Showing results: 406 - 420 of 492 items found.
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Labodam
Whiteness and chromaciticity tester, whiteness meter, tensile stiffness tester, automatic horizontal tensile tester, automatic horizontal tensile tester, vertical tensile tester, pulp beating (refining) freeness tester, water absorbtion tester, Cobb tester, COBB sample cutter, coefficient of friction tester, electronic bending stiffness tester, paper and cardboard thickness meter, paper and cardboard thickness meter, ink rubber tester, standard strip cutter, softness tester, carton compression tester, paper air permeability tester, internal ply bond tester, puncture strength tester, paper tearing tester, electronic tearing tester, mullen burst tester, crush tester, Bekk smoothness tester, folding endurance tester
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Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.TFProbe wafer measurement systems, TFProbe WM series, measure wafer thickness, warp, bow, flatness, step/bump height, trench depth. TFProbe WM systems are based on confocal optical method with advantages of non-contact, non-destructive, long working distance, fast data acquisition, full mapping functions. Particularly, with integration with our thin film measurement technique, a total solution for thickness measurement covers from a few angstroms to several millimeters. Another key feature is that all our tools are upgradable in future.
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MFM310 -
Rigaku Corp.
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Guangzhou Biaoji Packaging Equipment Co., Ltd.
Flexible Packaging Testing Service mainly included OTR barrier test service,WVTR Testing Service, COF Coefficient of Friction test, lamination bond strength, material analysis, physical properties, tear strength , tensile strength, puncture, slip, blocking, scuffing, film thickness variation etc.
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UI-FT17A -
Unuo Instruments
Bally Leather Flexing Tester is to determine flex resistance of leather in wet or dry condition. The flexometer is suitable to test all kinds of leather whose thickness is below 3 mm. As a leather testing machine, bally flex tester is commonly used to check the properties of leather and footwear /shoe upper materials.
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Elcometer Limited
Formal quality systems, such as those described in ISO 9000, require gauges to be properly controlled, logged and in calibration. Increasingly, users are specifying that the readings taken by gauges are traceable to National Standards. There are three types of coating thickness standards available from Elcometer: calibration foils, coated standards and zero test plates.
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ASL Environmental Sciences
The Shallow Water Ice Profiler (SWIP) is a real-time acoustic ice thickness measurement (ice draft) instrument for shallow water applications. The underwater components include a low-cost acoustic transducer, a tilt sensor, a high-precision pressure sensor and a temperature sensor, all providing suitably high resolution for shallow water measurements.
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Piranha4 Polarization -
Teledyne DALSA
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Lion Precision
Optics-free sensing technology is at the heart of an LRD clear label sensor. They see labels regular "eyes" can't see — like clear labels on a clear liner! This improved technology also makes them faster and more precise - even on ordinary paper labels. More than 50,000 LRD label sensors installed across the globe testify to their accuracy and reliability.Our clear label sensors use capacitive or ultrasonic technology so they have no sensitivity to color or contrast. The sensors are triggered by changes in thickness, not opacity or contrast.
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FISCHERSCOPE X-RAY/XULM -
Helmut Fischer AG
Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)
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NC-60F/RS-1300N -
NAPSON Corp.
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Elcometer Limited
For numerous products, such as paint, ink, varnishes, glue and cosmetics, the reliability of many laboratory tests is directly related to the quality and consistency of the samples. Any measurements made on coatings for the purpose of describing their physical properties (drying time, elasticity, abrasion, gloss, colour, shade, etc.) are made on the basis of uniform and comparable samples with precisely controlled thickness.
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LittleFoot Series -
n&k Technology, Inc.
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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Inolytix
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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CRESBOX -
NAPSON Corp.
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
