Showing results: 241 - 255 of 492 items found.
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Nano-View Co. Ltd.
~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
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7505-01 -
Chroma ATE Inc.
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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FLA-200 -
NAPSON Corp.
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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WS-8800 -
NAPSON Corp.
*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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thicknessGAUGE.laser -
Micro-Epsilon Group
thicknessGAUGE.laser sensor systems use laser triangulation sensors for the thickness measurement. These laser sensors enable high measuring rates at high speeds. The thicknessGAUGE.laser series impresses with a favorable price/performance ratio and is preferably used for thickness measurements of common surfaces such as plastics, wood and metals.
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Elcometer Limited
Produced specifically for the automotive aftermarket and Insurance Assessors, 3rd party consultants, body shops and used car sales, these kits provide an instant measure of the coating thickness of panels.An illuminated magnifier is supplied to enable close inspection of bodywork.Measurement parameters include:Surface temperatureSurface inspectionCoating thickness
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CER – SE 500adv -
SENTECH Instruments GmbH.
* The SE 500adv combines ellipsometry and reflectometry, * Eliminates the ambiguity in layer thickness determination for transparent films, * Extends thickness measurement to 25000 nm. # Laser wavelength 632.8 nm# Spectral range of reflectivity from 450 nm to 920 nm wavelength# Spot size 80 ?m
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VictoryPCB
Monthy Capability: 1200 Sq M/MonthLayer: 4 LayersMaterial: FR4 TG140Dimension: 335.14mm*245.65mmFinished board thickness: 1.6mm+/-0.13mmFinished copper thickness: 2ozMin Trace Width/Space: 8/8milMin hole size: 0.3mmMin hole wall copper: ≥25UMSoldermask Color: YellowSurface finishing: HALApplication field: Consumer electronics
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LaserLinc
Precision measurement is our focus. Our laser and ultrasonic-based technologies provide non-contact diameter measurements for a wide range of materials. Our accurate suite of tools cover outside diameter (OD), ovality (eccentricity), wall thickness (coating thickness/material thickness), concentricity, inside diameter (ID), and more.
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VX -
Dakota Ultrasonics
With the hand-held VX Ultrasonic Velocity gauge, you can determine material velocities by measuring a known thickness, entering a known thickness into the VX, and the material velocity will be displayed. The tool's backlit display is easy to read, even in dim light, and the unit operates for up to 200 hours on a single set of batteries.
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Front Window Scanner For Wedge Angle Measurement -
Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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MTI Instruments
Multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
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EVG®50 -
EV Group
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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SRS-2010 -
NAPSON Corp.
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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thicknessGAUGE.laser profile -
Micro-Epsilon Group
thicknessGAUGE.laser profile sensor systems use laser profile scanners for the thickness measurement. These scanners project a laser line onto the surface to be measured. The laser line compensates for strip tilting and enables profile averaging. The laser line measuring technique makes it possible to measure the thickness of structured materials such as embossed surfaces and perforated plates.