Showing results: 256 - 270 of 492 items found.
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2830 ZT -
Malvern Panalytical Ltd
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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National Technical Systems
Comparative tracking index (CTI) is used to assess the relative resistance of insulating materials to tracking. The CTI expressed as that voltage which causes tracking after 50 drops of 0.1 percent ammonium chloride solution have fallen on the material. The results of testing the nominal 3 mm thickness are considered representative of the material’s performance in any thickness.
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RT-3000/RG-2000 (RG-3000) -
NAPSON Corp.
*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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AMETEK Sensors, Test & Calibration
The contacting extensometers are designed for accurate strain and extension measurement of a material up to a maximum sample thickness of 25 mm.
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Lloyd Material Testing
The contacting extensometers are designed for accurate strain and extension measurement of a material up to a maximum sample thickness of 25 mm.
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KPM Analytics
Accurate moisture, coat weight and film thickness profile measurement for process control in paper and film converting applications.
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3230 -
Elcometer Limited
By rolling the gauge through a wet coating, the centre wheel eventually touches the film. This point on the scale indicates the thickness.
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3238 -
Elcometer Limited
Each comb has 24 measurement steps (teeth) providing a more accurate wet film thickness value.
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Qualitest International Inc.
The byko-cut universal is a multi-purpose paint testing instrument that measures paint coating thickness, paint adhesion, and coating hardness.
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LMC-20 -
Eddy Co.
The LMC-20 functions not only as a light monitor for coating thickness, but also allows control of multi layer/multi material coating processes. Up to 2000 individual layers in a coating are possible, by using 40 program banks of 50 layers each. The characteristics of up to 99 different coating materials can be input as well. Final thickness can be calculated to 1% of a quarter wave.
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Elcometer 990 -
Elcometer Limited
Calibration foils or ‘shims’ are the most convenient way of creating a coating thickness standard on the substrate material, surface finish or form.
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NC-6800 -
NAPSON Corp.
*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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interferoMETER -
Micro-Epsilon Group
The innovative white light interferometers from Micro-Epsilon set a benchmark in high-precision distance and thickness measurements. These sensors enable stable measurement results with sub-nanometer resolution offering a comparatively large measuring range and offset distance. The interferometers are available in 3 series: the IMS5400-DS for high-precision industrial distance measurements, the IMS5400-TH for accurate thickness measurements and the vacuum-suitable IMS5600-DS for distance measurements with picometer resolution.
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KLA-Tencor Corp
The Filmetrics® R54-series and R50-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54-series adds a light-tight enclosure, along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.