Showing results: 496 - 510 of 538 items found.
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17040 -
Chroma ATE Inc.
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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KD-9363-EM -
King Design Industrial Co., Ltd.
The purpose of vibration testing is to make a series of controllable vibration simulation in lab, no matter generated by natural or man-made vibration environment; such as waves, tidal flaps, wind, earthquake or rain and so on. It is to test if the product is capable of sustaining the vibration environment exerted from transporting or usage along its effective life cycle; and certify the standard of design & functional requirement of product. The value of vibration testing is to confirm the reliability of products and effectively screen out the bad products in factory; avoiding damages occurred at arrival; and to assess the failure analysis on the non-performing products; expecting to reach a high standard, high-reliability products. The vibration test stresses on the continuity and fatigue; and contributes to the understanding of product’s status under vibration circumstance in a normal environment; and avoids the product’s unpredictable damage caused under certain vibrating frequency for a long time.
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PCE Instruments
The inspection camera opens a new view into the insides of machines and systems; whether an endoscope, thermal imaging camera or infrared thermometer - an inspection camera is the ideal instrument for monitoring and maintenance.Due to the flexible control of the endoscope or the visual display of potential damage areas in machines or systems, weaknesses and points of failure can be detected and therefore be prevented. The inspection camera make this possible without the need for complex disassembly.The inspection camera is used by electricians, safety experts, expert witnesses, mechatronics, and mechanics. The inspection camera is also used for apprenticeships and in-service training. An inspection camera can be applied internally as well as at school or at universities for demonstration purposes. With their help, inspections in the industrial sector can be organized considerably faster, more targeted and more cost-efficient. An inspection camera is an important companion in the course of everyday work.
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ARGUS -
Signals & Systems India Private Limited
Argus Tri-axial wireless vibration sensor enables easy condition monitoring of rotary machines and detects faults well soon before the equipment failure. The super-compact, IP67 rated vibration sensor provides reliable data for continuous monitoring and remote diagnostics. This Tri-axial sensor communicates with Android devices in both wired and wireless modes. The dedicated Argus app enables Multichannel Data Acquisition for simultaneous monitoring of various nodes.INCREASE MACHINE LIFESPAN - EARLY DIAGNOSIS ELIMINATES PROBLEM SEVERITY WHICH IN TURN ENHANCES MACHINE LIFESPANREDUCE YOUR RISK - REMOTE MONITORING ENSURES EMPLOYER SAFETY IN A HAZARDOUS ENVIRONMENT.50% REDUCTION IN MAINTENANCE COST - PREDICT & RECTIFY THE FAULTS EARLY TO LOWER THE UNDESIRED MAINTENANCE COST.40% REDUCTION IN UNPLANNED DOWNTIME - REDUCE MACHINE DOWNTIME AND INCREASE THE PRODUCTIVITY.
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T5230 -
Advantest Corp.
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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LXinstruments GmbH
LXinstruments FCT systems for industrial electronics assemblies are particularly suited for applications with a large variant diversity for medium volume sizes. They are used for testing utility electronics as well as for drive control and grid management systems. We have also implemented systems for functional test, repair and calibration of decentralized PLC I/O assemblies.Since early failures in the field often lead to enormous costs, we not only provide functional test systems, but also burn-in systems for simultaneous testing of many assemblies in a climate chamber. Due to the modular structure of our software, it is possible to establish a logical separation between the definition of the climatic profile to be executed and the actual test sequence, during which the different electrical tests are processed. Connections to HALT/HASS systems can also be established without problems.
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ASTM D149 -
National Technical Systems
This test method covers procedures for the determination of dielectric strength of solid insulating materials at commercial power frequencies, under specified conditions. Unless otherwise specified, the tests shall be made at 60 Hz. However, this test method is suitable for use at any frequency from 25 to 800 Hz. At frequencies above 800 Hz, dielectric heating is a potential problem. This test method is intended to be used in conjunction with any ASTM standard or other document that refers to this test method. References to this document need to specify the particular options to be used. It is suitable for use at various temperatures, and in any suitable gaseous or liquid surrounding medium. This test method is not intended for measuring the dielectric strength of materials that are fluid under the conditions of test. This test method is not intended for use in determining intrinsic dielectric strength, direct-voltage dielectric strength, or thermal failure under electrical stress (see Test Method ASTM D3151). This test method is most commonly used to determine the dielectric breakdown voltage through the thickness of a test specimen (puncture). It is also suitable for use to determine dielectric breakdown voltage along the interface between a solid specimen and a gaseous or liquid surrounding medium (flashover). This test method is similar to IEC Publication 243-1. All procedures in this method are included in IEC 243-1. Differences between this method and IEC 243-1 are largely editorial. Note: The above information is taken directly from the test method Scope published in ASTM D149.
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Anderson Materials Evaluation, Inc.
Our numerous analytical techniques, we tackle a wide range of materials challenges and commonly combines several analytical techniques to fully address complex and multi-dimensional materials issues. Our materials analysis laboratory provides XPS surface analysis, thermal analysis (TGA, DSC, TMA), FTIR infrared spectroscopy, UV-Vis spectrophotometry and reflectivity measurements, gas chromatography – mass spectroscopy (GC-MS), SEM/EDX, optical microscopy, mechanical testing, electrochemistry and corrosion analyses, residual gas mass spectroscopy, contact angle measurements, surface contamination measurements, adhesive bonding failure analysis, facility testing for silicone contamination, mechanical testing, metallography and fractography, density and porosity measurements, volatile organic component testing, friction, and other analytical capabilities. We continue to upgrade and expand our arsenal of analytical techniques and custom analytical methods to support our customers’ needs.
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Shimadzu Corp.
After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.
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FLIR VS290™ Series -
Teledyne FLIR
The FLIR VS290 is an industrial thermal and visual videoscope system designed to help professionals quickly and safely find hidden faults and dangers in difficult-to-access locations. Featuring a 160 × 120 true thermal imager and FLIR MSX® (VSC-IR32 and VSC-IR33 probes), VS290 videoscopes give users the power to see and measure invisible hot spots before catastrophic equipment failures can occur. The small, sleek tips allow for easy inspection through tight or confined openings, improving productivity and reducing diagnostic time. The 2-meter side-viewing probe options are CAT IV 600V safety rated—perfect for underground electrical vault inspections. The 1-meter forward-viewing probe is a practical fit for general purpose equipment and building thermal scans. All are versatile tools for the most demanding environments in utility, manufacturing, and building maintenance applications.
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National Technical Systems
Gravelometer testing is designed to evaluate the resistance of vehicle surface coatings (paint, clear coats, metallic plating, etc.) to chipping caused by the impacts of gravel and other flying objects in accordance with SAE and ASTM standards. The primary usage of this test is to simulate the effects of the impact of gravel or other debris on automotive parts. Test samples are typically mounted in the back of the Gravelometer, and air pressure is used to project 1 pint (approximately 300 pieces) of gravel at the sample. The test sample is then removed and gently wiped off with a clean cloth. Tape is then applied to the entire tested surface. Removal of the tape then pulls off any loose fragments of the coating. The appearance of the tested sample is then compared to standard transparencies supplied by SAE to determine the chipping ratings. Visual examination can also be used to describe where in the coating/substrate system that the failure has been induced.
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Nanovea Inc.
NANOVEA Mechanical Tester is the most versatile nanoindenter and scratch tester capable of precisely measuring the micro- to nanomechanical properties of wide ranges of materials from thin films, coatings, ceramics and composites to polymers and bio materials via Indentation, Scratch and Friction testing. All NANOVEA Mechanical Tester models come with true feedback load control from independent load and depth sensors that provide unmatched accuracy and the highest repeatability available on the market. This technology allows a user to perform Nanoindentation and Microindentation for Hardness and Elastic Modulus Testing, Stress vs Strain Analysis, Creep and Relaxation, Loss and Storage Modulus, Yield Strength and Fatigue, Fracture Toughness and Nano-scratch & Micro-scratch for Scratch Hardness Testing, Multi-pass Wear Test, Cohesive and Adhesive Failure Testing as well as Coefficient of Friction testing, all available on one system.
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SCR ELEKTRONIKS
Dry Arc Resistance Tester is designed to conduct high voltage,low current Arc Resistance test on solid electrical insulation material as per:ASTM standard D495-99 (2004) and UL 746A. Why Arc Resistance Test? Many Cases of insulator failure are due to deterioration of its surface because of sustained electrical discharge or Arc. This test method is intended to test the resistance of insulating material when a high -Voltage low -current Arc close to the surface of insulation, intending to form a conducting path therein or in causing the material to become conducting due to decomposition and erosion.AdvantagesThis Test ensures that your products meet high standards of quality & safety. This product is meant for all Switchgears/ insulator/ Polymer/ electro plastic manufacturers and manufacturers who use insulators in their products e.g. Wiring Accessories, Appliances, HT/LT line insulators etc.
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ACMAS Technologies Pvt. Ltd.
The rain water or moisture penetrating through a leak in the case, can often reach into the circuit board and lead to failure of the equipment. This problem is frequently encountered with external equipments and devices during storage, usage or transportation in a rainy weather. Therefore, the automotive industries and various research and developmental units often use Rain Test Chambers to test the quality and performance of the product in such extreme environments.Weiber's Rain Test Chambers are such Rain Testing Machines/Chambers used for the testing of automobiles, electronic parts and components, light equipments, voltage cabinets and other wide variety of products under a rainy environment. These IP Test Chamber and IP Testing Chambers are designed to simulate specific environmental conditions, mimicking a natural rainy weather, to test the seals and water proofing capacity of the equipment and devices, thereby providing an estimation of the product performance over a period of time.
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Focus-2005 -
Kyoritsu Testsystem Co., Ltd.
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
