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SPM
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: Scanning Probe Microscopes, AFM
- Pickering Interfaces Ltd.
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Switch Path Manager License - SPM Full (Pro)
90-900-001
Simplifies signal routing through switching systems and speeds up the development of switching system software. It is available as a site license (see below for additional information).
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SPM Monitor
CS-150
The CS-150 is a high-precision chemical concentration monitor designed for use with the SPM solutions used in semiconductor-manufacturing cleaning processes. Featuring fast response and a compact size, the CS-150 continually monitors the concentrations of the various components of the SPM solutions (H2SO4/H2O2/H2O) used to remove metal ions and organic substances. Feedback control based on the monitor output is used to keep the concentrations of the SPM solutions within the allowable ranges and to eliminate unnecessary replacement of chemicals.A short measuring cycle allows the accurate tracking of chemical concentrations, while the compact design facilitates integration with a cleaning device.
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SPM Probes
AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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SPM Controller
the ability to provide independent torque (current) control or speed (voltage) control to the motor at any throttle position.
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SPM Control System
Nanonis
SPECS Surface Nano Analysis GmbH
Unbound to any specific microscope, the Nanonis SPM Control System is designed for the uncompromising demands of scientific excellence in a wide variety of SPM applications. Its modular concept implemented in a fully digital fashion is carefully thought through, with a strong emphasis on usability, stability and flexibility.
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AFM & SPM Probes
Nanonics offers a wide variety of custom-made probes for Nanonics MultiView systems to meet all your imaging, writing, manipulation, and characterization needs. See below for different categories of probes we offer.
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NSOM & SNOM SPM
NSOM Is the premier tool for imaging and manipulation of light on the nanoscale and is a critical instrument for understanding plasmonics, photonic waveguides, photovoltaic and photoconductivity studies. The optical openness of the NSOM system permits any illumination scenario while the Multiprobe NSOM head offers optical transport and dynamic study on the nanoscale for the first time. Offering a variety of options from entry level to low-temperature systems, the MultiView NSOM series has been the platform of choice for imaging on the nanoscale for nearly two decades.
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Components - Subharmonic Mixers (SPM)
SPM Series
Farran offers fundamental (RF ≈ LO), sub-harmonic (RF ≈ 2xLO) and harmonic mixers (RF≈NxLO, where N=2, 4, 6 …) for a wide variety of applications from 26.5 GHz to 500 GHz. All mixers use planar Schottky diodes and provide state of the art performance in a small and lightweight package.High-performance sub harmonically pumped mixers are available in frequencies from 50 to 350 GHz and beyond.
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High-Resolution Scanning Probe Microscope (SPM)
High-Resolution Scanning Probe Microscope (SPM)
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Switch Path Manager Lite License - SPM Lite
90-900-901
A low-cost "lite" version of our Switch Path Manager has a site license (can be used on unlimited PCs) and a boot limitation of two switching modules.
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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High Frequency Digital Surge Tester & DC Hi-Pot Tester
SPM
High Frequency Digital Surge Tester and DC Hi-Pot Tester (similar to the "SP" Model) together in a compact cabinet. Take this portable tester to your test site and accurately perform Surge, Hi-Pot, PI and Resistance Tests.
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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The Golden STM
*Golden (chemically resistive) vibration isolated STM body with implemented preamplifier*Computer with PCI board based SPM controller *Anfatec Scan & Anfatec Present*19“ STM controller (extra low noise 24 bit converters)*HV display for z-direction*High voltage amplifiers for the x-y-tube scanning*Optional: PC controlled bi-potentiostat and electrochemical cell
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MountainsSPIP™ 8
We are currently working hard on a new development, together with our colleagues at Digital Surf *), to bring you the next generation of SPM image analysis software, based on the industry-standard Mountains platform and all the best SPIP interactivity and analytical tools.Our new product, called MountainsSPIP 8, will be unveiled at the MRS Fall Exhibit in Boston November 2018 and available for customers early 2019.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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RF Spectrum Power Meter
SPM-50
SPM-50A Spectrum Power Meter brings innovative testing concept and approach for RF cable system installation and maintenance. It combines the key function of spectrum analyzer and power meter, designed to measure the power characteristics of particular signal among mixed signals transmitted on cable, fast and accurately present result in power histogram or spectrum chart.
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STEREO PERFORMANCE METER
SPM-1
The SPM-1 measures the stereo content present in any left and right audio program material. It measures 0-50 dB separation on live program material by cross correlating the right and left base-band audio information.
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Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Nanopositioning Systems
Mad City Labs'' nanopositioning systems move and maintain the position of objects with sub-nanometer precision and high stability. Applications for nanopositioners include super resolution microscopy, high speed confocal imaging, AFM, NSOM, SPM, optical trapping, fiber positioning, single molecule spectroscopy, single molecule/particle tracking, high resolution optical alignment, nanoscopy and lithography.
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Switch Path Manager Signal Routing Software
Our signal routing software, Switch Path Manager (SPM), simplifies signal routing through switching systems and speeds up the development of switching system software. Switch Path Manager supports our switching modules and the interconnection between them. Once a switching system model has been created, simply defining the endpoints that are required to be connected together can perform signal routing.
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Near Field Scanning Optical Microscope
MCL-NSOM
The MCL-NSOM is a fully operational near field scanning optical microscope. It has been built on Mad City Labs versatile RM21™ inverted optical microscope which allows users to convert between NSOM, SPM, and fluorescence optical microscopy techniques. The MCL-NSOM builds on our successful resonant probe SPM and incorporates common elements such as the MadPLL® phase lock loop controller. The NSOM also exploits our expertise in precision motion control by including six axes of motorized positioning, for the sample and NSOM probe, and three axes of closed loop nanopositioning to provide exceptional position resolution and accuracy. The MCL-NSOM also includes a 635nm laser excitation source, fiber launch, oil immersion objective lens (100x, 1.25 N.A.), CMOS alignment camera and avalanche photodiode detector. The microscope configurable design allows researchers to tailor the instrument for many different optical microscopy techniques including near field spectroscopy. The MCL-NSOM is operated in aperture mode with shear force feedback. The standard 5 modes are supported: illumination, collection, illumination and collection, reflection and reflection collection. We supply a LabVIEW™ based software package which automates the motion control features.
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High Speed Controllers
Anfatec's brand-new SPM controller development integrates cutting-edge D/A- and A/D-conversion technology into a unique state-of-the-art multiple DSP system.The digital real-time feedback loop provides an outstanding performance with ~1 µs latency in contact and dynamic mode. A synchronized digital scan generator with programmable output filtering guarantees an absolutely jitter free image. Intelligent data acquisition features allow to eliminate image non-linearities caused by the user's mechanical system.
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One Core Loop Tester
DAMUL is an innovative and portable optical power checker accompanying 1-core loop back function. DAMUL can check SFP TX and RX power level by simply inserting SFP into it. If you use UPM (Universal SFP-typed Power checker Module) optionally provided, DAMUL can measure optical power. Also, when using SPM (SFP-typed Power checker Module) optionally provided, DAMUL can identify 18 CWDM wavelengths as well as its power automatically. DAMUL provide users high productivity for optical power checking work on fiber optic systems such as WDM-PON.
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Solar Power Meter
Model K-SPM-11
Kusam Electrical Industries Limited
SOLAR METER A device used to measure solar power. When the sun shines brightly, just take the KM-SPM-11 and aim its opening at the sun, and you will see how powerful the sun is. If you want your skin white, you surely cannot do without it!
