Filter Results By:
Products
Applications
Manufacturers
- Pickering Interfaces Ltd.
product
PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 31.5Ω
50-298-110
The 50-298-110 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
-
-
product
Test Card Generator
TCG1
This generator provides a standard 75O, 1-volt p-p; PAL encoded CCIR video signal for the testing of monitors and other CCTV equipment. The Test Card Generator TGC1 may display one of four test patterns , (i) Colour bars with reference, (ii) Red Raster, (iii) Peak White Raster and (iv) Composite Test Card (see picture below). The Test Card Pattern incorporates many of the attributes of broadcast test patterns for the evaluation and setting up of CCTV video equipment.
-
product
Creepage Distances Test Card
CX-P27
Shenzhen Chuangxin Instruments Co., Ltd.
Creepage Distances Test Card Brief DescriptionCreepage Distances Test Card, Refer to GB4706.1-2005 the 29th Item Atc
-
product
Probe Card Test & Analysis
Automated probe card test and repair is used to monitor probe card health to ensure cards are ready and capable of testing semiconductor devices. In cases where the card is not meeting performance specification, repairs may be performed such as tip adjustment or card cleaning, thus returning the card quickly to a production state.
-
product
Magnetic Stripe Test Cards
Test Limit Cards (and tickets) are nominally encoded to ISO standards BUT WITH specific parameters deliberately set to predetermined levels, which can be inside or outside the ISO limits. The Test Limit Cards are designed for use by Test\Inspection Departments, Field Service Engineers, Reader \ Encoder Development Engineers to check and confirm proper operation of magnetic stripe reading equipment (e.g. ATMs and POS).
-
product
Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
-
product
High Flexibility Test Controller Card
TCC 1800-UE
The TCC1800-UE Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via Ethernet.The TCC1800-UE is designed to work with positive voltages up to 24V. The card provides extensive IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, ethernet-, CAN, USB, SPI and I2C interfacing.
-
product
In-Service Electrical Continuity Test Card
Cisco ONS 15454
The Cisco ONS 15454 In-service Electrical Continuity Test Card is a solution for confirming proper DS-1 and DS-3/EC-1 cabling between the Cisco ONS 15454 shelf assembly electrical interface adapter (EIA) panels and the user's patch panels. The solution is designed for shelf installations that are presently carrying traffic and tests for common wiring errors including electrical shorts, opens, wrong connections, and tip/ring reversals.
-
product
Advanced Circuit Card Automated Test
ACCAT
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
-
product
Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
-
product
Smart Card Module Test Cells
Current and voltage measures are executed on defined pins, in stable conditions.Measurements:- Open/short- Input leakage current- IDD Supply instant/average current test (static/dynamic mode)- Input capacitance @13 MHz and inductance- Retro modulation index (RMI)Test of passive devices:- Capacitors- Resistors- Resonators
-
product
Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system’s source and measure baseband instrumentation – resulting in simplified support / maintenance logistics and improved system availability.
-
product
JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
-
product
PCI Express Mini Card For MIL-STD-1553 Test And Simulation
AME1553-1
MIL-STD-1553 Test and Simulation PCI Express Mini Card with 1 Dual Redundant channel plus 2 discrete Input, 2 discrete Output channels.
-
product
Conformance Calibration Standard Test Card for GS1-DataBar Symbol Verifiers
AI-CCS-DATABAR
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
-
product
Conformance Calibration Standard Test Card for GS1-128 Symbol Verifiers
AI-CCS-128-E Rev B
This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
-
product
Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers
AI-CCS-UPC/EAN-E Rev S
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
-
product
Single Function MIL-STD-1553 Test & Simulation PCIe Card
ASE1553M-x
Single Function MIL-STD-1553 Test and Simulation module for PCIe with 1, 2 or 4 dual redundant streams.
-
product
Conformance Calibration Standard Test Card for ITF-14 (Interleaved 2 of 5) Symbol Verifiers
AI-CCS-ITF-14
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
-
product
Conformance Calibration Standard Test Card for ISO/IEC Data Matrix and GS1 DataMatrix Symbol Verifiers
AI-CCS-DM-G Rev A
This precision 2D barcode Conformance Calibration Standard Test Card is the first 2D test card to provide ALL 12 of the Primary Reference Symbols specified by ISO 15426-2 for barcode verifiers. They are sized from 0.5mm to 0.2mm so that all the symbol sizes specified in Annex A.3.1 can be tested. Symbols 1-4 are GS1 DataMatrix symbols, while symbols 5-12 are ISO/IEC Data Matrix symbols consistent with the ISO/IEC 16022 standard. The card also includes four calibrated reflectance patches.
-
product
PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
-
product
EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
-
product
Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
-
-
product
Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
-
product
OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
-
product
Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
-
product
FPGA PXI Card with 40 Channel ECL Buffer Module
GX3640
The GX3640 is comprised of the GX3500 FPGA card and the GX3540, 40 channel ECL expansion card. It is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), and functional test applications. The GX3640 consists of 20 differential ECL drivers and 20 differential ECL receivers. Each channel can be accessed via software commands for use in static I/O applications.
-
product
PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
-
product
ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
