equipment problems. Techniques and equipment utilized in providing our Destructive Physical Analysis capability are also used effectively to analyze failures, determine failure causes, and recommend corrective actions.
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Signal Analysis
CPB (Constant Percentage Bandwidth) Analysis
The program is used for transfer fractional octave (1/1, 1/3, 1/12, and 1/24 octave) spectral analysis of signals coming from the input channels of FFT spectrum analyzers (in real time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Signal Analysis
Synchronous Accumulation (Order Analysis)
Order analysis is one of the most convenient and efficient methods for diagnostics and balancing of rotating mechanisms and transmission gears. With an RPM sensor and a vibration sensor, it is possible to study the time characteristics of gear vibration signals. It is a well-known fact that a signal from a vibration sensor is affected by signals from other sources. To tune out from the disturbing signals, the synchronous signal accumulation method is used. For each shaft rotation, the RPM sensor provides a rotation mark. This signal serves as a triggering strobe for the vibration sensor signal sweeping. The obtained signal sweeps are combined. All the sources of the signals related to the shaft frequency (frequency of rotation) are accumulated and increased in the accumulator linearly proportionally to the N number of rotations. All other signals that are not correlated with the shaft frequency are accumulated proportionally to N1/2 and in case of a greater number of averagings, the useful signal exceeds the interference level.
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Signal Analysis
Harmonic Distortion Analysis
The software is used for automatic measurement of the harmonic distortion factor and voltage r.m.s. of signals coming to the input channels of FFT spectrum analyzers. Adjustment to the frequency of the main component is performed automatically. The program is based on the measurement of the voltage r.m.s. of higher components by an external or internal reference signal.
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Signal Analysis
Cross-Spectrum FFT Analysis
The program Cross narrow-band spectrum is used for evaluation of the interrelation between the signals’ parameters obtained from the two primary transducers installed at various parts of the controlled object. This program can be used for detection of noise source location, for sound absorption level evaluation and the researched object acoustic properties control, for evaluation of space-time distribution of the directional energy flux (Poynting vector), for the ground cross-section FR characteristic evaluation (Nakamura method), etc.
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Gas Analysis
QIC BioStream
A gas analysis system for continuous analysis of gases and vapours from multiple fermentation reactors with multi off gas and multi reactor dissolved gas species analysis capability. A high-performance Proteus multi-stream valve supplied with 20, 40 or 80 inlet streams is included with programmable sequence control software for analysis of multiple reactors. Streams can be allocated for either dissolved species analysis or off gas analysis.
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Gas Analysis
HPR-70
The Hiden HPR-70 compact bench-top batch inlet gas analysis system is suitable for the analysis of discrete gas samples.
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Analysis Software
The Waveform Processing Software AS-70 reads data from WAVE files and offers a wide range of functions, including graph display, level processing, frequency analysis(FFT analysis and octave band analysis), file output, and playback.
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Gas Analysis
HPR-20 EGA
The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Gas Analysis
HPR-20 R&D
The Hiden HPR-20 R&D specialist gas analysis system is a bench-top mass spectrometer for real time gas analysis of evolved gases and vapours.
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Modal Analysis
The Modal Analysis package is part of m+p Analyzer, m+p international's dynamic signal analyzer for noise & vibration measurements and analysis. It provides a complete set of tools for observing, analysing and documenting the vibrational behaviour of machines and mechanical structures. Software modules are available for classical and operational modal analysis, shaker measurements (SIMO and MIMO) as well as for ODS, SDOF and MDOF analysis. A modal model validation module is also provided.
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PAM-4 Analysis
N19306B
PLTS N19306B extends the N19301B base product to perform PAM4 eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.
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Safety Analysis
Ensure System Safety and Cybersecurity. Dramatically decrease analysis efforts with efficient application of quality, safety, reliability and cybersecurity analysis methods at the system, item, software, hardware and PCB levels.
