Showing results: 256 - 270 of 476 items found.
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LiFli -
Fauser Elektrotechnik
The LiFli light flicker meter enables fast evaluation of light sources on the flickering part (flicker / flicker). Especially in the case of LED lamps, the flicker portion can be determined only by one measurement, since it is in the range of 0% to 100% for these luminous means.Audio features enable the flicker to be reproduced acoustically. A voltage output for further analysis by means of oscilloscope or voltage analyzer is available.
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CA3201 -
UC Instruments, Corp.
UC INSTRUMENTS CA3201 12/24 CH INSERTION LOSS/RETURN LOSS AUTOMATIC TESTING SYSTEM is special designed for MPO/MTP fiber cable and multi-channel fiber optical devices like PLC device. It also can be easy changed into AWG DWDM devices testing system ifwe change 1310 /1550 nm light source into UC INSTRUMENTS’ tunable laser source.
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Edmund Optics Inc.
Detectors are used to measure the illumination of a light source for a number of optical or spectrometry applications. Detectors consist of arrays of photodiodes or photodetectors that transmit electrical current when excited by collision from photons. Detectors enable the measurement of important light characteristics that are not conveniently acquired in other ways. A selection of photodiodes is also available with linked amplifier capabilities for easier, more precise measurement capacities.Detectors
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SystematIC
SystematIC offers a well-researched family of products that combines Ambient Light Sensing (ALS) and Infra-Red Proximity Sensing (PS) in a single SoC.The Ambient Light Sensors work well with all kinds of light sources from natural sunlight to fluorescent and incandescent lamps with minimum detectable light of .001 lux. An ambient light rejection algortihm allows the IR Proximity Sensing operation in a wide range of ambient light conditions and even in the presence of large amounts of IR radiation.Robust, temperature resilient, highly versatile sensor products are developed, ideal for improving the user experience by enhancing the screen interface with the ability to measure distance in real time and the ability to respond to ambient lighting conditions to control display backlight intensity in Smartphones.Other applications may be found in Presence Detection in Industrial or Automotive environments.
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FPM100 Series -
Shanghai Tarluz Telecom Tech Co., LTD
FPM100 is an economical optical power meter designed by TARLUZ, especially for field engineer for installing and maintaining fiber optic network. It could work with FLS100 Series Optical Light Source to test insertion loss of optical network.
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OptCom Company, Ltd
This system enables the total luminous flux measurement of luminous intensity distribution 2 and 4 light sources based on the measurement standards of LED lightings LM-78 and LM-79 approved by IESNA (Illuminating Engineering society of North America) .
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PSGA-101 -
General Photonics Corp.
The PSGA polarization measurement system is the most accurate product on the market for analyzing PMD, PDL and other polarization related properties of light sources and optical materials. The patented design utilizes magneto-optic crystals for high accuracy and repeatability.
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DRK8064-4 -
Shandong Drick Instruments Co., Ltd.
By visual sight, manual measurement method, easy to use.Measurement mode: optical rotationLight sources: Sodium Light + filters, wavelength 589.44nmMeasuring range: + 180 °Dial cell value: 1 °Dial vernier reading value: 0.05 °
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Edmund Optics Inc.
Through the photovoltaic effect, detectors provide a means of transforming light energy to an electrical current. The root of the theory behind this phenomenon is a small energy gap between the valence and conduction bands of the detector. When light, with enough energy to excite an electron from the valence to the conduction band, is incident upon the detector, the resulting accumulation of charge leads to a flow of current in an external circuit. Since light is not the only source of energy that can excite an electron, detectors will have some amount of current that is not representative of incident light. For example, fluctuations in thermal energy can easily be mistaken for light intensity changes. A variety of these "non-light" contributions are present and, when summed up, make up the total noise within the detector.
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SEEPOS -
SiTek Electro Optics AB
For most position measurement applications the SiTek SEEPOS system offers a complete and easy-to-use solution. High speed PSD electronics combined with digital signal processing and high speed USB data transfer gives a powerful measurement system. With its large dynamic range it can handle light powers from nW to mW from DC light sources as well as modulated light sources. All parameters, such as PSD bias voltage, amplifier gain, the use of analog and digital filters etc., are easily controlled from the included software and light spot position is continuously displayed both in XY and X-t, Y-t graphs. Optimized plot algorithms ensure that all data is visually seen on the screen even in full speed measurements. Included tools for data analysis and visualization simplify rapid scan through large data sets in order to find specific parts of interest.
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Hangzhou Hopoo Optoelectronics Technology Co., Ltd
This system uses the method of fixing the detector and rotating the lamp under test to measure the light intensity distribution of the light source or lamp under test in all directions in the space. The main shaft and the lamp shaft adopt the conductive slip ring with precious metal fiber point brush structure, which can run 360 degrees continuously without backlash for measurement. There is no need to rotate back and forth to prevent winding and never winding. According to the requirements of the measuring lamps, the system can be configured as a double-column B-β test scheme or a single-column C-γ test scheme. Used for LED lamps (semiconductor lighting), road lamps, floodlights, indoor lamps, outdoor lamps, etc. and LED, energy-saving lamps, fluorescent lamps, incandescent lamps, HID lamps and other light sources of spatial luminosity distribution
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LVD2 -
Fluke Corporation
LVD2 volt light, offered by Fluke combines a non-contact AC voltage detector and LED flashlight into one easy to use pen-style design. It features dual sensitivity detection, turning blue from 1” to 5” (2.54 cm to 12.7 cm) from the source and red when at the source. The LVD2 is a CAT IV 600 V rated and is suitable for commercial and industrial applications.
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HU-200TB-EH -
HORIBA, Ltd.
HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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pE-300lite -
CoolLED Ltd.
CoolLED's pE-300liteis a simple white light LED illumination system that offers intense, broad-spectrum LED illumination for imaging most common fluorescent stains. The pE-300lite Light Source can be fitted directly to the microscope or specified with a liquid light guide. The system is a mercury-free alternative that is safer, more controllable, and repeatable than conventional high-pressure gas discharge illuminators. Spectral coverage is from the UV (DAPI excitation) to the Red region (Cy5 excitation). The system is perfect for hospital and regular research laboratory environments and is affordable within consumables budgets.
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VUVAS-10X -
McPherson, Inc.
A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
