Showing results: 6436 - 6450 of 9105 items found.
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2580 Series -
Instron
Instron® load cells are a key part of a materials testing system. Instron is the only global materials testing supplier that designs and manufactures its own load cells. This ensures that Instron load cells meet the unique requirements of materials testing such as; high accuracy over a wide measurement range, high stiffness, resistance to offset loads, accurate alignment and excellent zero stability. The 2580-xxxN Series load cells are specifically designed for use with 5900 testing systems; offering exceptional performance with the ability to measure forces as low as 1/1000th of the force capacity to an accuracy of 0.5% of reading.The load cells can withstand loads up to 150% of their force capacity without damage and 300% without mechanical failure. Automatic transducer recognition and electrical calibration, makes them easy to use. The load cells allow the user to zero out the tare weight of a grip or fixture that weighs up to 10% of the force capacity, while still maintaining the full specified accuracy.
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BC8-55/150C -
Bemco Inc.
When combined with a thermal conditioner such as the Bemco PCL3L-III or PCL3M-III, this shroud converts a 24 inch inside diameter by 30 inch high vacuum only vertical bell jar into a 19 inch inside diameter by 20 inch high thermal vacuum testing system. With a convenient clam shell door, test objects are easily loaded by simply raising the bell jar above the top of the door opening.
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KoCoS Messtechnik AG
ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
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5800 Series -
Pacific Instruments, Inc.
Series 5800 is a transient recording system for explosive and other high speed recording applications like shock & vibration testing. Each measurement channel includes high bandwidth signal conditioning, digitizing rates up to 10MS/s and recording to onboard memory. Series 5800 can be used in laboratory or harsh physical environments and includes turnkey application software. A system consists of an Enclosure, I/O Module and Software.
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F Series -
EMIC Corporation
Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
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TTTech Computertechnik AG
TTESync is a synchronization component that allows tight synchronization of VxWorks 653 partitions to the fault-tolerant system-wide cycle time of the TTEthernet communication network. All partitions executed on different modules can be “pinned down” within the overall system cycle time, thus enabling the lowest latency and minimum jitter in message exchange among distributed functions. At system level this results in clean layering, well-understood functional interactions and simpler application design, testing and system integration. System architects can reduce system complexity and further optimize system size, weight, power (SWaP) and life-cycle costs.
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RS-5.4Kh -
Taylor Dynamometer, Inc.
RS-5.4Kh towing dynamometer isdesigned for testing today’s compact cars. The RS-5.4Kh is builtwith an all-aluminum frame, aerodynamic body and rides ona coil over suspension. The RS-5.4Kh uses hydraulics for powerabsorption instead of an eddy current absorber. This technologyallows the RS-5.4Kh to continuously absorb power without fadeand eliminates the need for batteries to power the system.
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Hitex GmbH
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Kiwi TCMS -
Mr. Senko
The leading open source test case management system. *Efficiently manage test cases, plans and runs*Improve testing productivity & reporting*Integrates with popular issue trackers*External API interface*GPL 2 licensed
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Just Test Cases
This is the initial phase where we collect and analyze the requirements from a testing point of view and identify the testable requirements. Our dedicated QA team may interact with various stakeholders (Client, Business Analyst, Technical Leads, System Architects etc) to understand the requirements in detail. Requirements could be either Functional (defining what the software must do) or Non-Functional defining system performance/security availability.
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TRS-1000 -
Lisun Electronics Inc.
Thermal parameter is the key index to evaluate the quality of LED. Different temperature will have significant different effects on optical parameters, color parameters, electricity parameters and life of LED. Therefore, design and control of the thermal dissipation are the most important thing for the manufacturers and users. Referring to the relative international standard, TRS-1000 could conduct integration testing on optic, color, electricity and thermal, meanwhile record the changing curve of the parameters at real time.
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V93000 SoC / Smart Scale -
Advantest Corp.
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Ektron Tek Co., Ltd.
PL-2000X Plunger Testers equipped with servo-hydraulic system to control the testing speed. Available for customers to select suitable model.
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4012 -
Barth Electronics, Inc
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Leak Testing -
TQC Ltd
TQC have supplied automatic leak test / pressure test equipment for over 25 years. The supply has included simple manually connected leak test fixtures to fully automatic, high speed production leak test facility. TQC supply leak testing equipment to meet the customers requirements.
