Showing results: 301 - 315 of 522 items found.
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Chroma ATE Inc.
a programmable PXI-Express DPS (Device Power Supply) Card designed for high-accuracy and reliable output power for device test applications. Its compact size, easy level of integration, and high flexibility make the 52310e Series ideal for multi-channel power supplies.
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GX5641 -
Terotest Systems Ltd.
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) and can be individually set to operate in either conversion or static I/O modes.
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GX5641 Series -
Marvin Test Solutions, Inc.
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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CPE4000 -
Computer Conversions Corporation
Computer Conversions’ CPe4000 Series are CompactPCI-Express (cPCIe) and PXI Express (PXIe) compliant: Synchro, Resolver, and LVDT/RVDT I/O Cards (predominantly output cards), with GEN1 and GEN 2 PCI Express interface, designed for accurate and reliable commercial, industrial and COTS-Mil. applications in test, simulation, motion control and shipboard data distribution. The CPe4000 Series drive up to 4 channels of Synchro, Resolver, 3-wire LVDT/RVDT outputs, or up to 8 channels of 2 wire LVDT/RVDT AC Sensor output sets.
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Micropross MP500 PT1-NFC -
NI
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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PCI EmbeddedComputer Systems
This adapter connects to the 3U VPX extender to test a PCIe card in a VPX environment. The internal PCB routing is dependent on the VPX profile used in the VPX chassis backplane. Customer must specify the profile used or supply a pin out profile for the slot in question.
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39E05BUX94Y2VPB0 -
ELMA Electronic, Inc.
The Type 39 E-Frame (Short), test platform supports 3U, VPX development. With a rugged aluminum construction, the Type 39 E-frame is 9U overall to hold 3U cards. Available in compact (49HP) and full (84HP) for mounting 3-15 slots at 1" pitch.
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39E06WUX94Y2VPBX -
ELMA Electronic, Inc.
The Type 39 E-Frame (Short), test platform supports 3U, VPX development. With a rugged aluminum construction, the versatile Type 39 E-frame is 9U to hold 3U cards. Available in compact (49HP) and full (84HP) for mounting 3-15 slots at 1" pitch.
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39E-CPCI -
ELMA Electronic, Inc.
The Type 39 E-Frame (Short), test platform supports 3U, CPCI development. With a rugged aluminum construction, the 39 E-Frame is 9U overall to hold 3U cards. Available in compact (49HP) and full (84HP) widths for mounting 2-21 slots at .8" pitch.
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VC43™/VC43EAF™ -
Celadon
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Plottergeist -
Aphena Ltd
Plottergeist "the phantom plotter" emulates all the common HPGL plotters. It runs on a standard PC equipped with a GPIB card or using RS-232, and connects to test equipment or another computer. The software behaves like a real plotter, with the exception that the PC screen is the paper.
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Circuit Check, Inc.
Circuit Check supports reading linear bar codes and 2D symbols within each of its fixture product lines.When spring-loaded probes are not practical or access is limited, Circuit Check can help you with thru-connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented spring probes, mating connectors, sacrificial SMT connectors, and stabber cards.
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Translarity
Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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NX Pro+ -
Dynalab Test Systems, Inc.
The Dynalab NX Pro+ Wire HarnessTester is modular and is designed for applications requiring up to 32,768 test points. It has the same front end as the NX Pro Tester, but employs a series of Expansion Units to accommodate the test point cards. Testing for continuity, shorts, and a variety of components. Highly flexible and adaptable product line that meets the changing needs of wire harness manufacturers.
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GX5642 -
Terotest Systems Ltd.
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.