Showing results: 121 - 135 of 3735 items found.
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Sensors, Inc.
Accurate measurement of gases and their concentrations is critical in many applications, and often poses a major challenge. Sensors' experience with different measurement principles, including NDIR, NDUV, and thermal conductivity, along with the ability to provide special combinations of these techniques within our products, enables us to tackle these challenges. In addition, our experience goes into every detail of our gas analyzers, ensuring reliable results, even under harsh conditions. Our skilled team of experts is happy to assist you in finding the optimized solution for your measurement requirements, with either off-the-shelf components or a customized solution.
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ST120 Quad -
Dexter Research Center, Inc.
A four-channel silicon-based thermopile in a TO-5 package. Each small active area is 1.2mm x 1.2mm . Time constant of 25ms with Nitrogen encapsulation gas. Delivers a very low Temperature Coefficient of Responsivity of -0.04%/C. This detector has a very short thermal shock response to ambient temperature change.
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10 Channel -
Dexter Research Center, Inc.
A ten-channel thin-film thermopile in a TO-8 package. Each active area is 3.16mm x 0.4mm and offers low noise voltage. Internal aperture minimizes channel-to-channel crosstalk while increasing sensitivity.
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2M Quad -
Dexter Research Center, Inc.
A four-channel thin-film thermopile in a TO-8 package. Each active area is 2mm x 2mm. Offers the world's highest 4-channel sensitivity with exceptional signal-to-noise performance in a TO-8 package. Internal aperture minimizes channel-to-channel crosstalk while increasing sensitivity.
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DR46 -
Dexter Research Center, Inc.
A two-channel or a one-channel compensated thin-film thermopile in a TO-8 package. Each active area is 4mm x 0.6mm. Offers high output with excellent signal-to-noise ratio. An internal aperture minimizes channel-to-channel crosstalk increasing sensitivity.
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ST150 Quad -
Dexter Research Center, Inc.
A four-channel silicon-based thermopile detector in a TO-8 package. Each active area size is 1.5mm x 1.5mm. Affordable four-channel design with strong output and a very low Temperature Coefficient of Responsivity of -0.04%/C. This detector has a very short thermal shock response to ambient temperature change.
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Aprotec Instrumentation Ltd
In today's demanding environment where quality assurance is an everyday requirement Aprotec have sought to find present day retrofit solutions that compliment fully functional older machinery.
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Buehler
Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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MetaDex™ -
Compact Solutions
Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Hiden LAS -
Hiden Analytical Ltd.
The Hiden LAS system is designed to analyze the leak rate from sealed packages, from a quality control or research and development perspective.
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STA/LTA Detector -
ZETLAB Company
The STA/LTA Detector program is a representation of a detector of various events in triaxial or single-component time signals. The software is based on one of the STA/LTA detector types.
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Dimension FastScan Bio -
Bruker Optics
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Dimension AFP -
Bruker Optics
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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InSight-450 3DAFM -
Bruker Optics
Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.