Showing results: 856 - 870 of 1312 items found.
-
782621-13 -
NI
PXIe, 500 MHz, 2.5 GS/s, 10-Bit PXI Oscilloscope—The PXIe-5160 high-speed oscilloscope device has two or four channels that sample at up to 2.5 GS/s with flexible settings for coupling, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 500 MHz of analog bandwidth and flexible measurement configurations.
-
MS 1821 -
Meltronics Systemtech
*Bus Interface:- 32 Bit PCI Bus with PMC Interface*Speed of operation up to 66MHz*Spartan-3AN FPGA based design*32 channel single ended analog Output*Unipolar or bipolar voltage output*Programmable output voltage: 0-5V, 0-10V, 0-10.8V, ±5V, ±10V, ±10.8V and is capable of driving up to +/-20mA*16 bit Resolution*Conversion time 10usec typ*Over current protection*Driver interface for Windows2000/XP/VISTA and LINUX OS*Self Test future
-
782622-06 -
NI
PXIe, 1.5 GHz, 5 GS/s, 10-Bit PXI Oscilloscope—The PXIe-5162 high-speed oscilloscope device has two or four channels that sample at up to 5 GS/s with flexible settings for coupling, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1.5 GHz of analog bandwidth and flexible measurement configurations.
-
782621-01 -
NI
PXIe, 500 MHz, 2.5 GS/s, 10-Bit PXI Oscilloscope—The PXIe-5160 high-speed oscilloscope device has two or four channels that sample at up to 2.5 GS/s with flexible settings for coupling, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 500 MHz of analog bandwidth and flexible measurement configurations.
-
782622-15 -
NI
PXIe, 1.5 GHz, 5 GS/s, 10-Bit PXI Oscilloscope—The PXIe-5162 high-speed oscilloscope device has two or four channels that sample at up to 5 GS/s with flexible settings for coupling, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1.5 GHz of analog bandwidth and flexible measurement configurations.
-
779745-01 -
NI
125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device—The PCI‑5114 low-cost oscilloscope device has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth.
-
779745-02 -
NI
125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device—The PCI‑5114 low-cost oscilloscope device has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth.
-
779745-03 -
NI
125 MHz Bandwidth, 2-Channel, 8-Bit PCI Oscilloscope Device—The PCI‑5114 low-cost oscilloscope device has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth.
-
PCI-4pack-2 -
ALPHI Technology Corporation
The PCI-4pack module provides a high performance flexible I/O scheme, that supports industry standard Industry PacksÔ. For application requiring low cost, high density I/O or unique combinations, the PCI-4pack is the perfect solution. The Local DSP can be used to simply move data to and from the CPCI bus or provide pre processing functions such as local PID controls, FFT’s, digital filtering, etc.Custom application software can be downloaded to the DSP via the PCI bus. Windows 95 and WinNT drivers are standard.
-
PCI-4IPM -
ALPHI Technology Corporation
The PCI-4IPM module provides a high performance flexible I/O scheme, that supports industry standard Industry PacksÔ. For application requiring low cost, high density I/O or unique combinations, the PCI-4IPM is the perfect solution.The Local DSP can be used to simply move data to and from the CPCI bus or provide pre processing functions such as local PID controls, FFT’s, digital filtering, etc. Custom application software can be downloaded to the DSP via thePCI bus. WinNT drivers are standard.
-
SignalCore, Inc.
SignalCore offers traditional multi-stage and single-stage RF upconverters, and Direct IQ modulators that feature low phase noise, high dynamic range, wide bandwidth, and continuous tuning. SignalCore RF upconverters are compact and built for mechanical robustness and ruggedness. Applications include various test and measurement applications such as those in point-to-point radio, wireless communication, ATE, and software-defined radio. All products are provided with a Graphical User Interface (GUI), driver, and API for easy programming control.
-
LXinstruments GmbH
LXinstruments has many years’ experience in using both the TestStand test sequencer by National Instruments and TestExec SL by Keysight Technologies.The use of test sequencers for functional testing is crucial in order to increase productivity during the implementation and maintenance of the test software. Test sequencers make it possible to decouple the actual product-specific test sequences from infrastructure components like e. g. user interface, data storage, process interfaces and driver libraries. This ensures easy reusability of the implemented software components.
-
779945-02 -
NI
300 MHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device—The PCI‑5152 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 300 MHz of analog bandwidth and flexible measurement configurations.
-
779171-01 -
NI
150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device—The PCI-5124 high-resolution oscilloscope device has two channels that sample up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth.
-
780320-01 -
NI
1 GHz Bandwidth, 2 GS/s, 8-Bit PCI Oscilloscope Device - The PCI‑5154 high-speed oscilloscope device has two channels that sample up to 2 GS/s with flexible settings for coupling, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 1 GHz of analog bandwidth and flexible measurement configurations.