Showing results: 196 - 210 of 491 items found.
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Test Spectrum, Inc.
Test Spectrum can provide generic Probe Cards, Probe Interface Boards (PIB), and loadboards. Choose from existing configurations already designed, or a generic test board for your specific tester configuration can be designed quickly.Teradyne J750 Probe Card and PIB; Teradyne Integra Flex PIB; Teradyne Ultra Flex PIB; Teradyne Catalyst PIB; Credence Quartet PIB (Probe Interface Board); Advantest 93K 1024 PIB
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39S0xBWX9ZY2VCC0 -
ELMA Electronic, Inc.
Elma’s CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 4-slot OpenVPX backplane.
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ARINC CPCIC-A429/PXI -
Alta Data Technologies LLC
The ARINC CPCIC-A429/PXI Interface Card and AltaAPI Support Software Represent the Latest ARINC 32-bit FPGA Protocol Engine Technology. Encode and Decode almost Any ARINC-429 PHY Level Label/Word Signal. The First Card in the Industry to Offer Advanced Test Functions of Signal Generation and A/D Signal Capture.
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SD extend 300 -
Sycard Technology
The SD extend 300 is an extender card for Secure Digital cards. It provides developers of Secure Digital hosts and cards a convenient way of accessing signals on the interface. All 9-pins are accessible via standard 0.1" test posts. Multi-layer design with separate ground and power planes assure trouble free operation. All signal pins are clearly marked. Jumper blocks allow any signal or power pin to be interrupted for testing or current measurements.
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Smiths Interconnect
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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TTPSimulate XMC/PCIe -
TTTech Computertechnik AG
TTPSimulate is a high-performance test system which enables the simulation of a networked TTP system in real-time. It allows full hardware in the loop verification of a TTP unit. There are two form factors available for this product – PCIe and XMC card format. Both cards can act as four independent TTP nodes and have an IRIG-B interface for time-stamping.
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F9 Systems, Inc.
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for backplane path characterization. The card includes a HM-ZD connector segment for access to the backplane and edge-launch SMA connectors for ease of test cable attachment. DC blocking capacitors are included on the receive pairs as required by Advanced TCA.
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PCI EmbeddedComputer Systems
This adapter can be used to run, test or program a 3U VPX card in a standard PC PCIe slot. SSC switchable (ON/OFF) PCs available from PCI-Systems Inc.
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IIB-3910-PCI -
Western Avionics Ltd.
The IIB-3910-PCI is a single slot intelligent interface card providing complete STANAG 3838 and STANAG 3910 test, simulation and bus analysis capability for the PCI Bus.
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IIB-3910-PMC -
Western Avionics Ltd.
The IIB-3910-PMC is an slot intelligent interface card providing complete STANAG 3838 and STANAG 3910 test, simulation and bus analysis capability for the PCI Mezzanine standard.
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39S0xBWX94Y3VCC0 -
ELMA Electronic, Inc.
Elma’s SOSA aligned CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 8-slot OpenVPX backplane.
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Signatone Corp.
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Terotest Systems Ltd.
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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CT1000 -
SPEA S.p.A.
The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.
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FADOS7F1 -
Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.