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JFET
semiconductor's electron holes doped to impede or switch off reverse bias carrier channels.
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product
JFET Input Amplifiers
Analog Devices JFET input op amps or FastFET high speed (>50 MHz) input op amps provide high input impedance and ultralow input bias currents for high speed applications. The majority of our FET input op amps feature wide supply ranges from +5 V to 12 V or higher and feature rail-to-rail outputs enabling wide dynamic range.
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JFET Voltage Preamplifier
SIM910
Stanford Research Systems, Inc.
The SIM910 and SIM911 are low-noise, programmable preamplifiers which are ideal for a wide range of small signal applications. The primary differences between the two models are their input impedance and input noise.
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product
Single Channel Detectors
Infrared detectors for gas analysis, flame detection and radiometry in TO18 or TO39 packages.Housing types TO18 and TO39Voltage or current modeSignal processing with JFET or operational amplifierThermally compensated (optional)With special chip holder for reducing the microphonic sensitivity (optional)
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product
Semiconductor Discrete Test Systems
QT-4000 Series
Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
