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Metrology

field of measurement.

See Also: Measurement, Instrumentation, Coordinate Measuring Machines


Showing results: 256 - 270 of 273 items found.

  • Analytical Software for Microscopy

    SPIP - Image Metrology A/S

    SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.

  • SF6 Electrical Equipment Gas Comprehensive Detector

    JH4000D-4 - Xiamen Jiahua Electrical Technology Co.,Ltd

    JH4000 series SF6 Electrical Equipment Gas Comprehensive Detector is a high precision, intelligent and portable comprehensive detector. It detects the main decomposition products, as well as SF6 purity and moisture content. It is reliable, accurate and stable. The user is able to make rapid and accurate judgment based on the content of main decomposition products, SF6 purity and moisture content. Inspected by authorities such as the National Institute of Metrology, the device, having excellent performance, complies with relevant international and national standards. It is a product recommended for use by the State Power Grid Company. This comprehensive detector is designed flexibly for the user’s choice. They can combine any two or three detection together. They can work simultaneously or separately, providing more complete measures for the inner fault diagnosis and it is an effective measure for preventive and corrective maintenance.

  • Precision LCR Meter

    1693 - IET Labs

    The GenRad 1693 LCR Meter Bridge gives you the best combination of features, in an LCR meter, to meet your most demanding testing requirements. It's a versatile, flexible instrument with a full range of programmable test frequencies, speeds, and voltages. An easy to understand display show both primary and secondary measurement parameters. The Digibridge is an excellent choice for metrology applications requiring accurate and repeatable measurements. The 1693 is also widely used in production testing, incoming inspection, component design and evaluation, process monitoring or dielectric measurement applications.

  • Data Analytics

    KLA-Tencor Corp

    KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.

  • Meter Test Equipment

    Signals & Systems India Private Limited

    Our meter test equipment is a user-friendly and innovative device for energy meter calibration, built on the current technologies – Bluetooth & Android. The metrology sub-unit measures and communicates the parameters to an Android Tab via Bluetooth. All user interfaces – textual, graphical, and data entry are made available on the Android application, with innovative features. Being a portable device measuring the voltages and currents from the metering panel, the product ensures the safety of the test personnel by making use of wireless communication between the equipment – which is connected to the High Voltage- and the user interface – Tab.

  • CMOS Dual USB3 Cameras

    CELERA - Alkeria Srl

    CELERA CMOS Dual USB3 cameras provides unrivaled speed, extreme flexibility and quick system integration. Its double USB3 interface, ultra-fast acquisition rate, extremely reduced dimensions and rugged design make CELERA cameras suitable far the most demanding applications: automated optical inspection, high performance sorting systems, industrial metrology, microscopy, medical diagnostics and machine vision. CELERA cameras are powered directly by the USB3 bus eliminating the need for external power adapters. USB3 provides the most cost effective and widespread interface, pushing speed performances at the top.

  • High Power Narrow Linewidth Laser

    AULLD series - Amonics Ltd.

    Amonics' high power narrow linewidth laser (AULLD series) is integrated with Redfern Integrated Optics (RIO) PLANEXTM high performance external cavity laser. It features narrow linewidth, low phase noise, ultra low RIN, high output power with exceptionally reliable performance. The turnkey microprocessor controlled benchtop AULLD provides alarms and status indicators. An integrated RS232 or Ethernet computer interface provides easy control, diagnostic functions and data acquisition. It is particularly suitable for commercial fiber optic sensing applications, such as interferometric and Brillouin DTSS sensing systems for oil & gas, security, metrology and smart infrastructure.

  • High Performance Polyphase Energy Metering AFE w/ Power Quality Analysis

    ADE9000 - Analog Devices Inc.

    The ADE9000 is a highly accurate, fully integrated energy-metering device. Interfacing with both current transformer (CT) and Rogowski coil sensors, the ADE9000 enables users to develop a three-phase metrology platform, which achieves high performance for Class 1 through Class 0.2 meters. Power quality features enable advanced meter designs with fast rms measurements and power quality level monitoring for EN50160 compliance. The ADE9000 integrates seven high performances ADC’s, a flexible DSP core. An integrated high-end reference ensures low drift over temperature with a combined drift of less than ±25 ppm/°C max for the whole channel including PGA and ADC.

  • SF6 Decomposition Products Detector

    JH4000A-4 - Xiamen Jiahua Electrical Technology Co.,Ltd

    JH4000A-4 SF6 Electrical Equipment Decomposition Products Detector is a high precision, intelligent and portable device, able to make judgment rapidly and correctly based on the content of main decomposition products of insulation materials inside the SF6 electrical equipment like SF6 circuit breaker, instrument transformer, GIS and transformer. It detects SO2+SOF2, H2S, CO and HF. It is reliable, accurate and stable. Inspected by authorities such as the National Institute of Metrology, the device, having excellent performance, complies with relevant international and national standards. It is a product recommended for use by the State Power Grid Company. Decomposition products detection provides reliable evidence for the internal fault diagnosis and it is an effective measure for preventive and corrective maintenance.

  • Chip Manufacturing

    KLA-Tencor Corp

    KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.

  • HV Calibration

    B-1027 - ROSS ENGINEERING CORPORATION

    Ross Engineering Corporation’s High Voltage Calibration Lab provides high accuracy capability for conducting tough reliability tests on all our high voltage devices. In this facility we test and calibrate HV Relays, HV Dividers, HV Probes, Spark Gaps, our Fiber Optic Systems, and HV Digital Voltmeters up to 450kV. We provide our own in house test lab to ensure Ross products meet or exceed required safety standards as well as our own high standards of dependability, long life and quality. Our technicians use test equipment calibrated by or traceable to National Institute of Standards and Technology or other national metrology institute to provide the highest in testing accuracy.

  • Optical Coordinate Measuring System

    MaxSHOT 3D - Creaform Inc.

    Creaform’s MaxSHOT 3D lineup is a game changer for product development, manufacturing, quality control and inspection teams that need the highest measurement accuracy and repeatability as much for large‑scale projects than parts from 2 to 10 m. Imagine achieving accuracy better than 0.015mm/m! Thanks to its sophisticated user guidance technology and easy‑to‑use software, the MaxSHOT 3D is ideal for users of all levels—even non‑metrology experts—so that you gain peace of mind knowing your measurements are always right on the dot and you increase process efficiency. If you consistently work on large‑scale projects, the MaxSHOT 3D is your go-to solution to slash budget-busting measurement mistakes, improve product quality, increase process efficiency—and minimize overall operating costs.

  • Analytical Software for Microscopy

    SPIP - Electrogrip Company

    SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.

  • Substrate Manufacturing

    KLA-Tencor Corp

    KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.

  • Microelectronics And Packaging AOI

    Machine Vision Products

    Machine Vision Products, Inc. has extensive experience in a wide range of Microelectronics and Packaging applications. MVP works with the world’s leading manufacturers on a global basis. From multiple die and wire technologies to leadframe, ball grid array and surface inspection applications, MVP has the widest applications toolbox of any AOI provider. MVP takes pride in the fact that they supply many complex inspection solutions to diverse industries such as Automotive, Telecoms, Medical Devices, Military, and Space. MVP’s 900 Series is the base platform upon which all Microelectronics and Packaging inspection solutions are based. The 900 series 2D capabilities provide metrology and defect detection using a propriety Quad-Color lighting, Telecentric optics and resolutions down to 1um. 3D height measurement capabilities allow for in-line high speed inspection of Dies, paste deposition, positional accuracy, volume and height with a resolution down to 1.13um.

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