Showing results: 136 - 150 of 544 items found.
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alpha-SE® -
J.A. Woollam Co., Inc.
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
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Jinan Saicheng Instrument
Gas Permeability Tester (Gas Transmission Rate Tester) is based on the differential pressure method and is professionally applicable to the determination of gas transmission rate of plastic films, composite films, high barrier materials, sheeting, metal foils, rubber, tires and permeable membrane.
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Shijiazhuang Zhongshi Testing Machine Co., Ltd.
The instrument is used for testing the main material of Polyethylene blown covering film and ethylene-vinyl acetate copolymer(EVA),the average content of Vinyl Acetate(VA)is not less than 4% of the anti-dripping progerty blown covering film within add-type. This instrument is mainly testing the first dripping beginning time and the anti-dripping failure time of the film. It is the ideal testing equipment for science research department, universities, commodity inspection, laboratory, graduate school and quality supervision departments
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Filmetrics, Inc.
Our film thickness measurement products are available for every application. We stock most of the products listed below for fast delivery. Browse through them or contact one of our Application Engineers, who can immediately assist you with your film thickness measurement needs.
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FilmTek 2000M -
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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CSR1000 -
Rhesca Co., Ltd.
This tester is highly effective in measuring the adhesion strength (adhesion strength) of hard coatings (Ti, TiN, SiC, DLC, etc.) formed by PVD and CVD on metal surfaces such as cemented carbide. Adopting a scratch test method that allows quantitative measurement with simple operations, the film surface is scratched while increasing the load on the sample surface, detecting film breakage with high sensitivity, and providing the load at which film breakage occurs (critical load). tools and mold tools that require
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ZDG-25 -
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.3-2008/IEC60851-3Inspection standard: JB/T4279.9-2008Meet GB/T6109-2008 standard requirementsUsed to test the film scrap resistance of enamelled round wires with nominal conductor diameter above0.250mm;Application of SCM control,enter the weight value, operation will be completed automatically: put down the scraping rod, stop while film scratch, calculate and show the scraping force, raise the scraping rod, return to zero, sample rotates 120°and repeat the same operation, calculate and show the scraping force of three times and average scraping force.When film is scratched, film scraper would automatically stop scraping, with exposed conductor of sample<3mmWith the advantages of high sensitivity, good repeatability, stable and reliable characteristics.
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Guangzhou Amittari Instruments Co.Ltd
The Belt Tension Meter Mainly use for automotive belt tension measurement, also can measure and adjust ribbon, filamentous, linear, reticular and other wide objects tension. Applicable to the automotive, textiles, wire and cable, metal wire, plastic film, paper, printing, film industries etc.
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Plasma Source -
SPECS Surface Nano Analysis GmbH
Thin-film deposition covers any technique for depositing material onto a bulk or thin film substrate. Elemental alloy or compound films are produced by non-reactive or reactive (co-)deposition. Often functionalization or tailoring of device interfaces by predeposition or deposition assisting surface treatment with atoms or ions is necessary.
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MFM310 -
Rigaku Corp.
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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UI-FT43 -
Unuo Instruments
Leather Thickness Gauge is used to measure the thickness of leather. Place the sample in a thickness meter under a specified load for a certain time and them read the thickness. Unuo Instruments supply film thickness gauge, film thickness gauge, rubber thickness gauge and etc. Shore Durometer for rubber is also available.
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Pulsed Laser Deposition -
Neocera, Inc.
Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.
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FilmTek 2000 -
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.