Showing results: 271 - 285 of 491 items found.
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PCI EmbeddedComputer Systems
This adapter connects to the 3U VPX extender to test a PCIe card in a VPX environment. The internal PCB routing is dependent on the VPX profile used in the VPX chassis backplane. Customer must specify the profile used or supply a pin out profile for the slot in question.
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39E05BUX94Y2VPB0 -
ELMA Electronic, Inc.
The Type 39 E-Frame (Short), test platform supports 3U, VPX development. With a rugged aluminum construction, the Type 39 E-frame is 9U overall to hold 3U cards. Available in compact (49HP) and full (84HP) for mounting 3-15 slots at 1" pitch.
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39E06WUX94Y2VPBX -
ELMA Electronic, Inc.
The Type 39 E-Frame (Short), test platform supports 3U, VPX development. With a rugged aluminum construction, the versatile Type 39 E-frame is 9U to hold 3U cards. Available in compact (49HP) and full (84HP) for mounting 3-15 slots at 1" pitch.
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39E-CPCI -
ELMA Electronic, Inc.
The Type 39 E-Frame (Short), test platform supports 3U, CPCI development. With a rugged aluminum construction, the 39 E-Frame is 9U overall to hold 3U cards. Available in compact (49HP) and full (84HP) widths for mounting 2-21 slots at .8" pitch.
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VC43™/VC43EAF™ -
Celadon
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Plottergeist -
Aphena Ltd
Plottergeist "the phantom plotter" emulates all the common HPGL plotters. It runs on a standard PC equipped with a GPIB card or using RS-232, and connects to test equipment or another computer. The software behaves like a real plotter, with the exception that the PC screen is the paper.
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Circuit Check, Inc.
Circuit Check supports reading linear bar codes and 2D symbols within each of its fixture product lines.When spring-loaded probes are not practical or access is limited, Circuit Check can help you with thru-connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented spring probes, mating connectors, sacrificial SMT connectors, and stabber cards.
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Translarity
Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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NX Pro+ -
Dynalab Test Systems, Inc.
The Dynalab NX Pro+ Wire HarnessTester is modular and is designed for applications requiring up to 32,768 test points. It has the same front end as the NX Pro Tester, but employs a series of Expansion Units to accommodate the test point cards. Testing for continuity, shorts, and a variety of components. Highly flexible and adaptable product line that meets the changing needs of wire harness manufacturers.
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GX5642 -
Terotest Systems Ltd.
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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SGDK320A (SD Host Tester) -
TDK SolidGear Corporation
SGDK320A (SD Host Tester) is a product that has the functions of SD emulator (SD Emulator), host tester (Host Tester), SD analyzer (SD Analyzer), and eMMC analyzer (eMMC Analyzer). Supports SD Memory Card Physical Layer Specification Version 3.01. It covers the test contents of Test Specification Ver3.00 and Supplement Note. Supports SDR104 and eMMC ver4.41 (analyzer).
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SPEA S.p.A.
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Micro Control Company
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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PCCtest 172 -
Sycard Technology
The PCCtest 172 is part of a new family of low cost 16-bit PC Card socket testers. Based on the highly successful PCCtest 2xx series of socket testers, the PCCtest 172 is a cost reduced version designed to provide similar test coverage at a significant price reduction.
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PCCtest 170 -
Sycard Technology
The PCCtest 170 is part of a new family of low cost 16-bit PC Card socket testers. Based on the highly successful PCCtest 2xx series of socket testers, the PCCtest 170 is a cost reduced version designed to provide similar test coverage at a significant price reduction.