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Live-Cell Analysis System
Analyze your cells for days, weeks or even months as they sit stationary in the stable environment of your tissue culture incubator.
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Data View Current & Voltage Logger
DVCV
INSTANTLY record and view critical performance parameters with the Dataview Series DVCV for Current, Voltage and Watts. Monitor real time measurements, and download to your PC for further analysis.
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Moisture Analyzers
Moisture analyzers provide high-speed measurements and precise analysis on a diverse range of product samples.
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Probe Based Systems
The integration of additional measurement technology in probers enables you to flexibly expand the analysis options in the ongoing production process. With the introduction of our Automation Assistant software platform, we have therefore equipped a large number of probers with a wide variety of analysis tools.
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Image Analysis Software
Offering you a complete choice of products which include brinell pro software, caliper pro software, cast iron analysis software, hardness pro image analysis software, live measurement software and material plus software.
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Custom Optical Components and Standards
With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
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Submicron Particle Imaging
FlowCam Nano
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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Image Analysis Micrometers
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Software
CAD-to-Part Inspection
BuildIT Software & Solutions Ltd.
Enables quick and easy dimensional verification of manufactured parts and assemblies for tool building, assembly, alignment, process automation, reverse engineering and quality control. BuildIT’s advanced analysis and reporting capabilities combine measurement data from multiple sources to produce detailed graphical and textual reports that are used to quickly identify manufacturing and production trends. With both numerical and graphical feedback of real-time deviations, BuildIT allows users to position parts with micrometer accuracy for high-precision assembly and alignment applications.
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Image Analysis & Stage Micrometers
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Hematology Analyzer with Simultaneous Blood Analysis & CRP Measurement
Microsemi CRP LC-667G
World exclusive concept: Simultaneous blood analysis + CRP measurement, along with data management. - CBC+CRP results in 4 minutes (15 tests / hour)- CBC results in 1 minute (55 tests / hour)- 19 parameters- Open Tube
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Microscope Photomultiplier Photometers
HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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X-Ray Fluorescence Analyzer
MESA-50K
In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
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Benchtop Conductivity Meter
LAQUA EC2000
Water quality analysis is repeatedly performed in laboratories on a daily basis. Our compact and powerful benchtop model was developed to provide simplicity with excellent on-site usability.
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Benchtop pH/ORP Meter
LAQUA PH2000
Water quality analysis is repeatedly performed in laboratories on a daily basis. Our compact and powerful benchtop model was developed to provide simplicity with excellent on-site usability.
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Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Confocal Raman Microscope
LabRAM HR Evolution
The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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ICP-OES Spectrometers
ICP-OES spectrometers measure the concentration of elements from ppb to % using de-excitation of atoms and ions in a plasma. The robustness of our Ultima ICP spectrometers makes them ideal for applications common to mining, chemicals manufacture, salt production, wear metals in oil analysis, petrochemical, metallurgical production and precious metal refining.
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Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Raman Fiber Probes
For ultimate flexibility, fiber-coupled Raman probes offer a compact design and a rugged, robust construction for a wide range of applications. With an optional integrated camera, the user can locate a precise region of interest prior to analysis. Also available are immersion probes and non-contact optics.
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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Multi-Laser Nanoparticle Tracking Analysis (NTA)
ViewSizer 3000
Exosomes? Virus? Nanoparticle? Use multiple lasers for complete, detailed analysis of all the particles in your sample.Exosomes, viruses, and nanoparticles all have wide size distributions which defeat traditional Nanoparticle Tracking Analysis (NTA) analyzers. The ViewSizer 3000 features simultaneous measurement with three lasers to collect the most accurate distribution and concentration information over a wide range of sizes within the same sample. Where the signal from a particle is too bright and saturates the detector from one laser, the software automatically uses data from a lower power laser to ensure the most accurate size and concentration information. On the other hand, when scattering from one laser is too weak for detection, the software uses data from a higher power laser to accurately track the particle.
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UV Man Spectrometer
UV Raman (with laser wavelengths below 400nm) can be used to probe specific sample properties, and benefit from experiment properties different from typical visible Raman measurements – for example, greatly increased Raman scattering efficiency, modified laser penetration within the sample, and resonance coupling to different chemical moeities. However, UV analyses come with a number of technical challenges, that require considered instrument design to allow UV Raman to be a truly useful tool for the researcher.
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80MHz 250MS Digital Oscilloscope USB Hantek
DSO6082BE
The oscilloscope has a very wide range of time base, so that allows you to work as a logger voltage, where one measurement is made even 1 hour. Digital Oscilloscope Hantek with software that has many useful features ranging from auto measurement and ending with thespectrum analysis.
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Akrometrix Software Suite
Studio Platform
Akrometrix Studio is an advanced set of integrated software modules that work together to run all Akrometrix equipment. The Studio software suite takes users from profile creation, through warpage measurement, temperature profiling, analysis of warpage data, and reporting seamlessly. Studio software users will have nearly the same experience in working with different Akrometrix measurement technologies and different Akrometrix measurement tools.
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Flexible Vertical Gage
911
The world standard for camshaft measuring, the Adcole Model 911 is ideal for measuring pistons, pump rotors/housings, transmission shafts and any other cylindrical component. Measurement results are displayed on a touchscreen monitor and can be printed/plotted or simply uploaded electronically for historical tracking. Vertical part orientation does away with the need for sag correction, while also minimizing the gage’s footprint on the shop floor. The adjustable tailstock accommodates multiple part lengths. Parts are rotated for a full 360-degree analysis of each feature.
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Gamma-Ray Analysis Software
SODIGAM
SODIGAM is the only high-precision analytical software for scintillation spectrometers to use physically correct descriptions of background, baseline, and peakshapes as part of gamma-ray analysis. It contains many of the features normally found in programs designed for the high-precision analysis of HPGe spectra, and allows users to run samples from within the DPPMCA software.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
