Filter Results By:
Products
Applications
Manufacturers
-
product
Custom Magnetic Recording Heads
International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
-
product
Erase Magnetic Recording Heads
International Electro-Magnetics, Inc.
*Dual Gap Ferrite Cores*Cassette - 2" Formats*MultiTrack Interlace*Full Track 1" Video
-
product
Audio Mastering Magnetic Recording Heads
International Electro-Magnetics, Inc.
*Tape and Film*Standard Replacement*Instrumentation Quality*Custom Formats
-
product
Magnetic Particle Liquid Checker
S-2A / S-2B
Magnetic particle liquid checker S-2 series is a test bar which can directly check the quality of magnetic particle liquid immediately. Magnetic particle liquid checker S-2A type has a sensor at the head of straight test bar.
-
product
B-H Analyzer
SY-8218 / SY-8219
Soft magnetic components made of ferrite play an important role in electric components as they are used in a broad range of applications from low-frequency applications such as yokes for micromotors, to high-frequency applications such as flyback transformers, deflecting yokes, high-frequency transformers and magnetic heads. In actual operation, these magnetic components display characteristics different from DC magnetic characteristics or characteristics measured with an LCR meter.
-
product
Portable Hardness Tester
Magnetic Type QualiMag Series
The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell test head fixes to the surface of iron and steel parts to test the hardness by applying magnetic force. Meant to replace Leeb hardness testers which are not as accurate nor reliable. Use the Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester on steel parts, steel plates, steel pipes, forgings, large to medium sized heat treated parts(if surface available), welding joints, pressure vessels, etc. The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell complies with Standards ISO 6508 and ASTM E18.
-
product
Modular Angle Encoders
Modular angle encoders with optical or magnetic scanning come in numerous combinations of a circular scale or scale drum and a scanning head, thus offering the perfectly matched solution for your application. Specs such the interface, accuracy, or diameter can be selected modularly to meet your requirements.
-
product
Read-Write Analyzer Systems
4000 TDMR Series
For Two Dimensional Magnetic Recording (TDMR). The 4000 Series RWA Systems support UP12 preamplifier and the next generation front end cartridge/head amplifier designs on Guzik spinstands. Previous generation of head amplifiers together with UP11M are also supported by RWA-4000 TDMR Systems in one channel mode.
-
product
Optical Power Meter Heads
The 5mm detector area on Keysight's latest optical power heads allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
-
product
Engine Vibration detector
VP-201/202/1210/1220
The VP-201/202 and VP-1210/1220 are electro-dynamic vibration detectors designed for gasoline and diesel engine measurement. By mounting them on the cylinder head or an engine etc, they detect rotation vibration at the time of combustion. It is easy to use due to a small, light weight, and magnetic mounting by means of a built-in magnet on the bottom surface. The detector and the cable are reliable with heat-resistant structure so you can use it in an engine room.
-
product
Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
-
product
Micro probes 1 MHz up to 6 GHz
MFA 01 set
The micro probes are used to measure magnetic fields and they have a high resolution. They measure magnetic fields up to 6 GHz, e.g. at signal conductors (150µm), SMD components (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the Bias tee BT 706. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee BT 706 to a spectrum analyzer or an oscilloscope. Langer EMV-Technik GmbH includes correction lines in the delivery. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
-
product
Bench Meters
A classic style multimeter with True RMS and phase rotation. This manual ranger covers the electrical parameters you need for HVACR and, with detachable test leads, works with our accessory heads to test non-electrical parameters too. The LT16A meter measures current, resistance, voltage, capacitance, frequency, continuity and more. Test leads store in the meter body along with the tilt stand and magnetic hanger. The body is constructed of durable ABS plastic and a blue backlight makes the large LCD even more visible.
-
product
Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
-
product
High-Power InGaAs Optical Head
81626C
The new 81626C high-power optical head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81626C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
-
product
Silicon Optical Power Head
81620C
The new 81620C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81620C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
-
product
InGaAs Optical Power Head
81624C
The new 81624C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81624C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
-
product
Germanium Optical Power Head
81623C
The new 81623C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81623C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
-
product
High Elongation Extensometers
Model 3800
Jinan Testing Equipment IE Corporation
The main body of this unique extensometer remains stationary during testing, held in position by the adjustable magnetic base included. Only the very light, small traveling heads move as the sample elongates during a test. These attach to the sample with small spring clips. Each head pulls a cord out from the extensometer as the head moves. These models use high precision, low friction potentiometers, and, as a result, have a wide range of factory selectable outputs. The extensometer is driven by an excitation voltage and has output proportional to the input. They can be provided with high level outputs (approximately 2-8 VDC) or ones that mimic strain gaged devices (2-4 mV/V). When set to mimic strain gaged extensometers, the Model 3800 can be used with virtually any signal conditioning electronics designed for strain gaged sensors. The potentiometers employ a hybrid wire wound around conductive plastic, which provides excellent long term stability. The output from the extensometer is readily interfaced with most existing test controllers, and may be directly input to data acquisition systems and chart recorders. Please let us know at the time of order what type of output and connector you require.
-
product
Micro probes 1 MHz up to 1 GHz
MFA 02 set
The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
-
product
Universal Preamplifier 14
UP14
For Two Dimensional Magnetic Recording (TDMR) and Heat-assisted Magnetic Recording (HAMR) Headamplifiers. Universal Preamplifier 14 (UP14) is designed for TDMR and HAMR Head Amplifiers. With new Guzik RWA4000 TDMR, UP14 allows to process signals from three Read Channels. It also supports two high speed data channels for Write data and Laser data. UP14 has two channels for dynamic TFC control and allows to program TFC power per sector and close loop TFC power control in each channel. UP14 can generate two programmable modulation signals for write data and laser data with bandwidth up to 20 MHz. UP14 consist of two boards. The first UP14 RW Board processes high-frequency signals: read-back signals, write data and laser data. The second UP14 Control Board provides power, control and low-frequency signal generation: TFC, write data modulation and laser modulation.
-
product
Acoustic Probe
AA-Ultrasonic
The AA-Ultrasonic acoustic probe is designed for use on air insulated terminations where a clear sound path between the electrically stressed insulation and the probe is present. The sensor is extremely sensitive and can detect activity below 10pC. The probe has a magnetic base to allow coupling to steel enclosures and a swivel head as so the detecting sensor can be aimed directly at the HV point. Corona in air and surface tracking can seriously damage high voltage insulating surfaces in a way that will ultimately lead to flashover and complete failure of the insulator. This discharge activity creates acoustic emission that can be detected using a high frequency sensor. The magnitude of the acoustic emission is indicative of the degree and severity of the discharge activity.
-
product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
-
product
Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
-
product
Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
-
product
Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
-
product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
