Showing results: 2731 - 2745 of 2798 items found.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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ACMAS Technologies Pvt. Ltd.
The rain water or moisture penetrating through a leak in the case, can often reach into the circuit board and lead to failure of the equipment. This problem is frequently encountered with external equipments and devices during storage, usage or transportation in a rainy weather. Therefore, the automotive industries and various research and developmental units often use Rain Test Chambers to test the quality and performance of the product in such extreme environments.Weiber's Rain Test Chambers are such Rain Testing Machines/Chambers used for the testing of automobiles, electronic parts and components, light equipments, voltage cabinets and other wide variety of products under a rainy environment. These IP Test Chamber and IP Testing Chambers are designed to simulate specific environmental conditions, mimicking a natural rainy weather, to test the seals and water proofing capacity of the equipment and devices, thereby providing an estimation of the product performance over a period of time.
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ACMAS Technologies Pvt. Ltd.
Xenon is one of the noble gases and is a major component of arc lamps and flash lamp and it also has its importance in general anesthetics. One of the major applications of xenon lamp is that it can be used in research applications to simulate the sunlight.Weiber walk in xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. With walk in option you have a facility to test your product in bulk quantity and even for the products which are larger in size. This chamber also known as Uv Test Chamber and Xenon Lamp Weather Resistance Test Chamber.
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WDT-1 -
Lisun Electronics Inc.
This equipment is designed and manufactured according to corresponding regulation in standard IEC884-1, GB299.1-96, GB16915.1-97 and other electronic accessories relevant standard. Mainly used to test damage degree of fixed connection components lead wire of with thread clamping type and no screw terminals, so as to inspect whether it can withstand mechanical stress during normal use.Specification: • Power supply: AC220V 50Hz • Test rate: 10±2r/min (GB16915.1-97: 12 ±1r/min) • Rotating radius: 100mm • Test distance: 250~500mm adjustable • Test numbers (Number of rotating): 0~999999 any set • Mass: 0.3KG, 0.4KG, 0.7KG, 0.9KG, 1.4KG, and 2.0KG (GB16915.1-97: 30N, 40N, 50N, 60N each of 2 pcs) • Stations: 2 • Dimension: 1200×1400×400 (mm) • Remarks: The mass and rotating radius can be optional as per customer requirements.
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Teledyne Defense Electronics
As the OEM of all of our products, both end items and support equipment, Teledyne can support all repair needs for end users. Turn-around times are typically less than 90 days with units being returned fully tested to their specific program requirements. All repairs are performed using new materials and components. Once the repair has been received, and purchase order issued, a Test and Evaluation report is sent to the end user fully describing our findings and the proposed repair.Following live ejections, Teledyne will download and prepare a post ejection report for any of our ejection seat sequencers AT NO COST to the end user. This report will document the data stored in the flash memory of the unit. The data will be a representation of what the sequencer recorded. However, Teledyne is unable to give any opinions or technical advice on the operation of the seat system.
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AE6920T -
Keysight Technologies
Unlike CAN, LIN, Automotive Ethernet demands rigorous compliance verification using test cases that cover transmitters (Tx), receivers (Rx), and harness/connector assemblies. To help you save time and effort, Keysight offers solutions that automate the testing and validation across Transmitter (Tx), Receiver (Rx), and the connections between Automotive Ethernet devices. Our engineers have invested thousands of hours in learning the standards and creating automated, repeatable compliance tests. These proven applications help you ensure proper test configuration and valid measurement results. Ultimately, you’ll have greater confidence that your device is compliant. Now available for data rates up to 10Gbps. The automotive Ethernet test solution AE6900T offers hardware and accessories to make sure you have all of the components you need to get up and running quickly.
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Arcadia Test
Board stress analysis is an increasingly critical part of the test fixture build process today. Probe densities under BGA devices put tremendous pressure onto the solder joints of these devices. If the fixture is not designed properly, immediate damage can occur to the BGA’s, or even more devastating, future damage, which creates field failures. We can provide strain testing before shipping your fixture to insure that there are not excessive forces placed on your BGA parts. With the use of National Instruments Strain equipment, and tri-directional rosettes, we cycle test the board/fixture and measure and record the amount of strain from each corner of each BGA. Any over limit conditions are corrected before shipment. This service insures that your products will not be damaged at ICT, and help to reduce field failures from damaged components, compromised solder joints, or lifted pads.
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SL1800A Series -
Keysight Technologies
Keysight's SL1800A Scienlab Regenerative DC Emulator - High-Power Series enables users to emulate the large batteries in electric vehicles. The bidirectional power flow allows emulation of both power sourcing applications, such as traction inverter test, as well as power-absorbing (sinking) applications, such as EV charging. Being regenerative, the power absorbed is delivered back to the grid, saving on energy and cooling costs. The SL1800A Series is fully integrated with the SL1040A Scienlab Charging Discovery System. The SL1093A Scienlab Charging Discover Software fully automates DC charging applications to many different test standards. With bi-directionality, integrated DC voltage and current controllers, high dynamics, and its regenerative energy feedback capacity, the Scienlab Dynamic DC Emulator provides an all-in-one system for efficient and effective testing of the power electronic components in electric vehicles (EV) and electric vehicle supply equipment (EVSE).
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HR9100T -
HighReach Measuring & Controlling System Co.,Ltd
1. The circuit design selects high-quality power module components from the power supply part to select high-stability and reliable devices, which can completely replace the same type of imported instruments. 2. The patented sonic intelligent technology software can perform intelligent echo analysis the debugging and the any OTHER Special the without Steps. This Technology has Dynamic Thinking at The Functions of the Analysis and Dynamic. 3. Sound Wave at The Patented Technology of Our Company Makes at The Accuracy of at The Instrument Greatly Improved, at The Precision Liquid Level Reaches 0.25%, and IT CAN Resist various kinds of interference waves.4. This instrument is a kind of non-contact instrument, which does not directly contact with liquid., the instrument has a variety of installation methods. The user can use this manual to calibrate the instrument. 5. All input and output lines Of the instrument have lightning protection and short circuit protection.
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BVM-5006 -
BYC Industrial Ltd
BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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CoreAFM -
Nanosurf
The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and acoustic shielding in a single all-in-one unit results in a complete AFM system with an unparalleled compact footprint. The system comes with a fully digital 24-bit controller developed specifically for the CoreAFM scanhead. All the essential functions of modern AFM are integral components of the CoreAFM system; all you need to do to take the CoreAFM into operation is connect the controller, and plug in power and USB.State of the art electronics with 24-bit ADC and DAC ensure high-resolution XYZ driving of the 100×100×12 µm scanner and allow for low-noise force detection limited only by the cantilever. Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended
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TLP-3010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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TLP-4010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Circuit Check, Inc.
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Analog Devices Inc.
SPI (Serial peripheral interface) is one of the most widely used interfaces between microcontrollers and peripheral ICs such as sensors, ADCs, DACs, shift registers, SRAM, and others. Analog Devices has your isolated SPI bus covered with our dedicated SPI digital isolators which support this synchronous, full duplex master-slave-based interface. Options include devices built with ADI's proven iCoupler® technology and offering a small footprint, simple design-in, fast speeds, and high data integrity, as well as integrated µModules which require no external components. Our SPI isolator solutions increase performance and reduce board space. This simple, compact solution is ideal for isolated SPI data requiring communication across different ground potentials or through large common mode transients often found in Industrial PLCs (programmable logic controllers) and Instrumentation and data acquisition systems.
