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Showing results: 796 - 810 of 1054 items found.

  • Components - Power Amplifiers (FPA)

    FPA Series - Farran Technology Ltd

    FPA series driver amplifiers and power amplifiers are discrete and/or MMIC pHEMT device-based amplifiers that operate over the frequency range 18 to 110 GHz for high output power applications. The amplifiers are offered in two categories, standard and custom built up to 250 GHz.The custom-built amplifiers are offered in various RF interfaces, including standard waveguide or coaxial connectors, for convenient system integration. The optional input and output integrated isolators are available to further improve the port return loss.

  • Intensified Cameras - Ultra-Sensitive CMOS Cameras from Deep UV to NIR Spectrum

    iCameras - Exosens Group

    The cameras are equipped with a high-resolution sensor with high frame rate for excellent quality of image production, which is well‐suited to detect high speed moving objects or ultra-fast phenomenon.The mechanical architecture of the iCamera is small, compact and light-weight, especially designed for easy integration into any system.The iCamera features an exceptional sensitivity based on high QE image intensifier - ultra-fast gating technology down to a few nanoseconds, which allows it to be coupled with a laser source to perform high fidelity active imaging.

  • High Accuracy Clamp Leaker

    MEWOI Electronics Co.,ltd

    Leakage Current Clamp Meter, Car Standby Current Clamp Meter, Car Inrush current Tester, Car Charge Current Tester. It is specially designed for online measurement of AC/DC leakage current, current below 600V by adopting up-to-date CT technology and digital integration technology. It is especially suitable for measure car standby current, leakage current, inrush current. It is a product with the characteristic of relatively small size, high accuracy, strong anti-interference capability and automatic shifting.

  • H/L Voltage Clamp Meters

    MEWOI Electronics Co.,ltd

    High Voltage Current Transformation Ratio Tester breaks traditional structure, specially designed for high and low voltage first and secondary loop current, variable ratio, and current leakage test; apply the latest CT technology and mask digital integration technology, composed of special high-voltage clamp, low voltage clamp, host, high voltage insulation rod and monitoring software, etc; its wireless transmission test data can penetrate multiple building obstacles with a straight-line distance of 30 meters.

  • ARINC 429 Bus Interfaces

    AIM GmbH

    AIM’s  > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.

  • Anite SAS Interoperability Testing

    Keysight Technologies

    Access advanced platform for network simulation, currently used by major Tier 1 carriers in their device acceptance programsAccelerate the introduction of new mobile devices with cost-effective, controllable, repeatable and automated lab-based testingQuickly evaluate devices in the integration, interoperability testing and carrier acceptance testing phasesConduct rigorous device testing to achieve superior experience in terms of functionality and quality of voice and data transferTest data performance under fading conditions using the internal fading capability to enable comprehensive performance testing

  • Digitizers

    2740 Family - CAEN S.p.A.

    The 2740 Digitizer is a 64-channel digital signal processor for radiation detectors available in VME64 (V2740), VME64X (VX2740), and Desktop (DT2740) form factor. It offers not only waveform digitization and recording but also Multi-Channel Analysis for nuclear spectroscopy using Silicon strip, segmented HPGe, Scintillation detector with PMTs, Wire Chambers, and others. The 2740 can perform pulse height measurements (PHA), constant fraction timing (CFD), charge integration (QDC) and pulse shape discrimination (PSD) independently for each of the 64 channels.

  • Digitizers

    2745 Family - CAEN S.p.A.

    The 2745 Digitizer is a 64-channel digital signal processor for radiation detectors available in VME64 (V2745), VME64X (VX2745), and Desktop (DT2745) form factor. It offers not only waveform digitization and recording but also Multi-Channel Analysis for nuclear spectroscopy using Silicon strip, segmented HPGe, Scintillation detector with PMTs, Wire Chambers, and others. The 2745 can perform pulse height measurements (PHA), constant fraction timing (CFD), charge integration (QDC) and pulse shape discrimination (PSD) independently for each of the 64 channels.

  • Wafer Handling Systems for Microscopy

    WL150 and WL200 - McBain Systems

    The McBain WL150 and WL200 Series Wafer Handler is a safe, semi-automatic wafer loader designed to use with virtually all major microscopes, optics and inspection devices. It is a portable, economically priced tool which serves as a direct replacement for the Irvine Optical Ultrastation systems. The WL Wafer Handler, available in two configurations to handle 3" to 6" wafers or 4" to 8" wafer sizes, is designed for easy operation, seamless integration, and consistent, reliable handling for labs and automated workstations.

  • Data Migration Testing

    TestingXperts

    Development of a Data Warehouse is a major task which is expected to yield major business benefits in respect to the justification of the cost & efforts. However, many ETL projects fail to achieve the required benefits due to improper quality assurance strategy. ETL or Data Migration Testing should ensure that the data migrated from heterogeneous sources to the data warehouse occurs without any loss of information/ data, with strict adherence to transfer rules & in compliance with validity checks. ETL Testing should be able to detect early on any problems with the source data if done effectively, any other inconsistencies or ambiguities required to guide data transformation & integration should also be detected during the early stages of ETL Testing. ETL testing should be continuous to ensure that the extraction, transformation, and load processes are working as planned and the result is consistent, accurate, and complete. We are the leading Data Migration testing company offering quality testing services to our clients.

  • High-Resolution Thermographic Camera

    Ceres T 640 Series - Xenics

    The Ceres T 640 series is based upon the Dione 640 OEM thermal imaging core with 640×480 pixels and 12 µm pixel pitch and NETD of less than 50 mK. The camera offers superior on-board thermographic performance (accuracy, stability) in the temperature range up to 400 °C.The Ceres T 640 camera outputs full frame images at 60 Hz via either a CameraLink or GigE Vision interface – all GenICam compliant.The compact size and excellent thermographic stability and accuracy, and GenICam compliant interfacing allow for easy integration in demanding industrial thermography applications.The camera offers one standard option of lens and thermal calibration pack.The compact Ceres T 640 series find application in process monitoring, medical and scientific and advanced research.Benefits & Features• Compact size and high-performance• Superior on-board thermographic performance (stability, accuracy)• GenICam compliant• Uncooled operation

  • Functional Testing

    A1QA

    Interface Testingevaluation of correct system module interaction Smoke Testinginitial testing process to check whether software is ready for further testingSystem Testingconducted on a complete, integrated system to evaluate the system's compliance with its specified requirements Integration Testingperformed to test units of code to verify interaction between various software components and detect interface defectsRegression Testingtesting to ensure changes made are not impacting previously working functionality Acceptance Testingperformed to make sure the software handles required tasks in real-world scenarios, according to specifications

  • Phase Locked Loop with Integrated VCO

    Analog Devices Inc.

    PLL with integrated VCOs provide local oscillator sources and clock sources for communications (COMMS) , test and measurement (ETM) and aerospace/defense (ADEF) applications. ADI's PLLs with integrated VCO portfolio includes both narrowband and wideband parts, supporting frequencies up to 13.6GHz. Our PLLs with integrated VCO, as well as our full PLL portfolio including integer-N and fractional-N PLLs, feature best-in-class performance for phase noise, jitter, and spurious, and also feature high levels of integration in small form factor packages.

  • Static Image Analysis System Particle Size

    PSA300 - HORIBA, Ltd.

    The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.

  • Time Domain Reflectometer

    IRG 2000 - BAUR Prüf- und Messtechnik GmbH

    Cable fault location with the BAUR IRG 2000. The IRG 2000 impulse reflection measurement unit or time domain reflectometer is a handy, easy to carry device for single-phase cable fault pre-location. It is used in combination with a surge voltage generator on low-, medium- and high-voltage cables 0 - 65 km in length. It can also be used on live cables carrying voltage up to 400 V.* Easy and quick cable fault location* Light, compact and manageable* Main unit for the tried-and-tested pre-location method* Ideal for integration in measurement systems

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