Showing results: 376 - 390 of 492 items found.
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Panasonic Industrial Devices Sales Company of America
Easy-to-use Inductive Proximity Sensors provide stable detection for automation, with Sensors for standard to high speed, high performance solutions. These Inductive Proximity Sensors detect the presence and position of ferrous and non-ferrous metal objects and come in a range of IP Ratings (IP50 / 67 / 68 / 68g). The IP68g enclosure allows usage in very harsh environments. For high speed, high accuracy measurement, Laser Measurement Sensors are ideal for the precise measurement of thickness, diameter and height. Panasonic’s HG-C Series CMOS Type Micro Laser Distance Sensors deliver high repeatability for measurement distances (center) of 30mm, 50mm, 100mm, 200mm and 400mm. Ideal to measure insertion depths or thickness, these Sensors can also be used to detect warping, overlaps and presence helpful for preventative maintenance and remote monitoring. Select models are IO-Link compatible for ease of use.
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Amitron Corp.
The heat dissipation afforded by this construction is dramatically superior to standard FR-4 constructions. The dielectrics used are typically 5 to 10 times as thermally conductive as conventional epoxy-glass and a tenth of the thickness resulting in thermal transfer exponentially more efficient than a conventional rigid PCB. This is so effective that lower copper weights than suggested by the IPC heat-rise charts can be used.
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MR – 1 -
Schuetz Messtechnik GmbH
The different specific resistances are specified by selecting one of the pre-programmed materials, or by measuring the specific resistance of unknown materials and entering the result. Preferably the coat thickness is displayed, but the measurement and display of the actual resistance, the square resistance and the specific resistance is possible, too. All measured values can be transmitted into a PC via a serial interface. Controlling the MR-1 on the other hand is not possible.
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HORIBA, Ltd.
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Lens Test -
Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Hildebrand Prüf- und Meßtechnik GmbH
The MICRO IRHD SYSTEM provides hardness readings on elastomers according to MICRO IHRD. Recommended specimen thickness is 1 to 5 mm. It complies to international standards such as DIN ISO 48, ISO 48 and ASTM D 1415.
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Veeco Instruments Inc
Deposit dense, uniform, and repeatable thin, diamond-like carbon (DLC) films for longer-lasting TFMH slider overcoats and landing pads with Veeco's NEXUS DLC-X System. The Nexus DLC-X features the industry's first production-worthy Pulsed Filtered Cathode Arc Source to enable sub-20A overcoat thickness, and supports improved step coverage for better process yield compared to previous generations.
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Delcom Instruments Inc.
Non-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreMeasures nearly all thin conductive materials or coatingsChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterFor benchtop or inline applicationsSimple one-button operationSmall footprint with detached sensor probeOptions include vacuum-ready probe, PC-based productivity software, Ethernet connectivity, stage, and more
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CX-GZ -
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60335-2-9 clause 3 figure 103 Vessel for testing hotplatesParameter:1.Pot and lid material industrial aluminum2. Pot material thickness 2 mm;3. The bottom of the pot body can not be outward convex, can not exceed 0.05mm;4. Pot body and lid surface should be smooth;5, size: 110, 145, 180, 220, 300mm each one
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confocalDT -
Micro-Epsilon Group
The confocal chromatic confocalDT measuring system is used for fast distance and thickness measurements. Different sensor models and controller interfaces open versatile fields of application, e.g., in the semiconductor industry, glass industry, medical engineering and plastics production.
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Micro-Epsilon Group
The interface and signal processing units extend the field of application of Micro-Epsilon sensors. The interface modules are used to convert sensor signals into digital or bus-compatible interfaces. This enables interfaces such as USB, RS422, Ethernet/IP, Profinet and EtherCAT for numerous sensors. The signal processing units are also used to record several sensor signals, to calculate and output them together. This is necessary, for example, for planarity measurement or thickness measurement.
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VeriFire MST -
Zygo Corporation
Simplify the complex – multiple surfaces create complex fringe patterns, the Verifire™ MST uses patented wavelength-shifting technology to acquire phase data from multiple surfaces simultaneously. Report key metrics from individual surfaces of parallel windows, transmitted wavefront, as well as precise surface-to-surface information like total thickness variation (TTV), wedge and even material inhomogeneity.
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Desert Gecko -
PCI EmbeddedComputer Systems
The 6 slot conduction cooled chassis can dissipate 120W in a non-moving air environment. The fin design and wall thickness was designed and analyzed with Flowmetrics software and designed for minimum delta T offset in an average thermal load application. The design was then verified in real life enviromental chamber experiments with a sealed chassis using our 3U heat simulator modules. Data available upon request.
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SpectraRay/4 -
SENTECH Instruments GmbH.
SpectraRay/4, the SENTECH proprietary spectroscopic ellipsometry software, includes data acquisition, modeling, fitting, and extended reporting of ellipsometric, reflection, and transmission data. It supports variable angle, multi-experiment, and combined photometric measurements. SpectraRay/4 includes a huge library of materials data based on SENTECH thickness measurements and literature data as well. The large number of dispersion models allows modeling of nearly any type of material.
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MS 1304 -
Meltronics Systemtech
This system is used for finding eye axial length; cornea thickness and calculating the eye IOL power value. This system has capability of storing 100 patient records and downloading facility. System will work as an ASCAN BIOMETER or ASCAN / PACHYMETER BIOMETER system. System consists of LCD, keypad, RS232C interface for downloading and thermal printer interface. It is a microprocessor-based system. This system uses ultrasound signal for measurements.