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Showing results: 4906 - 4920 of 5003 items found.

  • AMIDA 2020XP Tester

    Amida Technology, Inc.

    AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end

  • Battery Loading Unit

    BLUe - Scope T&M Pvt, Ltd.

    BLUe series Battery Loading Units; portable instruments for controlled & monitored discharge of batteries. It is designed for integrated site discharge test, design & QC test and also for monitoring discharge process of battery bank with connected load. Single autonomous unit having inbuilt display, keypad and wireless communication with PC makes it very easy to use. It comes in different configurations ranging from 12V to 380V discharge voltages and 50A to 300A discharge currents. Various options are available to control & monitor the discharge process. With the help of optional Cell Monitoring Unit - CELLMon, voltage of each individual cell can be monitored & data sent to main BLUe unit and then from main unit to PC via wireless communication. Each BLUe unit is supplied with PC downloading & analysis software for real time monitoring of discharge process.

  • Air Particulate Counter

    CHY002 - Rinch Industrial Co.,Limited

    Using import semiconductor laser tube and import semiconductor photosensitive tube, assure sensitivity and response speed.Using import micropump,assure sampling volume steady,reduce noise.The key component-light scattering sensor obviously eliminate intracorporal stray light, improve SNR, test result more precise and reliable.The light scattering sensor got Chinese patent.Confidence measurement of this instrument,According to GB/T6167-2007 Standard,realize auto estimate clean class, creatively to auto estimate ≤9 location points clean class.1000 records stored, free to check previous data.User can optional PC data analysis software, realize data management.User can choose humidity sensor (optional accessories).Sampling volume display as digit, more intuitive and precise.“Measurement Number”function,realize multipoint management.Lithium battery,more safety,continuous working 6 hours.

  • Semiconductor Metrology Systems

    MTI Instruments

    MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.

  • Impact Testing Machine (Izod & Charpy)

    Atico Export

    Suitable for Charpy & Izod Impact tests on different materials. It is based on Pendulum principle.Rigid designs of instrument frame & other parts assure minimum energy absorption during fracture which results in improved test accuracies.The highly strained & wearing parts like support blocks & strikers are of special alloy steels duly heat treated.Direct indication of Impact energy absorbed by sample on large dial -Safety guard for the user is provided.Initial potential energy for Charpy is 300 Joules & for Izod is 170 Joules with a Least Count of 2 Joules (for Analogue models) & resolution of 0.5 Joules (for Digital Model).Drop Angle of Pendulum for Charpy is 140° & for Izod is 90°.ASTM Impact Testing machine is also provided, which conforms to E-23 ASTM standard.Gauges, Tongs, Sub-zero bath, Templates, U & V Notch milling cutters are available with it (Optional).

  • Digital Acquisition Card

    PI-41000 - Pulse Instruments

    The PI-41000-4G is a CompactPCI® bus based instrument card that allows the user to capture up to 32-bits of digital data into an on-board memory at clock rates up to 120 MHz. The inputs are software configurable to provide one 32-bit wide channel, one 16-bit wide channel with double depth or two 16-bit channels. When configured with a single 16-bit input, the card will capture at up to 120 MHz. When configured with two 16-bit inputs or as a single 32-bit input, the card will capture at up to 80 MHz. Each digital data channel requires three timing signals, frame, line and pixel to accommodate the data capture. When operating in a two channel mode, clocks from channel A can be used to provide timing to channel B. For wider words or multiple channels, more boards can be used in parallel.

  • SNR Noise Generator

    CNG-EbNo - Noisecom

    The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.

  • Ethernet Gateway

    ICS Electronics

    ICS's Model 9065 Ethernet Gateway is an Ethernet to GPIB Controller that connects easily to your computer's Ethernet port, company network or to the Internet to control GPIB instruments. The Model 9065 is VXI-11 compliant, does not require special drivers and is compatible with the following systems: LINUX, UNIX, SunOS, MAC OS X, HP-UX, IBM-AIX and Windows 2K or later Windows systems. ICS's 9065 uses VXI-11 RPC calls for secure communication with virtually any computer. Eliminates the need for special drivers. Easily programmed on a PC by making VISA calls or on a MAC/UNIX/LINUX computer with RPC calls. See our extensive Application Notes or download our VXI-11 Tutorial and the VXI-11 Specification for more information about the VXI-11 Standard. ICS Electronics is the premier VXI-11 device supplier with 100% VXI-11 compliance in every product.

  • Dynamic Gas Analyser

    ExQ - Hiden Analytical Ltd.

    The Hiden ExQ quantitative gas analyser is a new multi-featured and compact mass spectrometer system providing continuous on-line analysis of dynamic gas streams at pressures from sub-atmospheric up to 30 bar, the fully integrated system now being configurable both for benchtop and for rack-mounting operation. Connection to the process is via a flexible heated inert capillary line with a sample consumption rate less than 10 mL/minute and a response time of less than 300 milliseconds at pressures near atmosphere. The comprehensive range of process interface options enables adaptation of the system to accommodate analysis of up to 16 individual process streams, and adaptors are available for direct connection of the system to most standard TGA/TA instruments. External process data, sample temperature or mass for example, can be imported for combined integration and presentation with the mass spectral data.

  • Force Limited Vibration Testing

    National Technical Systems

    In vibration testing of high value aerospace hardware, over testing of light, high performance structures is a great concern. Discrepancies between the mechanical impedances and the force capabilities of the mounting structure and the vibration shaker can cause catastrophic structural and functional problems to test item. The effectiveness of the radar depends on it retaining its structural integrity over the entire surface of the antenna and that all its electronics are a) tested at, or near levels they will experience in its service life and b) the resonance of various parts of the radar follow those of the model. Consequently, the vibration test lab required 60 data channels to accurately verify the design of the instrument and its ability to withstand launch, cruise and deployment loads. To avoid over testing, NTS used Force Limiting Test Process using four force transducers to prevent exceeding total load of 1000 pounds.

  • Battery Extra Load Units

    IBEKO Power AB

    Performing capacity/discharge test on a high-capacity battery may be challenging since high requirements are set on the discharge system. In cases when discharge test times need to be reduced, high load capacities are required from the discharge system. The battery extra load unit BXL is an additional load unit designed especially for this purpose.It is primarily used with BLU battery testers. However, the unit is a universal add-on device. This means it can be used as an additional load with any other discharge/capacity tester in the market.When discharge current exceeds the capacity of a single BLU device, extra load unit increases discharge capacity. A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way in accordance to battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.

  • Double Function Tester with Shielded HF Test Chambers

    End-of-line Tester UTP 9010 RF - NOFFZ Computer Technik GmbH

    The UTP Series 9010 is a scalable test series available in a variety of feature-rich variants and many designs. The UTP 9010 RF function tester shown here as an example is suitable for tests with a medium number of channels and complexity. It is designed for parallel testing of two or more test items. The measuring instruments used are used alternately for several test items. Due to its compact design and construction as a modular system, this powerful tester can easily be expanded to larger numbers of channels.The integrated HF test chamber UTP 5070 developed by NOFFZ allows an independent shielded test. It can be operated manually or fully automatically by a robot .The basic version of the UTP 9010 series is an ideal system for functional and end-of-line tests and is already preconfigured for this purpose. The RF tester presented in the example is used in particular to test infotainment and eCall modules in the vehicle as well as IoT products with wireless technologies.

  • Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces

    JT 37x7/TSI - JTAG Technologies Inc.

    High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

  • Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm

    OSA202C - Thorlabs, Inc.

    Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.

  • Fourier Transform Optical Spectrum Analyzer, 350 - 1100 nm

    OSA201C - Thorlabs, Inc.

    Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.

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